Two-Terminal Lithium-Mediated Artificial Synapses with Enhanced Weight Modulation for Feasible Hardware Neural Networks

Recently,artificial synapses involving an electrochemical reaction of Li-ion have been attributed to have remarkable synaptic properties.Three-terminal synaptic transistors utilizing Li-ion intercalation exhibits reliable synaptic characteristics by exploiting the advantage of nondistributed weight updates owing to stable ion migrations.However,the three-terminal configurations with large and complex structures impede the crossbar array implementation required for hardware neuromorphic systems.Meanwhile,achieving adequate synaptic performances through effective Li-ion intercalation in vertical two-terminal synaptic devices for array integration remains challenging.Here,two-terminal Au/LixCoO_(2)/Pt artificial synapses are proposed with the potential for practical implementation of hardware neural networks.The Au/LixCoO_(2)/Pt devices demonstrated extraordinary neuromorphic behaviors based on a progressive dearth of Li in LixCoO_(2)films.The intercalation and deintercalation of Li-ion inside the films are precisely controlled over the weight control spike,resulting in improved weight control functionality.Various types of synaptic plasticity were imitated and assessed in terms of key factors such as nonlinearity,symmetricity,and dynamic range.Notably,the LixCoO_(2)-based neuromorphic system outperformed three-terminal synaptic transistors in simulations of convolutional neural networks and multilayer perceptrons due to the high linearity and low programming error.These impressive performances suggest the vertical two-terminal Au/LixCoO_(2)/Pt artificial synapses as promising candidates for hardware neural networks.

Capacitated stochastic coloured Petri net-based approach for computing two-terminal reliability of multi-state network

Classical network reliability problems assume both net- works and components have only binary states, fully working or fully failed states. But many actual networks are multi-state, such as communication networks and transportation networks. The nodes and arcs in the networks may be in intermediate states which are not fully working either fully failed. A simulation ap- proach for computing the two-terminal reliability of a multi-state network is described. Two-terminal reliability is defined as the probability that d units of demand can be supplied from the source to sink nodes under the time threshold T. The capacities of arcs may be in a stochastic state following any discrete or continuous distribution. The transmission time of each arc is also not a fixed number but stochastic according to its current capacity and de- mand. To solve this problem, a capacitated stochastic coloured Petri net is proposed for modelling the system behaviour. Places and transitions respectively stand for the nodes and arcs of a net- work. Capacitated transition and self-modified token colour with route information are defined to describe the multi-state network. By the simulation, the two-terminal reliability and node importance can be estimated and the optimal route whose reliability is highest can also be given. Finally, two examples of different kinds of multi- state networks are given.

On the Absence of Carrier Drift in Two-Terminal Devices and the Origin of Their Lowest Resistance Per Carrier R_k=h/Q²

After a criticism on today’s model for electrical noise in resistors, we pass to use a Quantum-compliant model based on the discreteness of electrical charge in a complex Admittance. From this new model we show that carrier drift viewed as charged particle motion in response to an electric field is unlike to occur in bulk regions of Solid-State devices where carriers react as dipoles against this field. The absence of the shot noise that charges drifting in resistors should produce and the evolution of the Phase Noise with the active power existing in the resonators of L-C oscillators, are two effects added in proof for this conduction model without carrier drift where the resistance of any two-terminal device becomes discrete and has a minimum value per carrier that is the Quantum Hall resistance Rk=h/q2

Application of Six-Sequence Fault Components in Fault Location for Joint Parallel Transmission Line

A new fault location method based on six-sequence fault components was developed for parallel lines based on the fault analysis of a joint parallel transmission line. In the six-sequence fault network, the ratio of the root-mean square value of the fault current from two terminals is the function of the line imped- ance, the system impedance, and the fault distance away from the buses. A fault location equation is given to relate these factors. For extremely long transmission lines, the distributed capacitance is divided by the fault point and allocated to the two terminals of the transmission line in a lumped parameter to eliminate the influence of the distributed capacitance on the location accuracy. There is no limit on fault type and syn- chronization of the sampling data. Simulation results show that the location accuracy is high with an average error about 2%, and it is not influenced by factors such as the load current, the operating mode of the power system, or the fault resistance.