Many reconfiguration schemes for fault-tolerant binary tree architectures have been proposed in the lite..t.re[1-6]. The VLSI layouts of most previous studies are based on the classical H-tree layout, resulting in low...Many reconfiguration schemes for fault-tolerant binary tree architectures have been proposed in the lite..t.re[1-6]. The VLSI layouts of most previous studies are based on the classical H-tree layout, resulting in low area utilization and likely an unnecessarily high manufacturing cost simply due to the waste of a significaot portion of silicon area. In this paper, we present an area-efficient approach to the reconfigurable binary tree architecture. Area utilization and interconnection complexity of our design compare favorably with the other known approaches. In the reliability analysis, we take ioto arcount the faCt that accepted chips (after fabrication) are with dmereot degrees of redundancy initially, so as to obtain results which better reflect real situations.展开更多
A new approach to repair memory chips with redundancy is proposed.This approach is based on the minimization of the repair cost.Algorithms for cost driven repair are presented.The algorithms can be ex- ecuted either o...A new approach to repair memory chips with redundancy is proposed.This approach is based on the minimization of the repair cost.Algorithms for cost driven repair are presented.The algorithms can be ex- ecuted either on-line(concurrently with the testing of the memory),or off-line(at completion of testing). Analytical expressions for the repair cost under both circumstances are given.The presented algorithms are also perfect in the sense that they can correctly diagnose a repairable/unrepairable memory and find the optimal repair-solution.展开更多
文摘Many reconfiguration schemes for fault-tolerant binary tree architectures have been proposed in the lite..t.re[1-6]. The VLSI layouts of most previous studies are based on the classical H-tree layout, resulting in low area utilization and likely an unnecessarily high manufacturing cost simply due to the waste of a significaot portion of silicon area. In this paper, we present an area-efficient approach to the reconfigurable binary tree architecture. Area utilization and interconnection complexity of our design compare favorably with the other known approaches. In the reliability analysis, we take ioto arcount the faCt that accepted chips (after fabrication) are with dmereot degrees of redundancy initially, so as to obtain results which better reflect real situations.
基金This research is supported in part by grants from AT&T and NATO.
文摘A new approach to repair memory chips with redundancy is proposed.This approach is based on the minimization of the repair cost.Algorithms for cost driven repair are presented.The algorithms can be ex- ecuted either on-line(concurrently with the testing of the memory),or off-line(at completion of testing). Analytical expressions for the repair cost under both circumstances are given.The presented algorithms are also perfect in the sense that they can correctly diagnose a repairable/unrepairable memory and find the optimal repair-solution.
