讨论了一种用于DWDM系统中的光开关、偏振无关隔离器等单元器件中的微小薄膜型偏振分束器制造的关键技术。光学膜层采用数学多重优化设计方法;采用Monte Carlo允差分析原理分析膜层的容差,以便选择更易制备的膜系;计算膜层的M ac leod...讨论了一种用于DWDM系统中的光开关、偏振无关隔离器等单元器件中的微小薄膜型偏振分束器制造的关键技术。光学膜层采用数学多重优化设计方法;采用Monte Carlo允差分析原理分析膜层的容差,以便选择更易制备的膜系;计算膜层的M ac leod极值灵敏度,得到所选膜系各个膜层的误差要求;模拟光学监控过程,以制定相应的膜厚监控策略。设计了实用的棱镜胶合装置,得到了较高技术指标的PBS棱镜。结果表明,棱镜的光学冷加工,是器件制造的基础;光学薄膜的设计与制备是器件制造的关键,也是难点;棱镜的胶合是器件不可忽视的环节。展开更多
A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interfe...A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function Ф, which is induced by three parts： the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter Teff and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference （OPD） is linearly dependent on the refractive index of the beam splitter to determine both L and Teff. The spectral phase shift on reflection of thin film structure can be obtained by subtracting these two parts from Ф. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy.展开更多
文摘讨论了一种用于DWDM系统中的光开关、偏振无关隔离器等单元器件中的微小薄膜型偏振分束器制造的关键技术。光学膜层采用数学多重优化设计方法;采用Monte Carlo允差分析原理分析膜层的容差,以便选择更易制备的膜系;计算膜层的M ac leod极值灵敏度,得到所选膜系各个膜层的误差要求;模拟光学监控过程,以制定相应的膜厚监控策略。设计了实用的棱镜胶合装置,得到了较高技术指标的PBS棱镜。结果表明,棱镜的光学冷加工,是器件制造的基础;光学薄膜的设计与制备是器件制造的关键,也是难点;棱镜的胶合是器件不可忽视的环节。
基金supported by the National Natural Science Foundation of China under Grant Nos.60708013 and 60608014
文摘A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function Ф, which is induced by three parts： the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter Teff and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference （OPD） is linearly dependent on the refractive index of the beam splitter to determine both L and Teff. The spectral phase shift on reflection of thin film structure can be obtained by subtracting these two parts from Ф. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy.
