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High Quality SiGe Layer Deposited by a New Ultrahigh Vacuum Chemical Vapor Deposition System
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作者 Guangli LUO, Xiaofeng LIN, Peiyi CHEN and Peixin TSIAN (Institute of Microelectronics, Tsinghua University, Beijing 100084, China 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2000年第1期94-96,共3页
An ultrahigh vacuum chemical vapor deposition (UHV/CVD) system is developed and the details of its construction and operation are reported. Using high purity SiH4 and GeH4 reactant gases, the Si0.82Ge0.18 layer is dep... An ultrahigh vacuum chemical vapor deposition (UHV/CVD) system is developed and the details of its construction and operation are reported. Using high purity SiH4 and GeH4 reactant gases, the Si0.82Ge0.18 layer is deposited at 550℃. With the measurements by double crystal X-ray diffraction (DCXRD), transmission electron microscopy (TEM) and Rutherford backscattering spectroscppy (RBS) techniques, it is shown that the crystalline quality of the SiGe layer is good, and the underlying SiGe/Si heterointerface is sharply defined. 展开更多
关键词 SIGE high High Quality SiGe Layer Deposited by a New Ultrahigh vacuum Chemical vapor deposition System
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Growth of Ge Layer on Relaxed Ge-Rich SiGe by Ultrahigh Vacuum Chemical Vapor Deposition 被引量:3
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作者 刘佳磊 梁仁荣 +3 位作者 王敬 徐阳 许军 刘志弘 《Tsinghua Science and Technology》 SCIE EI CAS 2007年第6期747-751,共5页
The paper describes the growth of a germanium (Ge) film on a thin relaxed Ge-rich SiGe buffer. The thin Ge-rich SiGe buffer layer was achieved through a combination of ultrahigh vacuum chemical vapor deposition (UH... The paper describes the growth of a germanium (Ge) film on a thin relaxed Ge-rich SiGe buffer. The thin Ge-rich SiGe buffer layer was achieved through a combination of ultrahigh vacuum chemical vapor deposition (UHVCVD) SiGe epitaxial growth and SiGe oxidation. A lower Ge content strained SiGe layer was first grown on the Si (001) substrate and then the Ge mole fraction was increased by oxidation. After removal of the surface oxide, a higher Ge content SiGe layer was grown and oxidized again. The Ge mole fraction was increased to 0.8 in the 50 nm thick SiGe layer. Finally a 150 nm thick pure Ge film was grown on the SiGe buffer layer using the UHVCVD system. This technique produces a much thinner buffer than the conventional compositionally graded relaxed SiGe method with the same order of magnitude threading dislocation density. 展开更多
关键词 pure Ge SiGe buffer OXIDATION ultrahigh vacuum chemical vapor deposition
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Morphology and Field Emission of ZnO Nanomaterials at Different Positions
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作者 Junzheng Wang Lijun Wang 《Journal of Applied Mathematics and Physics》 2022年第4期1028-1035,共8页
By simply adjusting the temperature and the number of materials, rod-like ZnO with different morphology, such as ZnO nanoneedles, were synthesized by a flexible thermal evaporation method. The ZnO nanorod array has th... By simply adjusting the temperature and the number of materials, rod-like ZnO with different morphology, such as ZnO nanoneedles, were synthesized by a flexible thermal evaporation method. The ZnO nanorod array has the lowest turn-on field, the highest current density, and the highest emission efficiency due to its good contact with the substrate and relatively weak field shielding effect. Experiments show that the morphology and orientation of one-dimensional ZnO nanomaterials have a great influence on its conduction field and emission current density, and the nanoarrays also contribute to electron emission. The research results have a certain reference value for the application of ZnO nanorod arrays as cathode materials for field emission devices. 展开更多
关键词 Field Emission ZnO Films vacuum Electron Beam vapor deposition
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