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Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source 被引量:1
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作者 Yasuhiro Mizutani Shoma Kataoka +1 位作者 Tsutomu Uenohara Yasuhiro Takaya 《Nanomanufacturing and Metrology》 2021年第1期37-45,共9页
We propose ghost imaging(GI)with deep learning to improve detection speed.GI,which uses an illumination light with random patterns and a single-pixel detector,is correlation-based and thus suitable for detecting weak ... We propose ghost imaging(GI)with deep learning to improve detection speed.GI,which uses an illumination light with random patterns and a single-pixel detector,is correlation-based and thus suitable for detecting weak light.However,its detection time is too long for practical inspection.To overcome this problem,we applied a convolutional neural network that was constructed based on a classification of the causes of ghost image degradation.A feasibility experiment showed that when using a digital mirror device projector and a photodiode,the proposed method improved the quality of ghost images. 展开更多
关键词 Inspection METROLOGY Defect mapping Ghost imaging Single-pixel imaging Deep learning weak light imaging
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