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DPIF:A Framework for Distinguishing Unintentional Quality Problems From Potential Shilling Attacks
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作者 Mohan Li Yanbin Sun +3 位作者 Shen Su Zhihong Tian Yuhang Wang Xianzhi Wang 《Computers, Materials & Continua》 SCIE EI 2019年第4期331-344,共14页
Maliciously manufactured user profiles are often generated in batch for shilling attacks.These profiles may bring in a lot of quality problems but not worthy to be repaired.Since repairing data always be expensive,we ... Maliciously manufactured user profiles are often generated in batch for shilling attacks.These profiles may bring in a lot of quality problems but not worthy to be repaired.Since repairing data always be expensive,we need to scrutinize the data and pick out the data that really deserves to be repaired.In this paper,we focus on how to distinguish the unintentional data quality problems from the batch generated fake users for shilling attacks.A two-steps framework named DPIF is proposed for the distinguishment.Based on the framework,the metrics of homology and suspicious degree are proposed.The homology can be used to represent both the similarities of text and the data quality problems contained by different profiles.The suspicious degree can be used to identify potential attacks.The experiments on real-life data verified that the proposed framework and the corresponding metrics are effective. 展开更多
关键词 Data quality shilling attacks functional dependency suspicious degree HOMOLOGY
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