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The Transport Mechanisms of Reverse Leakage Current in Ultraviolet Light-Emitting Diodes
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作者 戴峰 郑雪峰 +5 位作者 李培咸 侯晓慧 王颖哲 曹艳荣 马晓华 郝跃 《Chinese Physics Letters》 SCIE CAS CSCD 2016年第11期92-95,共4页
The transport mechanisms of the reverse leakage current in the UV light-emitting diodes (380nm) are investi- gated by the temperature-dependent current-voltage measurement first. Three possible transport mechanisms,... The transport mechanisms of the reverse leakage current in the UV light-emitting diodes (380nm) are investi- gated by the temperature-dependent current-voltage measurement first. Three possible transport mechanisms, the space-limited-charge conduction, the variable-range hopping and the Poole-Frenkel emission, are proposed to explain the transport process of the reverse leakage current above 295 K, respectively. With the in-depth investigation, the former two transport mechanisms are excluded. It is found that the experimental data agree well with the Poole Frenkel emission model. Furthermore, the activation energies of the traps that cause the reverse leakage current are extracted, which are 0.05eV, 0.09eV, and 0.11 eV, respectively. This indicates that at least three types of trap states are located below the bottom of the conduction band in the depletion region of the UV LEDs. 展开更多
关键词 LEDS UV IS of The Transport Mechanisms of Reverse leakage Current in Ultraviolet Light-Emitting Diodes INGAN in
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