In this note,the tampered failure rate model is generalized from the step-stress accelerated life testing setting to the progressive stress accelerated life testing for the first time.For the parametric setting where ...In this note,the tampered failure rate model is generalized from the step-stress accelerated life testing setting to the progressive stress accelerated life testing for the first time.For the parametric setting where the scale parameter satisfying the equation of the inverse power law is Weibull,maximum likelihood estimation is investigated.展开更多
This paper proposes a simple constant-stress accel- erated life test (ALT) model from Burr type XII distribution when the data are Type-I progressively hybrid censored. The maximum likelihood estimation (MLE) of t...This paper proposes a simple constant-stress accel- erated life test (ALT) model from Burr type XII distribution when the data are Type-I progressively hybrid censored. The maximum likelihood estimation (MLE) of the parameters is obtained through the numerical method for solving the likelihood equations. Approxi- mate confidence interval (CI), based on normal approximation to the asymptotic distribution of MLE and percentile bootstrap Cl is derived. Finally, a numerical example is introduced and then a Monte Carlo simulation study is carried out to illustrate the pro- posed method.展开更多
A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multi...A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.展开更多
To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the...To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method (LSM) to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month.展开更多
In general,simple subsystems like series or parallel are integrated to produce a complex hybrid system.The reliability of a system is determined by the reliability of its constituent components.It is often extremely d...In general,simple subsystems like series or parallel are integrated to produce a complex hybrid system.The reliability of a system is determined by the reliability of its constituent components.It is often extremely difficult or impossible to get specific information about the component that caused the system to fail.Unknown failure causes are instances in which the actual cause of systemfailure is unknown.On the other side,thanks to current advanced technology based on computers,automation,and simulation,products have become incredibly dependable and trustworthy,and as a result,obtaining failure data for testing such exceptionally reliable items have become a very costly and time-consuming procedure.Therefore,because of its capacity to produce rapid and adequate failure data in a short period of time,accelerated life testing(ALT)is the most utilized approach in the field of product reliability and life testing.Based on progressively hybrid censored(PrHC)data froma three-component parallel series hybrid system that failed to owe to unknown causes,this paper investigates a challenging problem of parameter estimation and reliability assessment under a step stress partially accelerated life-test(SSPALT).Failures of components are considered to follow a power linear hazard rate(PLHR),which can be used when the failure rate displays linear,decreasing,increasing or bathtub failure patterns.The Tempered random variable(TRV)model is considered to reflect the effect of the high stress level used to induce early failure data.The maximum likelihood estimation(MLE)approach is used to estimate the parameters of the PLHR distribution and the acceleration factor.A variance covariance matrix(VCM)is then obtained to construct the approximate confidence intervals(ACIs).In addition,studentized bootstrap confidence intervals(ST-B CIs)are also constructed and compared with ACIs in terms of their respective interval lengths(ILs).Moreover,a simulation study is conducted to demonstrate the performance of the estimation procedures and the methodology discussed in this paper.Finally,real failure data from the air conditioning systems of an airplane is used to illustrate further the performance of the suggested estimation technique.展开更多
Mechatronic products usually endure the variable stress spectrum when they operate in certain operational condition and environmental condition, which obey the Weibull distribution. In accordance with the features of ...Mechatronic products usually endure the variable stress spectrum when they operate in certain operational condition and environmental condition, which obey the Weibull distribution. In accordance with the features of mechatronic product, this paper analyzes the failure mode, its corresponding sensitive stress and the design principles of life testing profiles. Based on the above analyses, this paper presents a synthetic stress life testing method based on the hybrid Weibull distribution and its statistical method under variable stress spectrum to evaluate the reliability and life indices of mechatronic products. Because the mechatronic products have many characteristics such as high price, long life and small testing samples, the synthetic stress life testing method under variable load spectrum can simulate the real various spectra, decrease the life testing time and reduce the testing samples. So it is effective to carry out the life testing to mechatronic products. The application results of hydraulic pumps indicate that this method can easily handle the experimental data under variable amplitude spectrum, obtain the high precision parameters point estimation and confidence interval estimation and reduce the testing cost greatly.展开更多
In order to obtain the life information of the vacuum fluorescent display (VFD) in a short time, a model of constant stress accelerated life tests (CSALT) is established with its filament temperature increased, an...In order to obtain the life information of the vacuum fluorescent display (VFD) in a short time, a model of constant stress accelerated life tests (CSALT) is established with its filament temperature increased, and four constant stress tests are conducted. The Weibull function is applied to describe the life distribution of the VFD, and the maximum likelihood estimation (MLE) and its iterative flow chart are used to calculate the shape parameters and the scale parameters. Furthermore, the accelerated life equation is determined by the least square method, the Kolmogorov-Smirnov test is performed to verify whether the VFD life meets the Weibull distribution or not, and selfdeveloped software is employed to predict the average life and the reliable life. Statistical data analysis results demonstrate that the test plans are feasible and versatile, that the VFD life follows the Weibull distribution, and that the VFD accelerated model satisfies the linear Arrhenius equation. The proposed method and the estimated life information of the VFD can provide some significant guideline to its manufacturers and customers.展开更多
为了有效快速评估高可靠性长寿命产品在正常应力条件下的可靠性,提出了一种双应力恒加试验Weibull分布型产品置信可靠性评估模型。首先,采用加速寿命试验(accelerated life test,ALT)技术,建立广义Eyring-Weibull可靠性模型,假定试验各...为了有效快速评估高可靠性长寿命产品在正常应力条件下的可靠性,提出了一种双应力恒加试验Weibull分布型产品置信可靠性评估模型。首先,采用加速寿命试验(accelerated life test,ALT)技术,建立广义Eyring-Weibull可靠性模型,假定试验各应力水平组合下Weibull分布的形状参数相同,且尺度参数与各应力水平组合间呈对数线性关系。其次,给出了Weibull分布定时截尾双应力恒加试验的极大似然估计(maximum likelihood estimation,MLE)方法、与似然函数相关的Fisher信息矩阵以及模型参数的渐近协方差矩阵,构造了模型参数和一些可靠性指标的渐近置信区间。最后,通过仿真算例证明了所提方法的可行性。展开更多
基金This research is by the National Natural Science Foundation of China(69971016, 10271079) the Science and Technology Development Foundation of Shanghai(00JC14507) the Major Branch of Learning Foundation of Shanghai.
文摘In this note,the tampered failure rate model is generalized from the step-stress accelerated life testing setting to the progressive stress accelerated life testing for the first time.For the parametric setting where the scale parameter satisfying the equation of the inverse power law is Weibull,maximum likelihood estimation is investigated.
基金supported by the National Natural Science Foundation of China(7117116470471057)
文摘This paper proposes a simple constant-stress accel- erated life test (ALT) model from Burr type XII distribution when the data are Type-I progressively hybrid censored. The maximum likelihood estimation (MLE) of the parameters is obtained through the numerical method for solving the likelihood equations. Approxi- mate confidence interval (CI), based on normal approximation to the asymptotic distribution of MLE and percentile bootstrap Cl is derived. Finally, a numerical example is introduced and then a Monte Carlo simulation study is carried out to illustrate the pro- posed method.
基金This research was supported by The Science,Research and Innovation Promotion Funding(TSRI)(Grant No.FRB650070/0168)This research block grants was managed under Rajamangala University of Technology Thanyaburi(FRB65E0634M.3).
文摘A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.
基金Shanghai Municipal Natural Science Foun-dation (NO.09ZR1413000)Undergraduate Education High-land Construction Project of ShanghaiKey Technology R&D Program of Shanghai Municipality (No.08160510600)
文摘To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method (LSM) to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month.
文摘In general,simple subsystems like series or parallel are integrated to produce a complex hybrid system.The reliability of a system is determined by the reliability of its constituent components.It is often extremely difficult or impossible to get specific information about the component that caused the system to fail.Unknown failure causes are instances in which the actual cause of systemfailure is unknown.On the other side,thanks to current advanced technology based on computers,automation,and simulation,products have become incredibly dependable and trustworthy,and as a result,obtaining failure data for testing such exceptionally reliable items have become a very costly and time-consuming procedure.Therefore,because of its capacity to produce rapid and adequate failure data in a short period of time,accelerated life testing(ALT)is the most utilized approach in the field of product reliability and life testing.Based on progressively hybrid censored(PrHC)data froma three-component parallel series hybrid system that failed to owe to unknown causes,this paper investigates a challenging problem of parameter estimation and reliability assessment under a step stress partially accelerated life-test(SSPALT).Failures of components are considered to follow a power linear hazard rate(PLHR),which can be used when the failure rate displays linear,decreasing,increasing or bathtub failure patterns.The Tempered random variable(TRV)model is considered to reflect the effect of the high stress level used to induce early failure data.The maximum likelihood estimation(MLE)approach is used to estimate the parameters of the PLHR distribution and the acceleration factor.A variance covariance matrix(VCM)is then obtained to construct the approximate confidence intervals(ACIs).In addition,studentized bootstrap confidence intervals(ST-B CIs)are also constructed and compared with ACIs in terms of their respective interval lengths(ILs).Moreover,a simulation study is conducted to demonstrate the performance of the estimation procedures and the methodology discussed in this paper.Finally,real failure data from the air conditioning systems of an airplane is used to illustrate further the performance of the suggested estimation technique.
文摘Mechatronic products usually endure the variable stress spectrum when they operate in certain operational condition and environmental condition, which obey the Weibull distribution. In accordance with the features of mechatronic product, this paper analyzes the failure mode, its corresponding sensitive stress and the design principles of life testing profiles. Based on the above analyses, this paper presents a synthetic stress life testing method based on the hybrid Weibull distribution and its statistical method under variable stress spectrum to evaluate the reliability and life indices of mechatronic products. Because the mechatronic products have many characteristics such as high price, long life and small testing samples, the synthetic stress life testing method under variable load spectrum can simulate the real various spectra, decrease the life testing time and reduce the testing samples. So it is effective to carry out the life testing to mechatronic products. The application results of hydraulic pumps indicate that this method can easily handle the experimental data under variable amplitude spectrum, obtain the high precision parameters point estimation and confidence interval estimation and reduce the testing cost greatly.
基金Undergraduate Education High land Construction Project of Shanghaithe Key Course Construction of Shanghai Education Committee (No.20075302)the Key Technology R&D Program of Shanghai Municipality (No.08160510600)
文摘In order to obtain the life information of the vacuum fluorescent display (VFD) in a short time, a model of constant stress accelerated life tests (CSALT) is established with its filament temperature increased, and four constant stress tests are conducted. The Weibull function is applied to describe the life distribution of the VFD, and the maximum likelihood estimation (MLE) and its iterative flow chart are used to calculate the shape parameters and the scale parameters. Furthermore, the accelerated life equation is determined by the least square method, the Kolmogorov-Smirnov test is performed to verify whether the VFD life meets the Weibull distribution or not, and selfdeveloped software is employed to predict the average life and the reliable life. Statistical data analysis results demonstrate that the test plans are feasible and versatile, that the VFD life follows the Weibull distribution, and that the VFD accelerated model satisfies the linear Arrhenius equation. The proposed method and the estimated life information of the VFD can provide some significant guideline to its manufacturers and customers.
文摘为了有效快速评估高可靠性长寿命产品在正常应力条件下的可靠性,提出了一种双应力恒加试验Weibull分布型产品置信可靠性评估模型。首先,采用加速寿命试验(accelerated life test,ALT)技术,建立广义Eyring-Weibull可靠性模型,假定试验各应力水平组合下Weibull分布的形状参数相同,且尺度参数与各应力水平组合间呈对数线性关系。其次,给出了Weibull分布定时截尾双应力恒加试验的极大似然估计(maximum likelihood estimation,MLE)方法、与似然函数相关的Fisher信息矩阵以及模型参数的渐近协方差矩阵,构造了模型参数和一些可靠性指标的渐近置信区间。最后,通过仿真算例证明了所提方法的可行性。