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Mold deformation in soft UV-nanoimprint lithography 被引量:1
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作者 LAN HongBo DING YuCheng +4 位作者 LIU HongZhong QUE YeRong TAO WeiWei LI HanSong LU BingHeng 《Science China(Technological Sciences)》 SCIE EI CAS 2009年第2期294-302,共9页
UV-nanoimprint lithography (UV-NIL) using a soft mold is a promising technique with low cost and high throughput for producing the submicron scale large-area patterns. However, the deformations of the soft mold during... UV-nanoimprint lithography (UV-NIL) using a soft mold is a promising technique with low cost and high throughput for producing the submicron scale large-area patterns. However, the deformations of the soft mold during imprinting process which can cause serious consequences have to be understood for the practical application of the process. This paper investigated the deformation of the soft mold by theoretical analyses, numerical simulations, and experimental studies. We simulated the mold deformation using a simplified model and finite element method. The simulation and the related experimental results agree well with each other. Through the investigation, the mechanism and affected factors of the mold deformation are revealed, and some useful conclusions have been achieved. These results will be valuable in optimizing the imprinting process conditions and mold design for improving the quality of transferred patterns. 展开更多
关键词 uv-nanoimprint LITHOGRAPHY (uv-nil) SOFT MOLD DEFORMATION numerical simulation finite element model
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