用同步辐射实现X射线干涉技术的实验研究

根据Ｘ射线干涉的特点，制出ＬＬＬ型Ｘ射线干涉器件。Ｘ射线源选用同步辐射光，充分利用其强度大、波长丰富和准直性好的优点，在北京同步辐射实验室（ＢＳＲＬ）利用４Ｗ１Ａ束线进行了Ｘ射线干涉实验，在拍摄的底片上比较清楚地观察到了Ｘ射线干涉条纹。

Interface roughness, surface roughness and soft X-ray reflectivity of Mo/Si multilayers with different layer number

A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface roughness of Mo/Si multilayers were determined by small angle X-ray diffraction （SAXRD）. Surface roughness change curve of Mo/Si multilayer with increasing layer number was studied by atomic force microscope （AFM）. Soft X-ray reflectivity of Mo/Si multilayers was measured in National Synchrotron Radiation Laboratory （NSRL）. Theoretical and experimental results show that the soft X-ray reflectivity of Mo/Si multilayer is mainly determined by periodic number and interface roughness, surface roughness has little effect on reflectivity.

Stony Brook’s High-Pressure Laboratory Collaborations with French Scientists

For more than a half century, my colleagues and I in the Stony Brook High Pressure Laboratory have profited from collaborations with French scientists in their laboratories in Orsay, Paris, Toulouse, Lille, Lyon, Strasbourg and Rennes. These interactions have included postdoctoral appointments of French colleagues in our laboratory as well as two année sabbatique by me;in 1983-84, in the Laboratoire de Géophysique et Géodynamique Interne at the Université Paris XI in Orsay and in 2020-2003 in the Laboratoire des Méchanismes et Transfert en Géologie at the Université Paul Sabatier in Toulouse. The objective of this report is to relate this history and to illustrate the scientific advances which resulted from these collaborations.

硬X射线相位衬度成像的实验研究

介绍了硬X射线(类同轴)相位衬度成像的工作原理及其实验研究结果。X射线波长为0 08860 nm,样品为未经任何处理的飞蛾,记录介质为X射线胶片。胶片经处理以后,用光学显微镜读出,可以看出样品的许多细节,尤其在折射率突变处。而同样条件下基于吸收衬度机制的硬 X射线吸收成像,由于是弱吸收样品,没有观察到任何图像。