Modified DS np Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

This study presents the design of a modified attributed control chart based on a double sampling(DS)np chart applied in combination with generalized multiple dependent state(GMDS)sampling to monitor the mean life of the product based on the time truncated life test employing theWeibull distribution.The control chart developed supports the examination of the mean lifespan variation for a particular product in the process of manufacturing.Three control limit levels are used:the warning control limit,inner control limit,and outer control limit.Together,they enhance the capability for variation detection.A genetic algorithm can be used for optimization during the in-control process,whereby the optimal parameters can be established for the proposed control chart.The control chart performance is assessed using the average run length,while the influence of the model parameters upon the control chart solution is assessed via sensitivity analysis based on an orthogonal experimental design withmultiple linear regression.A comparative study was conducted based on the out-of-control average run length,in which the developed control chart offered greater sensitivity in the detection of process shifts while making use of smaller samples on average than is the case for existing control charts.Finally,to exhibit the utility of the developed control chart,this paper presents its application using simulated data with parameters drawn from the real set of data.

A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

The design of a new adaptive version of the multiple dependent state(AMDS)sampling plan is presented based on the time truncated life test under the Weibull distribution.We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans.A warning sign for acceptance number was proposed to increase the probability of current lot acceptance.The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk.A simulation study was presented to support the proposed sampling plan.A comparison between the proposed and existing sampling plans,namely multiple dependent state(MDS)sampling plans and a modified multiple dependent state(MMDS)sampling plan,was considered under the average sampling number and operating characteristic curve values.In addition,the use of two real datasets demonstrated the practicality and usefulness of the proposed sampling plan.The results indicated that the proposed plan is more flexible and efficient in terms of the average sample number compared to the existing MDS and MMDS sampling plans.