A normal incidence vacuum ultraviolet （VUV） and a grazing incidence extreme ultraviolet （EUV） spectrometers have been developed for the edge and core impurity measure- ments in HL-2A tokamak. The VUV and the EUV s...A normal incidence vacuum ultraviolet （VUV） and a grazing incidence extreme ultraviolet （EUV） spectrometers have been developed for the edge and core impurity measure- ments in HL-2A tokamak. The VUV and the EUV spectrometers cover wavelength ranges of 300-3200 A and 50-500A, respectively. A spatial resolution of 2 mm has been achieved for the VUV spectrometer when a space-resolved slit 50 #m in width is used. The space-resolved slit is placed between the entrance slit and the grating of the spectrometer. The spectral resolutions of 0.15/~ for the VUV spectrometer in the wavelength coverage of the concave 1200 grooves/mm grating and of 0.22A for the EUV spectrometer at λ=200A with a flat-field laminar-type holo- graphic grating are obtained. The sensitivity of the VUV spectrometer was calibrated in situ with the plasma bremsstrahlung radiation. The experimental results from both spectrometers are presented, especially the line intensity radial profiles measured by the VUV spectrometer.展开更多
基金partially supported by National Natural Science Foundation of China (Nos. 10975048 and 11175061)the JSPS-NRF-NSFC A3 Foresight Program in the Field of Plasma Physics (No. 11261140328)
文摘A normal incidence vacuum ultraviolet （VUV） and a grazing incidence extreme ultraviolet （EUV） spectrometers have been developed for the edge and core impurity measure- ments in HL-2A tokamak. The VUV and the EUV spectrometers cover wavelength ranges of 300-3200 A and 50-500A, respectively. A spatial resolution of 2 mm has been achieved for the VUV spectrometer when a space-resolved slit 50 #m in width is used. The space-resolved slit is placed between the entrance slit and the grating of the spectrometer. The spectral resolutions of 0.15/~ for the VUV spectrometer in the wavelength coverage of the concave 1200 grooves/mm grating and of 0.22A for the EUV spectrometer at λ=200A with a flat-field laminar-type holo- graphic grating are obtained. The sensitivity of the VUV spectrometer was calibrated in situ with the plasma bremsstrahlung radiation. The experimental results from both spectrometers are presented, especially the line intensity radial profiles measured by the VUV spectrometer.
