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Repairing VLSI/WSI Redundant Memories with Minimum Cost
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作者 黄维康 F.Lombardi 《Journal of Computer Science & Technology》 SCIE EI CSCD 1990年第2期187-196,共10页
A new approach to repair memory chips with redundancy is proposed.This approach is based on the minimization of the repair cost.Algorithms for cost driven repair are presented.The algorithms can be ex- ecuted either o... A new approach to repair memory chips with redundancy is proposed.This approach is based on the minimization of the repair cost.Algorithms for cost driven repair are presented.The algorithms can be ex- ecuted either on-line(concurrently with the testing of the memory),or off-line(at completion of testing). Analytical expressions for the repair cost under both circumstances are given.The presented algorithms are also perfect in the sense that they can correctly diagnose a repairable/unrepairable memory and find the optimal repair-solution. 展开更多
关键词 Computer Simulation Data Storage Semiconductor Integrated circuits VLSI Integrated circuits wsi REDUNDANCY
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