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Secondary Electron Yield Studies on Vacuum Materials 被引量:5
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作者 张耀锋 王勇 +4 位作者 尉伟 王建平 范乐 管长应 刘祖平 《Chinese Physics C》 SCIE CAS CSCD 北大核心 2008年第z1期68-70,共3页
A secondary electron yield test device for vacuum material study is set up,and its detailed design described in this paper.The test results for a few common vacuum materials with and without TiN film coating are prese... A secondary electron yield test device for vacuum material study is set up,and its detailed design described in this paper.The test results for a few common vacuum materials with and without TiN film coating are presented,and the influential factors on secondary electron yield are analyzed.All the work will be helpful to the surface pretreatment of vacuum materials. 展开更多
关键词 electron cloud electron secondary yield vacuum chamber material TiN coating
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