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An embeddable SOC real-time prediction technology for TDDB
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作者 辛维平 庄奕琪 李晓明 《Journal of Semiconductors》 EI CAS CSCD 2012年第11期105-109,共5页
This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,... This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,designed by using a standard CMOS process,occupies a small silicon area and does not share any signal with the circuits under test,therefore,the possibility of interference with the surrounding circuits is safely excluded. 展开更多
关键词 tddb real-time reliability prediction soc
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