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Control of Sudden Death of Entanglement by Transient Effects 被引量:3
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作者 Hünkar Kayhan 《Communications in Theoretical Physics》 SCIE CAS CSCD 2011年第9期487-489,共3页
We investigate the properties of entanglement between an isolated atom and a Jaynes-Cummings atom in the presence of transient effects. These effects are due to the modulation of the atom-field coupling whose explicit... We investigate the properties of entanglement between an isolated atom and a Jaynes-Cummings atom in the presence of transient effects. These effects are due to the modulation of the atom-field coupling whose explicit time-dependence is considered for the case of the linear sweep. We show that the sudden death of entanglement can be controlled by the transient effects. These effects can suppress the sudden death of entanglement in time. 展开更多
关键词 sudden death of entanglement transient effects Jaynes--Cummings model
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TRANSIENT EFFECT OF A BOGER FLUID FLOWING AROUND A CONFINED CYLINDER
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作者 Xian-feng Li Huai-tian Bu De-lu Zhao State Key Laboratory of Polymer Physics and Chemistry Center for Molecular Science,Institute of Chemistry, Chinese Academy of Sciences, Beijing 100080, China 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2001年第4期377-384,共8页
This paper is concerned with the numerical simulation of the transient effect of an inertialess Boger flow past a confined circular cylinder and the comparison of predictions with particle image velocimetry (PIV) meas... This paper is concerned with the numerical simulation of the transient effect of an inertialess Boger flow past a confined circular cylinder and the comparison of predictions with particle image velocimetry (PIV) measurements given by Shiang et al.. Dynamic simulation based on the Oldroyd-B constitutive model was carried out using a Lagrangian-Eulerian algorithm. The evolution of velocity field was obtained for the flow at two Deborah (De) numbers, i.e. De = 1.2 and 3.0. At low De, the flow reached steady state rapidly, and showed a symmetric flow regime. However, at high De, the time required to reach steady flow behind the cylinder increased significantly, and the distribution of the velocity field appears to be asymmetric with respect to the stagnation line. Fairly good agreement between the numerical results and the experimental observations is reported. It can be concluded that both the experimental measurements and the present simulations indicate that the elasticity of the polymeric flow strongly affect the flow regime of viscoelastic flow around a confined cylinder. 展开更多
关键词 transient effect flow around a cylinder Lagrangian-Eulerian algorithm Oldroyd-B model
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Analytical solution for a circular roadway considering the transient effect of excavation unloading
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作者 Feng Qiang Jiang Binsong +1 位作者 Wang Gang Hu Chuanpeng 《International Journal of Mining Science and Technology》 SCIE EI CSCD 2016年第4期543-549,共7页
The rocks surrounding a roadway exhibit some special and complex phenomena with increasing depth of excavation in underground engineering.Quasi-static analysis cannot adequately explain these engineering problems.The ... The rocks surrounding a roadway exhibit some special and complex phenomena with increasing depth of excavation in underground engineering.Quasi-static analysis cannot adequately explain these engineering problems.The computational model of a circular roadway considering the transient effect of excavation unloading is established for these problems.The time factor makes the solution of the problem difficult.Thus,the computational model is divided into a dynamic model and a static model.The Laplace integral transform and inverse transform are performed to solve the dynamic model and elasticity theory is used to analyze the static model.The results from an example show that circumferential stress increases and radial stress decreases with time.The stress difference becomes large gradually in this progress.The displacement increases with unloading time and decreases with the radial depth of surrounding rocks.It can be seen that the development trend of unloading and displacement is similar by comparing their rates.Finally,the results of ANSYS are used to verify the analytical solution.The contrast indicates that the laws of the two methods are basically in agreement.Thus,the analysis can provide a reference for further study. 展开更多
关键词 Excavation unloading transient effect Circle roadwayAnalytical solution Laplace integral transform Den lseger method
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Analyzing the transient effects of 60Co gamma rays in a CIS by Monte Carlo method 被引量:1
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作者 Yuan-Yuan Xue Zu-Jun Wang +8 位作者 Min-Bo Liu Rui Xu Hao Ning Wen Zhao Bao-Ping He Zhi-Bin Yao Jiang-Kun Sheng Wu-Ying Ma Guan-Tao Dong 《Nuclear Science and Techniques》 SCIE CAS CSCD 2019年第7期100-106,共7页
The objective of this work is to analyze the transient effects of ^60Co gamma rays in the CMOS image sensor (CIS) using the Monte Carlo method, based on Geant4. The track, energy spectrum, and angle of produced electr... The objective of this work is to analyze the transient effects of ^60Co gamma rays in the CMOS image sensor (CIS) using the Monte Carlo method, based on Geant4. The track, energy spectrum, and angle of produced electrons when gamma rays traversed a silicon or silicon dioxide cube were calculated. A simplified model of a 500 × 500 CIS array was established, and the transient effects of gamma rays in the CIS were simulated. The raw images were captured when the CIS was irradiated by gamma rays. The experimental results were compared with the simulation results. The characteristics of the typical events induced by transient effects were analyzed. 展开更多
关键词 ^60CO GAMMA RAYS transient effects CMOS image sensor (CIS) GEANT4
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Effect of the Transient Response in Si/Ge Parallelizing PN Junction 被引量:10
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作者 Weiqi HUANGt and Chaogang CHEN(Department of Physics, Guizhou Educational College, Guiyan 550003, China)Ergang CHEN(Department of Physics, Yunnan University, Kunming 650091, China)To whom correspondence should be addressed 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 1999年第4期383-383,共1页
There are some new results about photovoltaic transient response in the new effect. We suggest a theoretical model to explain the effect reasonably. The theoretical calculation results agree with that in experiments.
关键词 PN SI Ge effect of the transient Response in Si/Ge Parallelizing PN Junction
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Multi-Electron Effects in Attosecond Transient Absorption of CO Molecules 被引量:1
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作者 Bin Zhang Jian Zhao Zeng-Xiu Zhao 《Chinese Physics Letters》 SCIE CAS CSCD 2018年第4期20-24,共5页
Using the fully propagated time-dependent Hartree–Fock method, we identify that both the dynamic core polarization and multiorbital contributions are important in the attosecond transient absorption of CO molecules.T... Using the fully propagated time-dependent Hartree–Fock method, we identify that both the dynamic core polarization and multiorbital contributions are important in the attosecond transient absorption of CO molecules.The dynamics of core electrons effectively modifies the behaviors of electrons in the highest occupied molecular orbital, resulting in the modulation of intensity and position of the absorption peaks. Depending on the alignment angles, different inner orbitals are identified to contribute, and even dominate the total absorption spectra. As a result, multi-electron fingerprints are encoded in the absorption spectra, which shed light on future applications of attosecond transient absorption in complex systems. 展开更多
关键词 Multi-Electron effects in Attosecond transient Absorption of CO Molecules SAO AS CO
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Simulation of continuous terahertz wave transient state thermal effects on static water
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作者 吕英进 徐德刚 +4 位作者 刘鹏翔 吕达 文岐业 张怀武 姚建铨 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第10期253-257,共5页
We report a numerical simulation of continuous terahertz beam induced transient thermal effects on static water. The terahertz wave used in this paper has a Gaussian beam profile. Based on the transient heat conductio... We report a numerical simulation of continuous terahertz beam induced transient thermal effects on static water. The terahertz wave used in this paper has a Gaussian beam profile. Based on the transient heat conduction equation, the finite element method (FEM) is utilized to calculate the temperature distribution. The simulation results show the dynamic process of temperature change in water during terahertz irradiation. After about 300 s, the temperature reaches a steady state with a water layer thickness of 5 mm and a beam radius of 0.25 mm. The highest temperature increase is 7 K/mW approximately. This work motivates further study on the interaction between terahertz wave and bio-tissue, which has a high water content. 展开更多
关键词 TERAHERTZ transient thermal effect finite element method
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NUMERICAL MODEL OF THERMAL TRANSIENT EFFECT IN FIBER OPTIC GYRO
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作者 陈江平 吕葵 张炎华 《Journal of Shanghai Jiaotong university(Science)》 EI 1999年第1期50-54,共5页
The sensitivity of the interferometric fiber optic gyro in the presence of time varying thermal gradients plays a key role in its performance. It is well known that this sensitivity is due to the difference of index c... The sensitivity of the interferometric fiber optic gyro in the presence of time varying thermal gradients plays a key role in its performance. It is well known that this sensitivity is due to the difference of index changes between the points symmetrical with respect to the middle of the coil. In order to reduce this sensitivity, different winding patterns, such as quadrupolar winding, were introduced to keep the thermal environment of the symmetrical points. In this paper, a numerical model of the transient temperature distribution in the gyro was established. The temperature gradient of the coil was solved in conjugation with the nature convection heat transfer in the aperture between the coil and the case. Effects of the winding pattern and the design of its case were investigated to optimize the design of the interferometric fiber optic gyro. 展开更多
关键词 THERMAL transient effect FIBER OPTIC GYRO NUMERICAL model
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New insight into the parasitic bipolar amplification effect in single event transient production 被引量:1
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作者 Chen Jian-Jun Chen Shu-Ming +1 位作者 Liang Bin Deng Ke-Feng 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第1期334-339,共6页
In this paper, a new method is proposed to study the mechanism of charge collection in single event transient (SET) production in 90 nm bulk complementary metal oxide semiconductor (CMOS) technology. We find that ... In this paper, a new method is proposed to study the mechanism of charge collection in single event transient (SET) production in 90 nm bulk complementary metal oxide semiconductor (CMOS) technology. We find that different from the case in the pMOSFET, the parasitic bipolar amplification effect (bipolar effect) in the balanced inverter does not exist in the nMOSFET after the ion striking. The influence of the suhstrate process on the bipolar effect is also studied in the pMOSFET. We find that the bipolar effect can be effectively mitigated by a buried deep P+-well layer and can be removed by a buried SO2 layer. 展开更多
关键词 parasitic bipolar amplification effect (bipolar effect single event transient substrateprocess
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Transient growth in Poiseuille-Rayleigh-Bénard flows of binary fluids with Soret effect
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作者 Jun HU D.HENRY +1 位作者 H.BENHADID Xieyuan YIN 《Applied Mathematics and Mechanics(English Edition)》 SCIE EI CSCD 2016年第9期1203-1218,共16页
The transient growth due to non-normMity is investigated for the Poiseuille- Rayleigh-Benard problem of binary fluids with the Soret effect. For negative separation factors such as ψ = -0.1, it is found that a large ... The transient growth due to non-normMity is investigated for the Poiseuille- Rayleigh-Benard problem of binary fluids with the Soret effect. For negative separation factors such as ψ = -0.1, it is found that a large transient growth can be obtained by the non-normal interaction of the two least-stable-modes, i.e., the upstream and downstream modes, which determine the linear critical boundary curves for small Reynolds numbers. The transient growth is so strong that the optimal energy amplification factor G(t) is up to 10^2 - 10^3. While for positive separation factors such as ψ = 0.1, the transient growth is weak with the order O(I) of the amplification factor, which can even be computed by the least-stable-mode. However, for both cases, the least-stable-mode can govern the long-term behavior of the amplification factor for large time. The results also show that large Reynolds numbers have stabilization effects for the maximum amplification within moderate wave number regions. Meanwhile, much small negative or large positive separation factors and large Rayleigh numbers can enlarge the maximum transient growth of the pure streamwise disturbance with the wavenumber α= 3.14. Moreover, the initial and evolutionary two-dimensional spatial patterns of the large transient growth for the pure streamwise disturbance are exhibited with a plot of the velocity vector, spanwise vorticity, temperature, and concentration field. The initial three-layer cell vorticity struc- ture is revealed. When the amplification factor reaches the maximum Gmax, it develops into one cell structure with large amplification for the vorticity strength. 展开更多
关键词 binary fluid Soret effect transient growth Poiseuille-Rayleigh-Benard flow
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Experimental verification of the parasitic bipolar amplification effect in PMOS single event transients
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作者 何益百 陈书明 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第7期775-779,共5页
The contribution of parasitic bipolar amplification to SETs is experimentally verified using two P-hit target chains in the normal layout and in the special layout. For PMOSs in the normal layout, the single-event cha... The contribution of parasitic bipolar amplification to SETs is experimentally verified using two P-hit target chains in the normal layout and in the special layout. For PMOSs in the normal layout, the single-event charge collection is composed of diffusion, drift, and the parasitic bipolar effect, while for PMOSs in the special layout, the parasitic bipolar junction transistor cannot turn on. Heavy ion experimental results show that PMOSs without parasitic bipolar amplification have a 21.4% decrease in the average SET pulse width and roughly a 40.2% reduction in the SET cross-section. 展开更多
关键词 single event effect single event transient parasitic bipolar amplification heavy ion experiments
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Transient simulation and analysis of current collapse due to trapping effects in AlGaN/GaN high-electron-mobility transistor
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作者 周幸叶 冯志红 +3 位作者 王元刚 顾国栋 宋旭波 蔡树军 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第4期530-534,共5页
In this paper, two-dimensional (2D) transient simulations of an A1GaN/GaN high-electron-mobility transistor (HEMT) are carded out and analyzed to investigate the current collapse due to trapping effects. The coupl... In this paper, two-dimensional (2D) transient simulations of an A1GaN/GaN high-electron-mobility transistor (HEMT) are carded out and analyzed to investigate the current collapse due to trapping effects. The coupling effect of the trapping and thermal effects are taken into account in our simulation. The turn-on pulse gate-lag transient responses with different quiescent biases are obtained, and the pulsed current-voltage (l-V) curves are extracted from the transients. The experimental results of both gate-lag transient current and pulsed I-V curves are reproduced by the simulation, and the current collapse due to the trapping effect is explained from the view of physics based on the simulation results. In addition, the results show that bulk acceptor traps can influence the gate-lag transient characteristics of A1GaN/GaN HEMTs besides surface traps and that the thermal effect can accelerate the emission of captured electrons for traps. Pulse transient simulation is meaningful in analyzing the mechanism of dynamic current collapse, and the work in this paper will benefit the reliability study and model development of GaN-based devices. 展开更多
关键词 transient simulation A1GaN/GaN HEMT current collapse trapping effect
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Transient Characteristics of a High-Capacity Centrifugal Pump during Rapidly Regulating Discharge Valve 被引量:1
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作者 季英瑜 张玉良 《Journal of Donghua University(English Edition)》 EI CAS 2017年第1期60-65,共6页
In order to reveal the instantaneous characteristics of a high-capacity centrifugal pump during rapidly regulating discharge valve,theoretical analysis and numerical simulation are employed.The transient characteristi... In order to reveal the instantaneous characteristics of a high-capacity centrifugal pump during rapidly regulating discharge valve,theoretical analysis and numerical simulation are employed.The transient characteristics of the pump model under off-design condition were theoretically analyzed based on the generalized basic equation of vane pumps.The study showed that a centrifugal pump with radial straight blades at off-design condition almost had no transient effect,whereas a centrifugal pump with common backward-curved blades had transient effects that were directly related to the regularity of adjusting flowrate.Calculation examples show that transient effects are insignificant.The finite volume method and re-normalization group(RNG)κ-ε turbulence model were adopted to accomplish a 3D numerical calculation of a mediumspecific-speed centrifugal pump under the off-design condition.The transient process at the off-design condition is mainly caused by the time-varying intrinsic pulsation from the stator-rotor interference and by the time-varying consequent pulsation from the changes in flow rate. 展开更多
关键词 centrifugal pump off-design condition transient effect theoretical analysis stator-rotor interaction pulsation characteristics
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Axial effect analysis of relativistic electron beam propagation in vacuum 被引量:1
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作者 Xi WANG Jianhong HAO +6 位作者 Fang ZHANG Qiang ZHAO Jieqing FAN Bixi XUE Lei GAO Chenrui CHAI Zhiwei DONG 《Plasma Science and Technology》 SCIE EI CAS CSCD 2022年第6期116-123,共8页
In geostationary orbits and other quasi-vacuum environments,relativistic electron beams are affected by the initial emittance and space charge effects during the propagation process,resulting in beam quality degradati... In geostationary orbits and other quasi-vacuum environments,relativistic electron beams are affected by the initial emittance and space charge effects during the propagation process,resulting in beam quality degradation.Furthermore,axial energy distribution change in the beam and the axial transient electromagnetic effect caused by current changes in the head and tail regions of the beam also cause the beam to expand and affect its quality.In this study,the particle-in-cell method was used to construct a long-range propagation model of a relativistic electron beam in a vacuum environment.By calculating and simulating the axial energy distribution of the beam and the changes in the transient electromagnetic field,the axial effect during the propagation process was analyzed,and the parameter change law of the effective propagation of the beam was explored.This provided a theoretical reference for a more accurate assessment of the beam quality during propagation. 展开更多
关键词 relativistic electron beam axial energy distribution transient electromagnetic effect particle simulation
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Temperature dependence of the P-hit single event transient pulse width in a three-transistor inverter chain 被引量:3
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作者 Chen Shu-Ming Chen Jian-Jun 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第1期340-345,共6页
A comparison of the temperature dependence of the P-hit single event transient (SET) in a two-transistor (2T) inverter with that in a three-transistor (3T) inverter is carried out based on a three-dimensional nu... A comparison of the temperature dependence of the P-hit single event transient (SET) in a two-transistor (2T) inverter with that in a three-transistor (3T) inverter is carried out based on a three-dimensional numerical simulation. Due to the significantly distinct mechanisms of the single event change collection in the 2T and the 3T inverters, the temperature plays different roles in the SET production and propagation. The SET pulse will be significantly broadened in the 2T inverter chain while will be compressed in the 3T inverter chain as temperature increases. The investigation provides a new insight into the SET mitigation under the extreme environment, where both the high temperature and the single event effects should be considered. The 3T inverter layout structure (or similar layout structures) will be a better solution for spaceborne integrated circuit design for extreme environments. 展开更多
关键词 temperature dependence single event transient parasitic bipolar amplification effect charge sharing collection
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应急供水多级泵意外停机水力过渡过程瞬态特性 被引量:2
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作者 司乔瑞 夏欣 +2 位作者 武凯鹏 邓凡杰 袁寿其 《农业工程学报》 EI CAS CSCD 北大核心 2024年第4期72-81,共10页
应急供水多级泵的意外停机会引起系统性能参数的剧烈变化,严重威胁供水安全。为了探究多级泵停机水力过渡过程内部流场的瞬态效应,该研究建立了基于叶轮转动平衡方程的泵停机过程转速预测方法,数值模拟分析了意外停机过程中多级泵内部... 应急供水多级泵的意外停机会引起系统性能参数的剧烈变化,严重威胁供水安全。为了探究多级泵停机水力过渡过程内部流场的瞬态效应,该研究建立了基于叶轮转动平衡方程的泵停机过程转速预测方法,数值模拟分析了意外停机过程中多级泵内部流动特性。研究结果表明:在意外停机过程中,多级泵分别经历水泵工况、制动工况、反转工况以及飞逸工况4个阶段,转速呈现先减小至0后沿负方向增大的趋势,最后稳定在飞逸转速-4210 r/min附近;流量呈现先减小至0后沿负方向增大的趋势,然后再沿正方向增大,最终稳定在飞逸流量-14.32 kg/s附近;扭矩呈现先减小再增加,最后减小并稳定在零点附近。泵内流量和转速的大小、方向不断变化引起叶轮流道内流体的流动分离和回流,伴随着涡的形成、发展和破碎等时空演变;熵产值的变化与多级泵内不稳定流动密切相关,由湍流耗散所带来的损失起主导作用,在达到飞逸工况后湍流耗散熵产占比约65.2%,能量损失主要发生在叶轮流道内,且制动工况中内流场的损失较大;多级泵首级流道内监测点压力变化最为剧烈,各级监测点的压力脉动系数波动幅值随着级数的增加呈减小趋势;压力脉动振幅主导频率与多级泵转速呈现正相关关系,主导分量对应于叶轮流道的叶片通过频率,且沿着流体流动方向压力脉动频率振幅逐渐增大,压力脉动的频率特性可以反应出意外停机过程中流量的不稳定变化。研究成果可为应急供水系统安全稳定运行提供理论指导。 展开更多
关键词 离心泵 瞬态效应 内部流动 意外停机 熵产分析
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Temperature and drain bias dependence of single event transient in 25-nm FinFET technology 被引量:2
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作者 秦军瑞 陈书明 +2 位作者 李达维 梁斌 刘必慰 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第8期590-594,共5页
In this paper, we investigate the temperature and drain bias dependency of single event transient (SET) in 25-nm fin field-effect-transistor (FinFET) technology in a temperature range of 0-135 ℃ and supply voltag... In this paper, we investigate the temperature and drain bias dependency of single event transient (SET) in 25-nm fin field-effect-transistor (FinFET) technology in a temperature range of 0-135 ℃ and supply voltage range of 0.4 V- 1.6 V. Technology computer-aided design (TCAD) three-dimensional simulation results show that the drain current pulse duration increases from 0.6 ns to 3.4 ns when the temperature increases from 0 to 135 ℃. The charge collected increases from 45.5 ℃ to 436.9 fC and the voltage pulse width decreases from 0.54 ns to 0.18 ns when supply voltage increases from 0.4 V to 1.6 V. Furthermore, simulation results and the mechanism of temperature and bias dependency are discussed. 展开更多
关键词 fin field-effect transistor single event transient temperature dependence drain bias dependence
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PIPBQ Effect Aware SER Analysis for Combinational Logic Circuits
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作者 Ai-Bin Yan Hua-Guo Liang +2 位作者 Zheng-Feng Huang Zhi Wang Cui-Yun Jiang 《Journal of Electronic Science and Technology》 CAS CSCD 2016年第1期60-67,共8页
Technology scaling results in the propagation-induced pulse broadening and quenching(PIPBQ) effect become more noticeable.In order to effectively evaluate the soft error rate for combinational logic circuits,a soft ... Technology scaling results in the propagation-induced pulse broadening and quenching(PIPBQ) effect become more noticeable.In order to effectively evaluate the soft error rate for combinational logic circuits,a soft error rate analysis approach considering the PIPBQ effect is proposed.As different original pulse propagating through logic gate cells,pulse broadening and quenching are measured by HSPICE.After that,electrical effect look-up tables(EELUTs) for logic gate cells are created to evaluate the PIPBQ effect.Sensitized paths are accurately retrieved by the proposed re-convergence aware sensitized path search algorithm.Further,by propagating pulses on these paths to simulate fault injection,the PIPBQ effect on these paths can be quantified by EELUTs.As a result,the soft error rate of circuits can be effectively computed by the proposed technique.Simulation results verify the soft error rate improvement comparing with the PIPBQ-not-aware method. 展开更多
关键词 Pulse broadening and quenching effect re-convergence single event transient soft error rate
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Heat transfer enhancement in MOSFET mounted on different FR4 substrates by thermal transient measurement
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作者 Norazlina M S Dheepan Chakravarthii M K +2 位作者 Shanmugan S Mutharasu D Shahrom Mahmud 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第9期549-556,共8页
Miniaturization of electronic package leads to high heat density and heat accumulation in electronics device, resulting in short life time and premature failure of the device. Junction temperature and thermal resistan... Miniaturization of electronic package leads to high heat density and heat accumulation in electronics device, resulting in short life time and premature failure of the device. Junction temperature and thermal resistance are the critical parameters that determine the thermal management and reliability in electronics cooling. Metal oxide field effect transistor(MOSFET)is an important semiconductor device for light emitting diode-integrated circuit(LED IC) driver application, and thermal management in MOSFET is a major challenge. In this study, investigations on thermal performance of MOSFET are performed for evaluating the junction temperature and thermal resistance. Suitable modifications in FR4 substrates are proposed by introducing thermal vias and copper layer coating to improve the thermal performance of MOSFET. Experiments are conducted using thermal transient tester(T3ster) at 2.0 A input current and ambient temperature varying from25℃ to 75℃. The thermal parameters are measured for three proposed designs: FR4 with circular thermal vias, FR4 with single strip of copper layer and embedded vias, and FR4 with I-shaped copper layer, and compared with that of plain FR4 substrate. From the experimental results, FR4I-shaped shows promising results by 33.71% reduction in junction temperature and 54.19% reduction in thermal resistance. For elevated temperature, the relative increases in junction temperature and thermal resistance are lower for FR4I-shaped than those for other substrates considered. The introduction of thermal vias and copper layer plays a significant role in thermal performance. 展开更多
关键词 metal oxide field effect transistor(MOSFET) thermal transient measurement heat transfer path FR4
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The dual role of multiple-transistor charge sharing collection in single-event transients
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作者 郭阳 陈建军 +2 位作者 何益百 梁斌 刘必慰 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第4期360-364,共5页
As technologies scale down in size, multiple-transistors being affected by a single ion has become a universal phenomenon, and some new effects are present in single event transients (SETs) due to the charge sharing... As technologies scale down in size, multiple-transistors being affected by a single ion has become a universal phenomenon, and some new effects are present in single event transients (SETs) due to the charge sharing collection of the adjacent multiple-transistors. In this paper, not only the off-state p-channel metal–oxide semiconductor field-effect transistor (PMOS FET), but also the on-state PMOS is struck by a heavy-ion in the two-transistor inverter chain, due to the charge sharing collection and the electrical interaction. The SET induced by striking the off-state PMOS is efficiently mitigated by the pulse quenching effect, but the SET induced by striking the on-state PMOS becomes dominant. It is indicated in this study that in the advanced technologies, the SET will no longer just be induced by an ion striking the off-state transistor, and the SET sensitive region will no longer just surround the off-state transistor either, as it is in the older technologies. We also discuss this issue in a three-transistor inverter in depth, and the study illustrates that the three-transistor inverter is still a better replacement for spaceborne integrated circuit design in advanced technologies. 展开更多
关键词 multiple-transistor charge sharing collection single event transient (SET) pulse quenching effect radiation hardened by design (RHBD)
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