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Neutron irradiation influence on high-power thyristor device under fusion environment
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作者 Wei Tong Hua Li +2 位作者 Meng Xu Zhi-Quan Song Bo Chen 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2024年第4期65-81,共17页
Because of their economy and applicability,high-power thyristor devices are widely used in the power supply systems for large fusion devices.When high-dose neutrons produced by deuterium–tritium(D–T)fusion reactions... Because of their economy and applicability,high-power thyristor devices are widely used in the power supply systems for large fusion devices.When high-dose neutrons produced by deuterium–tritium(D–T)fusion reactions are irradiated on a thyristor device for a long time,the electrical characteristics of the device change,which may eventually cause irreversible damage.In this study,with the thyristor switch of the commutation circuit in the quench protection system(QPS)of a fusion device as the study object,the relationship between the internal physical structure and external electrical parameters of the irradiated thyristor is established.Subsequently,a series of targeted thyristor physical simulations and neutron irradiation experiments are conducted to verify the accuracy of the theoretical analysis.In addition,the effect of irradiated thyristor electrical characteristic changes on the entire QPS is studied by accurate simulation,providing valuable guidelines for the maintenance and renovation of the QPS. 展开更多
关键词 Fusion device Neutron irradiation effects thyristor Quench protection
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100 kA/10kV thyristor stack design for the quench protection system in CRAFT
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作者 仝玮 徐猛 +2 位作者 李华 陈波 宋执权 《Plasma Science and Technology》 SCIE EI CAS CSCD 2023年第5期193-206,共14页
Thyristors have longer lifetimes,higher reliability,and very high voltage and current ratings and they require less maintenance than other high-power semiconductor devices.As a result,they are particularly suitable fo... Thyristors have longer lifetimes,higher reliability,and very high voltage and current ratings and they require less maintenance than other high-power semiconductor devices.As a result,they are particularly suitable for quench protection systems(QPSs),which protect the superconducting magnets in large fusion devices from damage.In this paper,we propose a design for a 100 k A/10 k V thyristor stack supported by both theoretical and simulation-based analyses as well as experimental verification.Due to the ultrahigh electrical performance requirements imposed on the QPS by the Comprehensive Research Facility for Fusion Technology(CRAFT),three main issues must be considered:the voltage-balancing problem caused by multiple thyristors in a series structure,the increased junction temperature problem caused by extremely high currents,and the reverse recovery phenomenon that arises from the thyristor’s physical structure.Hence,a series of detailed theoretical analyses,simulations,and experiments,including a thyristor junction temperature prediction method and reverse recovery process modeling,were carried out to optimize the design.Finally,the reliability and stability of the thyristor stack were verified by a series of prototype experiments.The results confirmed the correctness and accuracy of the proposed thyristor stack design method and also indicated that the proposed thyristor stack can meet the application conditions of a 100 k A QPS in the CRAFT project. 展开更多
关键词 superconducting magnet thyristor pulsed power supply quench protection system
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Improvement of circuit oscillation generated by underwater high voltage pulse discharges based on pulse power thyristor
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作者 于营波 康忠健 《Plasma Science and Technology》 SCIE EI CAS CSCD 2023年第3期150-160,共11页
High voltage fracturing technology was widely used in the field of reservoir reconstruction due to its advantages of being clean, pollution-free, and high-efficiency. However, high-frequency circuit oscillation occurs... High voltage fracturing technology was widely used in the field of reservoir reconstruction due to its advantages of being clean, pollution-free, and high-efficiency. However, high-frequency circuit oscillation occurs during the underwater high voltage pulse discharge process, which brings security risks to the stability of the pulse fracturing system. In order to solve this problem, an underwater pulse power discharge system was established, the circuit oscillation generation conditions were analyzed and the circuit oscillation suppression method was proposed. Firstly, the system structure was introduced and the charging model of the energy storage capacitor was established by the state space average method. Next, the electrode high-voltage breakdown model was established through COMSOL software, the electrode breakdown process was analyzed according to the electron density distribution image, and the plasma channel impedance was estimated based on the conductivity simulation results. Then the underwater pulse power discharge process and the circuit oscillation generation condition were analyzed, and the circuit oscillation suppression strategy of using the thyristor to replace the gas spark switch was proposed. Finally, laboratory experiments were carried out to verify the precision of the theoretical model and the suppression effect of circuit oscillation. The experimental results show that the voltage variation of the energy storage capacitor, the impedance change of the pulse power discharge process, and the equivalent circuit in each discharge stage were consistent with the theoretical model. The proposed oscillation suppression strategy cannot only prevent the damage caused by circuit oscillation but also reduce the damping oscillation time by77.1%, which can greatly improve the stability of the system. This research has potential application value in the field of underwater pulse power discharge for reservoir reconstruction. 展开更多
关键词 underwater high voltage pulse discharge circuit oscillation suppression state space average method pulse power thyristor
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Injection modulation of p^+-n emitter junction in 4H-SiC light triggered thyristor by double-deck thin n-base 被引量:2
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作者 王曦 蒲红斌 +2 位作者 刘青 陈春兰 陈治明 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第10期496-500,共5页
To overcome hole-injection limitation of p^+-n emitter junction in 4H-SiC light triggered thyristor, a novel high- voltage 4H-SiC light triggered thyristor with double-deck thin n-base structure is proposed and demon... To overcome hole-injection limitation of p^+-n emitter junction in 4H-SiC light triggered thyristor, a novel high- voltage 4H-SiC light triggered thyristor with double-deck thin n-base structure is proposed and demonstrated by two- dimensional numerical simulations. In this new structure, the conventional thin n-base is split to double-deck. The hole- injection of p^+-n emitter junction is modulated by modulating the doping concentration and thickness of upper-deck thin n- base. With double-deck thin n-base, the current gain coefficient of the top pnp transistor in 4H-SiC light triggered thyristor is enhanced. As a result, the triggering light intensity and the turn-on delay time of 4H-SiC light triggered thyristor are both reduced. The simulation results show that the proposed 10-kV 4H-SiC light triggered thyristor is able to be triggered on by 500-mW/cm^2 ultraviolet light pulse. Meanwhile, the turn-on delay time of the proposed thyristor is reduced to 337 ns. 展开更多
关键词 silicon carbide light triggered thyristor double-deck thin n-base injection modulation
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Shortening turn-on delay of SiC light triggered thyristor by7-shaped thin n-base doping profile 被引量:2
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作者 王曦 蒲红斌 +1 位作者 刘青 安丽琪 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第10期622-627,共6页
A new 4 H–SiC light triggered thyristor(LTT) with 7-shaped thin n-base doping profile is proposed and simulated using a two-dimensional numerical method. In this new structure, the bottom region of the thin n-base ... A new 4 H–SiC light triggered thyristor(LTT) with 7-shaped thin n-base doping profile is proposed and simulated using a two-dimensional numerical method. In this new structure, the bottom region of the thin n-base has a graded doping profile to induce an accelerating electric field and compensate for the shortcoming of the double-layer thin n-base structure in transmitting injected holes. In addition, the accelerating electric field can also speed up the transmission of photongenerated carriers during light triggering. As a result, the current gain of the top pnp transistor of the SiC LTT is further increased. According to the TCAD simulations, the turn-on delay time of the SiC LTT decreases by about 91.5% compared with that of previous double-layer thin n-base SiC LTT. The minimum turn-on delay time of the SiC LTT is only 828 ns,when triggered by 100 mW/cm^2 ultraviolet light. Meanwhile, there is only a slight degradation in the forward blocking characteristic. 展开更多
关键词 silicon carbide light triggered thyristor 7-shaped doping profile turn-on delay
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General Consideration of Measuring System for Operational Test of Thyristor Valves of Ultra High Voltage DC Power Transmission 被引量:1
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作者 ZHOU Hui-gao XU Fan +2 位作者 ZHANG Chang-chun HU Zhi-long LIU Pu 《高压电器》 CAS CSCD 北大核心 2011年第9期1-5,共5页
Thyristor valve is one of the key equipments for ultra high voltage direct current(UHVDC) power transmission projects.Before being installed on site,they need to be tested in a laboratory in order to verify their oper... Thyristor valve is one of the key equipments for ultra high voltage direct current(UHVDC) power transmission projects.Before being installed on site,they need to be tested in a laboratory in order to verify their operational performance to satisfy the technical specification of project related.Test facilities for operational tests of thyristor valves are supposed to enable to undertake more severe electrical stresses than those being applied in the thyristor valves under test(test objects).On the other hand,the stresses applied into the test objects are neither higher nor lower than specified by the specification,because inappropriate stresses applied would result in incorrect evaluation of performance on the test objects,more seriously,would cuase the damage of test objects with expensive cost losing.Generally,the process of operational tests is complicated and performed in a complex synthetic test circuit(hereafter as STC),where there are a lot of sensors used for measuring,monitoring and protection on line to ensure that the test circuit functions in good condition.Therefore,the measuring systems embedded play a core role in STC,acting like "eyes".Based on the first project of building up a STC in China,experience of planning measuring systems is summarized so as to be referenced by related engineers. 展开更多
关键词 UHVDC thyristor valves operational test synthetic test circuit measuring system planning
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Ultra-high voltage 4H-SiC gate turn-off thyristor for low switching time 被引量:1
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作者 刘青 蒲红斌 王曦 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第12期303-310,共8页
An ultra-high voltage 4H-silicon carbide(Si C) gate turn-off(GTO) thyristor for low switching time is proposed and analyzed by numerical simulation. It features a double epitaxial p-base in which an extra electrical f... An ultra-high voltage 4H-silicon carbide(Si C) gate turn-off(GTO) thyristor for low switching time is proposed and analyzed by numerical simulation. It features a double epitaxial p-base in which an extra electrical field is induced to enhance the transportation of the electrons in the thin p-base and reduce recombination. As a result, the turn-on characteristics are improved. What is more, to obtain a low turn-off loss, an alternating p^+/n^+region formed in the backside acts as the anode in the GTO thyristor. Consequently, another path formed by the reverse-biased n^+–p junction accelerates the fast removal of excess electrons during turn-off. This work demonstrates that the turn-on time and turn-off time of the new structure are reduced to 37 ns and 783.1 ns, respectively, under a bus voltage of 8000 V and load current of 100 A/cm^2. 展开更多
关键词 4H-SIC gate turn-off(GTO) thyristor TURN-ON TURN-OFF
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High dV/dt immunity MOS controlled thyristor using a double variable lateral doping technique for capacitor discharge applications 被引量:1
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作者 陈万军 孙瑞泽 +1 位作者 彭朝飞 张波 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第7期691-696,共6页
An analysis model of the dV/dt capability for a metal-oxide-semiconductor (MOS) controlled thyristor (MCT) is developed. It is shown that, in addition to the P-well resistance reported previously, the existence of... An analysis model of the dV/dt capability for a metal-oxide-semiconductor (MOS) controlled thyristor (MCT) is developed. It is shown that, in addition to the P-well resistance reported previously, the existence of the OFF-FET channel resistance in the MCT may degrade the dV/dt capability. Lower P-well and N-well dosages in the MCT are useful in getting a lower threshold voltage of OFF-FET and then a higher dV/dt immunity. However, both dosages are restricted by the requirements for the blocking property and the forward conduction capability. Thus, a double variable lateral doping (DVLD) technique is proposed to realize a high dV/dt immunity without any sacrifice in other properties. The accuracy of the developed model is verified by comparing the obtained results with those from simulations. In addition, this DVLD MCT features mask-saving compared with the conventional MCT fabrication process. The excellent device performance, coupled with the simple fabrication, makes the proposed DVLP MCT a promising candidate for capacitor discharge applications. 展开更多
关键词 MOS controlled thyristor capacitor discharge
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A Comparison Study of Input ESD Protection Schemes Utilizing NMOS, Thyristor, and Diode Devices 被引量:1
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作者 Jin Young Choi 《Communications and Network》 2010年第1期11-25,共15页
For three fundamental input-protection schemes suitable for high-frequency CMOS ICs, which utilize protection devices such as NMOS transistors, thyristors, and diodes, we attempt an in-depth comparison on HBM ESD robu... For three fundamental input-protection schemes suitable for high-frequency CMOS ICs, which utilize protection devices such as NMOS transistors, thyristors, and diodes, we attempt an in-depth comparison on HBM ESD robustness in terms of lattice heating inside protection devices and peak voltages developed across gate oxides in input buffers, based on DC, mixed-mode transient, and AC analyses utilizing a 2-dimensional device simulator. For this purpose, we construct an equivalent circuit model of input HBM test environments for CMOS chips equipped with input ESD protection circuits, which allows mixed-mode transient simulations for various HBM test modes. By executing mixed-mode simulations including up to six active protection devices in a circuit, we attempt a detailed analysis on the problems, which can occur in real tests. In the procedure, we suggest to a recipe to ease the bipolar trigger in the protection devices and figure out that oxide failure in internal circuits is determined by the peak voltage developed in the later stage of discharge, which corresponds to the junction breakdown voltage of the NMOS structure residing in the protection devices. We explain strength and weakness of each protection scheme as an input ESD protection circuit for high-frequency ICs, and suggest valuable guidelines relating design of the protection devices and circuits. 展开更多
关键词 ESD protection HBM NMOS thyristor DIODE MIXED-MODE
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Investigation into Equivalency of Synthetic Test Circuit Used for Operational Tests of Thyristor Valves for UHVDC
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作者 ZHOU Hui-gao YANG Xiao-hui XU Fan 《高压电器》 CAS CSCD 北大核心 2012年第9期1-6,15,共7页
With the growth of capacity of high voltage direct current(HVDC) transmission lines,the ratings of thyristor valves,which are one of the most critical equipments,are getting higher and higher.Verification of performan... With the growth of capacity of high voltage direct current(HVDC) transmission lines,the ratings of thyristor valves,which are one of the most critical equipments,are getting higher and higher.Verification of performance of thyristor valves particularly designed for HVDC project plays an important role in the handover of products between the manufacturer and the client.Conventional test facilities based on philosophy of direct test cannot meet the requirements for modern thyristor valves.New test facilities with high ratings are necessarily built based on philosophy of synthetic test.Over the conventional direct test circuit,the later is an economical and feasible solution with less financial investment and higher test capability.However,the equivalency between the synthetic test and the direct test should be analyzed technically in order to make sure that the condition of verification test in a synthetic test circuit should satisfy the actual operation condition of thyristor valves existing in a real HVDC project,just as in a direct test circuit.Equivalency analysis is focused in this paper,covering the scope of thyristor valves' steady state,and transient state.On the basis of the results achieved,a synthetic test circuit of 6 500 A/50 kV for operational tests of thyristor valves used for up to UHVDC project has newly been set up and already put into service in Xi'an High Voltage Apparatus Research Institute Co.,Ltd.(XIHARI),China.Some of the results have been adopted also by a new national standard of China. 展开更多
关键词 equivalency operational test synthetic test circuit thyristor valve UHVDC
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Research on Reverse Recovery Transient of Parallel Thyristors for Fusion Power Supply
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作者 查烽炜 宋执权 +2 位作者 傅鹏 董琳 王敏 《Plasma Science and Technology》 SCIE EI CAS CSCD 2014年第7期716-720,共5页
In nuclear fusion power supply systems, the thyristors often need to be connected in parallel for sustaining large current. However, research on the reverse recovery transient of parallel thyristors has not been repor... In nuclear fusion power supply systems, the thyristors often need to be connected in parallel for sustaining large current. However, research on the reverse recovery transient of parallel thyristors has not been reported yet. When several thyristors are connected in parallel,they cannot turn-off at the same moment, and thus the turn-off model based on a single thyristor is no longer suitable. In this paper, an analysis is presented for the reverse recovery transient of parallel thyristors. Parallel thyristors can be assumed as one virtual thyristor so that the reverse recovery current can be modeled by an exponential function. Through equivalent transformation of the rectifier circuit, the commutating over-voltage can be calculated based on Kirchhoff’s equation. The reverse recovery current and commutation over-voltage waveforms are measured on an experiment platform for a high power rectifier supply. From the measurement results, it is concluded that the modeling method is acceptable. 展开更多
关键词 parallel thyristors reverse recovery transient commutating over-voltage high power rectifier
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High current pulse forming network switched by static induction thyristor
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作者 Juan Perez Taichi Sugai +4 位作者 Weihua Jiang Akira Tokuchi Masayuki Horie Yuya Ohshio Kazuma Ueno 《Matter and Radiation at Extremes》 SCIE EI CAS 2018年第5期261-266,共6页
A high-current pulse forming network (PFN) has been developed for applications to artificial solar-wind generation. It is switched by staticinduction thyristor (SIThy) and is capable of generating pulsed current of ~... A high-current pulse forming network (PFN) has been developed for applications to artificial solar-wind generation. It is switched by staticinduction thyristor (SIThy) and is capable of generating pulsed current of ~9.7 kA for a time duration of ~1 ms. The SIThy switch module ismade that it can be controlled by an optical signal and it can be operated at elevated electrical potential. The experiments reported in this paperused two switch modules connected in series for maximum operating voltage of 3.5 kV. The experimental results have demonstrated a pulsedhigh-current generator switched by semiconductor devices, as well as the control and operation of SIThy for pulsed power application. 展开更多
关键词 Pulsed power Pulse forming network Power semiconductor device thyristor High voltage
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A Thyristor-Only Input ESD Protection Scheme for CMOS RF ICs
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作者 Jin Young Choi Choongkoo Park 《Circuits and Systems》 2011年第3期170-182,共13页
We propose an input protection scheme composed of thyristor devices only without using a clamp NMOS device in order to minimize the area consumed by a pad structure in CMOS RF ICs. For this purpose, we suggest low-vol... We propose an input protection scheme composed of thyristor devices only without using a clamp NMOS device in order to minimize the area consumed by a pad structure in CMOS RF ICs. For this purpose, we suggest low-voltage triggering thyristor protection device structures assuming usage of standard CMOS processes, and attempt an in-depth comparison study with a conventional thyristor protection scheme incorporating a clamp NMOS device. The comparison study mainly focuses on robustness against the HBM ESD in terms of peak voltages applied to gate oxides in an input buffer and lattice heating inside protection devices based on DC and mixed-mode transient analyses utilizing a 2-dimensional device simulator. We constructed an equivalent circuit for the input HBM test environment of the CMOS chip equipped with the input ESD protection devices. And by executing mixed-mode simulations including up to four protection devices and analyzing the results for five different test modes, we attempt a detailed analysis on the problems which can occur in real HBM tests. We figure out strength of the proposed thyristor-only protection scheme, and suggest guidelines relating the design of the protection devices and circuits. 展开更多
关键词 ESD Protection HBM thyristor MIXED-MODE Simulation RF ICS
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A Study of High-Power Thyristor Switch of Poloidal-Field Power Supply System in HT-7U Super-Conductive Tokamak
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作者 温家良 刘正之 +1 位作者 付鹏 许家治 《Plasma Science and Technology》 SCIE EI CAS CSCD 2001年第5期1005-1010,共6页
Through theoretical analysis of thyristor switch, criterion of turn-off was derived for the design of thyristor switch. The expression of parameter design and its math model during the turn-off were deduced. The simul... Through theoretical analysis of thyristor switch, criterion of turn-off was derived for the design of thyristor switch. The expression of parameter design and its math model during the turn-off were deduced. The simulation and experiment have been accomplished to validate the analysis. 展开更多
关键词 A Study of High-Power thyristor Switch of Poloidal-Field Power Supply System in HT-7U Super-Conductive Tokamak HT
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Thyristor Junction Temperature Estimation Based on Measured Temperature of Molybdenum Flat 被引量:5
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作者 ZHANG Chunyu LI Chengrong +2 位作者 HAN Xiaohui ZHA Kunpeng TANG Guangfu 《中国电机工程学报》 EI CSCD 北大核心 2012年第22期I0026-I0026,1,共1页
为获得较准确的晶闸管结温,提出了基于晶闸管钼层实测温度计算结温的共扼梯度算法。分析了共轭梯度法用于求解结温的具体步骤,并通过FORTRAN语言编译形成LOG命令流,导入ANSYS软件中来实现算法,该方法对于未知的低频分量,以较少的迭代次... 为获得较准确的晶闸管结温,提出了基于晶闸管钼层实测温度计算结温的共扼梯度算法。分析了共轭梯度法用于求解结温的具体步骤,并通过FORTRAN语言编译形成LOG命令流,导入ANSYS软件中来实现算法,该方法对于未知的低频分量,以较少的迭代次数即可以得到准确解,对于未知的高频分量,通过多次的迭代也能够获得准确的返溯值,因而具备处理多个未知量且收敛速度快的优点。以KPD3000-72型晶闸管应用于直流输电领域为例,分别在直流稳态、单波次浪涌电流和3波次浪涌电流的试验条件下进行计算,结果表明所得结温准确,为传统热阻抗法提供了校核的依据。 展开更多
关键词 温度变化 晶闸管 结温 估计 平板 外国公司 瞬态工况 热阻抗
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A STUDY ON HEAT PIPE RADIATOR USED FOR THE COOLING OF THE HIGH-POWER THYRISTOR IN EXPLOSION-PROOF SHELL
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作者 李传统 韩淑英 丁毅 《Journal of China University of Mining and Technology》 1994年第2期99-103,共5页
The cooling of the high-power thyristor (HPT) in explosion-proof sbcll (EPS) used inmining pit has been a difficult problem for a long time. It has some spectal demands. According toheat pipe’s working principle, thi... The cooling of the high-power thyristor (HPT) in explosion-proof sbcll (EPS) used inmining pit has been a difficult problem for a long time. It has some spectal demands. According toheat pipe’s working principle, this paper introduced a kind of newly devcloped beat pipe radiatorSeveral HPT in EPS can be cooled by one beat pipe. In order to obtain the cooling and forced convection cooling , two dimensionless equations were obtained. This paper also studicd the refation between the surface temperature of HPT and the working electric current. The corresponding curvewas given out. Experiments shown that the beat pipe radistor introdued in this paper could effectively cool the HPT in EPS. It becomes a practical and valuable new technique. 展开更多
关键词 热管 半导体闸流管 爆炸 高动力 HPT
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Hybrid Operation of Fault Current Limiter and Thyristor Controlled Braking Resistor 被引量:1
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作者 Masaki Yagami Junji Tamura 《Journal of Energy and Power Engineering》 2012年第4期601-608,共8页
关键词 故障限流器 制动电阻 晶闸管控制 电力系统稳定性 故障电流限制器 混合 扭转振动 设备组合
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Study on Heat Dissipater for High-Power Thyristors in Explosion-Proof Shell
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作者 宋正昶 李传统 《Journal of China University of Mining and Technology》 2003年第2期126-130,共5页
A new type water-cooled heat dissipater for multiple high-power thyristors in explosion-proof shell used in coal mine was designed, and then, the numerical computation of the three-dimensional steady-state temperature... A new type water-cooled heat dissipater for multiple high-power thyristors in explosion-proof shell used in coal mine was designed, and then, the numerical computation of the three-dimensional steady-state temperature distributions under different working conditions for cooling core was conducted in order to understand in detail the heat transfer performance. Based on the computation results, the temperature differences and the maximum heat transfer rates were given. These results of the study on the heat dissipater lay a basis for optimising its structure design and guiding its operation. 展开更多
关键词 高压闸流晶体管 散热 热传输性能 数值计算 防爆壳
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Direct on Line Starting Induction Motor with Thyristor Switched Capacitor Based Voltage Regulation
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作者 E.P.da Silveira R.C. Pires A.T.L.de Almeida A.J.J. Rezek 《Journal of Energy and Power Engineering》 2010年第9期49-55,共7页
关键词 开关电容器 电压调节 晶闸管 异步电机 三相异步电动机 实验室规模 投切电容器组 拓扑结构
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Coordinated Design of Thyristors Controlled Braking Resistors and Power System Stabilizer for Damping
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作者 R.M. Hamouda Z.R. Alzaid M.A. Mostafa 《Journal of Energy and Power Engineering》 2010年第3期58-64,共7页
关键词 电力系统稳定器 可控制动电阻 协调设计 电阻器 晶闸管控制 阻尼 次同步振荡 仿真验证
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