Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation module...Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation modules to ATEis more and more vauable. In this papert a new approach to migrating test pro-grams is presented. A virtual ATE model based on object-oriellted paradigm isdeveloped; it runs Test C++ (an intermediate test control language) programsand TeIF (Test Intermediate Format - an intermediate pattern), migrates testprograms among three kinds of ATE (Ando DIC8032, Schlumberger S15 andGenRad 1732) and gellerates test patterns from two kinds of CAD (Daisy andPanda) automatically.展开更多
文摘Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation modules to ATEis more and more vauable. In this papert a new approach to migrating test pro-grams is presented. A virtual ATE model based on object-oriellted paradigm isdeveloped; it runs Test C++ (an intermediate test control language) programsand TeIF (Test Intermediate Format - an intermediate pattern), migrates testprograms among three kinds of ATE (Ando DIC8032, Schlumberger S15 andGenRad 1732) and gellerates test patterns from two kinds of CAD (Daisy andPanda) automatically.
