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Osmium Complexes Useful in the Preparation of Metal Thin Film and Highly Efficient Electroluminescent Devices
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作者 Yun Chi 《合成化学》 CAS CSCD 2004年第z1期120-120,共1页
关键词 thin Osmium Complexes Useful in the Preparation of Metal thin film and Highly Efficient Electroluminescent devices
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Tandem organic light-emitting diode with a molybdenum tri-oxide thin film interconnector layer 被引量:1
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作者 路飞平 王倩 周翔 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第3期442-446,共5页
A 10-nm-thick molybdenum tri-oxide(MoO3) thin film was used as the interconnector layer in tandem organic lightemitting devices(OLEDs).The tandem OLEDs with two identical emissive units consisting of N,N-bis(naph... A 10-nm-thick molybdenum tri-oxide(MoO3) thin film was used as the interconnector layer in tandem organic lightemitting devices(OLEDs).The tandem OLEDs with two identical emissive units consisting of N,N-bis(naphthalen-1-yl)N,N-bis(phenyl)-benzidine(NPB) /tris(8-hydroxyquinoline) aluminum(Alq3) exhibited current efficiency-current density characteristics superior to the conventional single-unit devices.At 20 mA/cm2,the current efficiency of the tandem OLEDs using the interconnector layers of MoO3 thin film was about 4.0 cd/A,which is about twice that of the corresponding conventional single-unit device(1.8cd/A).The tandem OLED showed a higher power efficiency than the conventional single-unit device for luminance over 1200cd/m2.The experimental results demonstrated that a MoO3 thin film with a proper thickness can be used as an effective interconnector layer in tandem OLEDs.Such an interconnector layer can be easily fabricated by simple thermal evaporation,greatly simplifying the device processing and fabrication processes required by previously reported interconnector layers.A possible explanation was proposed for the carrier generation of the MoO3 interconnector layer. 展开更多
关键词 tandem organic light-emitting device MoO3 thin film interconnector layer
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Analysis of laser induced thermal mechanical relationship of HfO_2/SiO_2 high reflective optical thin film at 1064 nm 被引量:6
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作者 戴罡 陈彦北 +2 位作者 陆建 沈中华 倪晓武 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第7期601-604,共4页
A numerical model is developed for the calculation of transient temperature field of thin film coating induced by a long-pulsed high power laser beam. The electric field intensity distribution of HfO2/Si02 high reflec... A numerical model is developed for the calculation of transient temperature field of thin film coating induced by a long-pulsed high power laser beam. The electric field intensity distribution of HfO2/Si02 high reflective (HR) film is investigated to calculate the thermal field of the film. The thermal-mechanical relationships are discussed to predict the laser damage area of optical thin film under long pulse high energy laser irradiation. 展开更多
关键词 Electric fields Hafnium compounds High energy lasers High power lasers LASERS Pulsed laser applications Silicon compounds thin film devices thin films
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Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry 被引量:3
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作者 薛晖 沈伟东 +3 位作者 顾培夫 罗震岳 章岳光 刘旭 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第5期446-448,共3页
A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interfe... A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function Ф, which is induced by three parts: the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter Teff and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference (OPD) is linearly dependent on the refractive index of the beam splitter to determine both L and Teff. The spectral phase shift on reflection of thin film structure can be obtained by subtracting these two parts from Ф. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy. 展开更多
关键词 Fourier analysis? ?Interferometers? ?Interferometry? ?Light reflection? ?Ontology? ?Optical beam splitters? ?Particle beams? ?Phase shift? ?Prisms? ?Reflection ? ?Refractive index? ?thin film devices? ?thin films
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Impact of cascaded thin-film filters on metro networks employing NRZ, LPF-DB, and CSRZ formats 被引量:1
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作者 王悦 胡卫生 +6 位作者 苏翼凯 郑铮 冷鹿峰 朱木源 胡佩刚 郭薇 金耀辉 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第7期386-388,共3页
We studied the transmission performance of metro networks employing cascaded thin-film filters (TFFs) for three modulation formats including non-return-to-zero (NRZ), duobinary, and carrier-suppressed RZ (CSRZ). The e... We studied the transmission performance of metro networks employing cascaded thin-film filters (TFFs) for three modulation formats including non-return-to-zero (NRZ), duobinary, and carrier-suppressed RZ (CSRZ). The effects caused by TFFs' dispersion and passband characteristics are investigated for 10- and 40-Gb/s signals, respectively. Simulation results show that the penalty resulted from dispersion can be partially compensated by the passband effects of the cascaded filters. CSRZ is shown to be a preferred format compared with NRZ and duobinary primarily originating from its good back-to-back performance. 展开更多
关键词 Computer simulation Electromagnetic dispersion Optical films Optical filters thin film devices
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Enhanced ultraviolet emission from ZnO thin film covered by TiO_2 nanoparticles
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作者 徐林华 沈华 +1 位作者 李相银 朱日宏 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第10期953-955,共3页
A ZnO thin film covered by TiO2 nanoparticles is prepared by electron beam evaporation. The structure and surface morphology of the sample are analyzed by X-ray diffraction (XRD) and atomic force microscopy (AFM),... A ZnO thin film covered by TiO2 nanoparticles is prepared by electron beam evaporation. The structure and surface morphology of the sample are analyzed by X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. Photoluminescence is used to investigate the fluorescent property of the ample. The results show that the ultraviolet (UV) emission of the ZnO thin film is greatly enhanced after it is covered by TiO2 nanoparticles while the green emission is suppressed. The enhanced UV emission mainly results from the fluorescence resonance energy transfer (FRET) between ZnO thin film and TiO: nanoparticles. This TiO2-ZnO composite thin film can be used to fabricate high-efficiency UV emitters. 展开更多
关键词 Atomic force microscopy Electron beams Energy transfer FLUORESCENCE Metallic films NANOPARTICLES Optical films Surface structure thin film devices thin films X ray diffraction Zinc oxide
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Review of recent progresses on flexible oxide semiconductor thin film transistors based on atomic layer deposition processes 被引量:4
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作者 Jiazhen Sheng Ki-Lim Han +2 位作者 TaeHyun Hong Wan-Ho Choi Jin-Seong Park 《Journal of Semiconductors》 EI CAS CSCD 2018年第1期105-116,共12页
The current article is a review of recent progress and major trends in the field of flexible oxide thin film transistors(TFTs), fabricating with atomic layer deposition(ALD) processes. The ALD process offers accur... The current article is a review of recent progress and major trends in the field of flexible oxide thin film transistors(TFTs), fabricating with atomic layer deposition(ALD) processes. The ALD process offers accurate controlling of film thickness and composition as well as ability of achieving excellent uniformity over large areas at relatively low temperatures. First, an introduction is provided on what is the definition of ALD, the difference among other vacuum deposition techniques, and the brief key factors of ALD on flexible devices. Second, considering functional layers in flexible oxide TFT, the ALD process on polymer substrates may improve device performances such as mobility and stability, adopting as buffer layers over the polymer substrate, gate insulators, and active layers. Third, this review consists of the evaluation methods of flexible oxide TFTs under various mechanical stress conditions. The bending radius and repetition cycles are mostly considering for conventional flexible devices. It summarizes how the device has been degraded/changed under various stress types(directions). The last part of this review suggests a potential of each ALD film, including the releasing stress, the optimization of TFT structure, and the enhancement of device performance. Thus, the functional ALD layers in flexible oxide TFTs offer great possibilities regarding anti-mechanical stress films, along with flexible display and information storage application fields. 展开更多
关键词 atomic layer deposition(ALD) oxide semiconductor thin film transistor flexible device mechanical stress
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Free-space 1×2 wavelength-selective switches for wavelength-division multiplexing optical networks 被引量:1
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作者 李小奇 梁静秋 +2 位作者 孙德贵 李伟 梁中翥 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第7期553-555,共3页
A free-space 1 ×2 wavelength-selective switch (WSS) based on thin-film filter technology is proposed. The 1 × 2 WSS is fabricated with an electromagnetic actuator, a reflecton prism, a narrow-band thin-fil... A free-space 1 ×2 wavelength-selective switch (WSS) based on thin-film filter technology is proposed. The 1 × 2 WSS is fabricated with an electromagnetic actuator, a reflecton prism, a narrow-band thin-film filter, and three fiber collimators. The working principle and the configuration of WSS are illuminated. The experimental results indicate a fiber-to-fiber insertion loss ranging from 1.109 to 1.249 dB with 2-V voltage input, which satisfies the application of optical fiber communication. 展开更多
关键词 Microelectromechanical devices Optical communication Optical fiber fabrication Optical fibers Optical materials Optical switches thin film devices
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A 500-600 MHz GaN power amplifier with RC-LC stability network 被引量:1
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作者 Ying Lu Liang Shen +1 位作者 Jiabo Wang Ya Shen 《Journal of Semiconductors》 EI CAS CSCD 2017年第8期69-74,共6页
The GaAs-based TF-IPD fabrication process and equivalent lumped element circuit are utilized to re- duce the circuit size for double-section Wilkinson power divider. Ultimately the dimension of the proposed S-band pow... The GaAs-based TF-IPD fabrication process and equivalent lumped element circuit are utilized to re- duce the circuit size for double-section Wilkinson power divider. Ultimately the dimension of the proposed S-band power divider is reduced to 1.03 × 0.98 mm2. Its measured results show an operating fractional bandwidth of 54%, and return losses and isolation of greater than 20 dB. In addition the excess insertion loss is less than 1.1 dB. More- over the good features contain amplitude and phase equilibrium with the values of better than 0.03 dB and 1.5° separately. This miniaturized power divider could be widely used in RF/microwave circuit systems. 展开更多
关键词 thin film integrated passive device (TF-IPD) parameters extraction DE-EMBEDDING lumped element
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