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Influence of the distance between target and substrate on the properties of transparent conducting Al-Zr co-doped zinc oxide thin films 被引量:4
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作者 张化福 刘汉法 +1 位作者 周爱萍 袁长坤 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第11期17-20,共4页
Highly transparent and conducting Al-Zr co-doped zinc oxide (ZAZO) thin films were successfully prepared on glass substrate by direct current (DC) magnetron sputtering at room temperature. The distance between tar... Highly transparent and conducting Al-Zr co-doped zinc oxide (ZAZO) thin films were successfully prepared on glass substrate by direct current (DC) magnetron sputtering at room temperature. The distance between target and substrate was varied from 45 to 70 mm. All the deposited films are polycrystalline with a hexagonal structure and have a preferred orientation along the c-axis perpendicular to the substrate. The crystallinity increases obviously and the electrical resistivity decreases when the distance between target and substrate decreases from 70 to 50 mm. However, as the distance decreases further, the crystallinity decreases and the electrical resistivity increases. When the distance between target and substrate is 50 ram, it is found that the lowest resistivity is 6.9 × 10^-4Ω cm. All the deposited films show a high average transmittance of above 92% in the visible range. 展开更多
关键词 Al-Zr co-doped zinc oxide films transparent conducting films magnetron sputtering distance between target and substrate
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