期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
THE CAPTURE RANGES AND THE DANGEROUS RANGES FOR THE THREE-DIMENSIONAL TWO-AIRCRAFT COMBAT PROBLEM
1
作者 Tong Minan and Wang LixinNorthwestern Polytechnical University 《Chinese Journal of Aeronautics》 SCIE EI CAS CSCD 1990年第2期88-97,共10页
In this paper, we use differential game theory to study the three-dimensional two-aircraft air-to-air combat problem. We give the ways to determine the Capture Ranges (CR) and the Dangerous Ranges (DR) for these two a... In this paper, we use differential game theory to study the three-dimensional two-aircraft air-to-air combat problem. We give the ways to determine the Capture Ranges (CR) and the Dangerous Ranges (DR) for these two aircraft according to the target entry directions, barrier and isochronic lines respectively. The simulations are given by referring to two sets of real aircraft parameters. After discussing the simulation results, we have obtained some conclusions that match the real air-to-air combat situation quite well. 展开更多
关键词 CR DR the capture RANGES AND the DANGEROUS RANGES FOR the THREE-DIMENSIONAL TWO-AIRCRAFT COMBAT PROBLEM
下载PDF
Accurate Determination for the Energy & Temperature Dependence of Electron Capture CrossSection of Si-SiO_2 Interface States Using a New Method
2
作者 陈开茅 武兰清 +1 位作者 许慧英 刘鸿飞 《Science China Mathematics》 SCIE 1993年第11期1397-1408,共12页
A new technique for accurate determination of the electron and hole capture cross-sections of interface states at the insulator-semiconductor interface has been developed through measuring the initial time variation i... A new technique for accurate determination of the electron and hole capture cross-sections of interface states at the insulator-semiconductor interface has been developed through measuring the initial time variation in the carrier filling capacitance transient, and full consideration is given to the charge-potential feedback effect on carrier capture process. A simplified calculation of the effect is also given. The interface states have been investigated with this technique at the Si-SiO_2 interface in an n-type Si MOS diode. The results show that the electron capture cross-section strongly depends on both temperature and energy. 展开更多
关键词 the capacitance transient of the carrier filling charge-potential feedback effect Si-SiO_2 interface temperature and energy dependence of the capture cross-section of the interface states.
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部