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稀土Y对低膨胀高温合金显微组织和界面的影响(英文) 被引量:2
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作者 Wang, R.-M. Han, Y.-F. Eliezer, D. 《Chinese Journal of Aeronautics》 SCIE EI CAS CSCD 2001年第3期171-177,共7页
The forms and structures of the phases in Fe-Ni-Co-Nb-Ti-Si low expansion superal-loys have been studied using analytical electron microscopy, high resolution electron microscopy, chemical phase analysis, X-ray diffra... The forms and structures of the phases in Fe-Ni-Co-Nb-Ti-Si low expansion superal-loys have been studied using analytical electron microscopy, high resolution electron microscopy, chemical phase analysis, X-ray diffraction, etc. The effects of yttrium on the microstructures and properties in the superalloys have also been investigated. The results reveal that trace yttrium mainly located in the platelet precipitates makes the crystal structure changed. The platelet precipitates become smaller, denser and rather homogeneous with appropriate yttrium addition. Compared with the conventional low expansion superalloy, the misfit of the platelet phase with the matrix in the yttrium-containing low expansion superalloy decreases from 0.7% to 0.07%, which indicates very low stress at the interface. 展开更多
关键词 Crystal structure High resolution electron microscopy Interfaces (materials) MICROSTRUCTURE Thermal expansion x ray diffraction analysis YTTRIUM
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Design and fabrication of broad angular range depth-graded C/W multilayer mirror for hard X-ray optics 被引量:2
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作者 张众 王占山 +4 位作者 王风丽 吴文娟 王洪昌 秦树基 陈玲燕 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第7期422-424,共3页
In this paper, a depth-graded C/W multilayer mirror with broad grazing incident angular range, consisting of three multilayer stacks, each of which has different period thickness d and the layer pair number, was desig... In this paper, a depth-graded C/W multilayer mirror with broad grazing incident angular range, consisting of three multilayer stacks, each of which has different period thickness d and the layer pair number, was designed and fabricated by direct current (DC) magnetron sputtering. For calculating the definite performance of such a mirror, the saturation effects of the interfacial imperfection, such as interface roughness and diffusion, were emerged. The reflectivity of the mirror was measured by the X-ray diffraction (XRD) instrument at Cu Kα radiation (λ = 0.154 nm), the measured reflectivity was about 30% in a broad grazing incident angular range (0.55°-0.85°). By the fitting data, the thickness of each layer is almost same as the one designed and the roughness in the multilayer is about 0.85 nm, which is larger than the prospective value of 0.5 nm. 展开更多
关键词 Light reflection Magnetron sputtering MULTILAYERS x ray diffraction analysis x ray optics
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Microstructure and properties of an Al–Ti–Cu–Si brazing alloy for SiC–metal joining 被引量:1
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作者 Chun-duo Dai Rui-na Ma +2 位作者 Wei Wang Xiao-ming Cao Yan Yu 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2017年第5期557-565,共9页
An Al–Ti–Cu–Si solid–liquid dual-phase alloy that exhibits good wettability and appropriate interfacial reaction with SiC at 500–600°C was designed for SiC–metal joining. The microstructure, phases, differe... An Al–Ti–Cu–Si solid–liquid dual-phase alloy that exhibits good wettability and appropriate interfacial reaction with SiC at 500–600°C was designed for SiC–metal joining. The microstructure, phases, differential thermal curves, and high-temperature wetting behavior of the alloy were analyzed using scanning electron microscopy, X-ray diffraction analysis, differential scanning calorimetry, and the sessile drop method. The experimental results show that the 76.5Al–8.5Ti–5Cu–10Si alloy is mainly composed of Al–Al2Cu and Al–Si hypoeutectic low-melting-point microstructures (493–586°C) and the high-melting-point intermetallic compound AlTiSi (840°C). The contact angle, determined by high-temperature wetting experiments, is approximately 54°. Furthermore, the wetting interface is smooth and contains no obvious defects. Metallurgical bonding at the interface is attributable to the reaction between Al and Si in the alloy and ceramic, respectively. The formation of the brittle Al4C3phase at the interface is suppressed by the addition of 10wt% Si to the alloy. © 2017, University of Science and Technology Beijing and Springer-Verlag Berlin Heidelberg. 展开更多
关键词 ALLOYS Aluminum copper alloys Ceramic materials Differential scanning calorimetry INTERMETALLICS Joining Melting point Metals Microstructure Scanning electron microscopy Silicon Silicon alloys Silicon carbide Soldering alloys Titanium alloys WETTING x ray diffraction analysis
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Interface roughness, surface roughness and soft X-ray reflectivity of Mo/Si multilayers with different layer number 被引量:1
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作者 秦俊岭 邵建达 +1 位作者 易葵 范正修 《Chinese Optics Letters》 SCIE EI CAS CSCD 2007年第5期301-303,共3页
A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface ... A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface roughness of Mo/Si multilayers were determined by small angle X-ray diffraction (SAXRD). Surface roughness change curve of Mo/Si multilayer with increasing layer number was studied by atomic force microscope (AFM). Soft X-ray reflectivity of Mo/Si multilayers was measured in National Synchrotron Radiation Laboratory (NSRL). Theoretical and experimental results show that the soft X-ray reflectivity of Mo/Si multilayer is mainly determined by periodic number and interface roughness, surface roughness has little effect on reflectivity. 展开更多
关键词 Atomic force microscopy Magnetron sputtering REFLECTION Surface roughness Synchrotron radiation x ray diffraction analysis
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铝铜铁准晶抗高温氧化行为的研究(英文)
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作者 Zhou, C.-G. Xu, H.-B. +1 位作者 Gong, S.-K. Kang, G.-M. 《Chinese Journal of Aeronautics》 SCIE EI CAS CSCD 2001年第3期178-182,共5页
An Al62.5Cu25Fe12.5 quasi-crystalline alloy was prepared by are melting. X-ray diffraction and scanning electron microscopy were used to study the microstructure of the quasi-crystalline alloy. Isothermal weight gain ... An Al62.5Cu25Fe12.5 quasi-crystalline alloy was prepared by are melting. X-ray diffraction and scanning electron microscopy were used to study the microstructure of the quasi-crystalline alloy. Isothermal weight gain of the Al-Cu-Fe quasi-crystal at elevated temperature in dry air was measured by means of a thermal balance and the oxidation behavior was evaluated by oxidation kinetic curves, from which it was deduced that the quasi-crystal exhibits good oxidation resistance. The surface morphologies of the Al-Cu-Fe quasi-crystal after isothermal oxidation at 700°C and 800°C for different times were observed. The oxidation resistance of quasi-crystalline powder and normal crystalline powder in the Al-Cu-Fe system was also quantitatively compared in quantity. 展开更多
关键词 Aluminum alloys MELTING Microstructure Morphology OxIDATION Oxidation resistance Scanning electron microscopy x ray diffraction analysis
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Investigation of ultra-short-period W/C multilayers for soft X-ray optics
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作者 王风丽 王占山 +4 位作者 秦树基 吴文娟 张众 王洪昌 陈玲燕 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第7期425-427,共3页
Ultra-short-period W/C multilayers having periodic thickness range of 1.15-3.01 nm have been fabricated for soft X-ray optics using the high vacuum direct current (DC) magnetron sputtering system. These multilayers we... Ultra-short-period W/C multilayers having periodic thickness range of 1.15-3.01 nm have been fabricated for soft X-ray optics using the high vacuum direct current (DC) magnetron sputtering system. These multilayers were characterized by low-angle X-ray diffraction (LAXRD) and transmission electron microscope (TEM). The results show that the multilayer thin films with periodic thickness more than 1.5 nm have clear W-C interface and low roughness. But the structure of the periodic thickness below 1.5 nm is not clear. Finally, three ways to improve the performance of the multilayers are suggested. 展开更多
关键词 Magnetron sputtering Optical films Thin films Transmission electron microscopy x ray diffraction analysis x ray optics
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Write-once medium with BiO_x thin films for blue laser recording
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作者 蒋志 耿永友 顾冬红 《Chinese Optics Letters》 SCIE EI CAS CSCD 2008年第4期294-296,共3页
BiOx films are prepared by reactive direct current (DC) magnetron sputtering from a metallic bismuth target in Ar +O2 with different O2/Ar ratios. It is found that the optical property of BiOx films is sensitive to... BiOx films are prepared by reactive direct current (DC) magnetron sputtering from a metallic bismuth target in Ar +O2 with different O2/Ar ratios. It is found that the optical property of BiOx films is sensitive to O2/Ar ratios and the films deposited at O2/Ar ratio of 0.5 have the best reflectivity contrast under the same conditions. The structure and optical characteristics of the films are studied by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and spectrophotometer. As revealed by investigations, the phase transition is mainly responsible for the change of optical properties. The static test results indicate that the BiO~ films have good writing sensitivity for blue laser beams. A high reflectivity contrast of about 52% at a writing power of 11 mW and writing pulse width of 800 ns is obtained. In addition, the films demonstrate good stability after being read for 10000 times. 展开更多
关键词 Bismuth compounds Laser beams Laser recording Light reflection Magnetron sputtering Optical data storage Optical properties Phase transitions SPECTROPHOTOMETERS Thin films x ray diffraction analysis x ray photoelectron spectroscopy
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Heteroepitaxial growth of InP/GaAs(100) by metalorganic chemical vapor deposition
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作者 熊德平 任晓敏 +6 位作者 王琦 周静 舒伟 吕吉贺 蔡世伟 黄辉 黄永清 《Chinese Optics Letters》 SCIE EI CAS CSCD 2007年第7期422-425,共4页
Using two-step method InP epilayers were grown on GaAs(100) substrates by low-pressure metalorganic chemical vapor deposition (LP-MOCVD). X-ray diffraction (XRD) and room-temperature (RT) photolu- minescence ... Using two-step method InP epilayers were grown on GaAs(100) substrates by low-pressure metalorganic chemical vapor deposition (LP-MOCVD). X-ray diffraction (XRD) and room-temperature (RT) photolu- minescence (PL) were employed to characterize the quality of InP epilayer. The best scheme of growing InP/GaAs(100) heterostructures was obtained by optimizing the initial low-temperature (LT) InP growth conditions, investigating the effects of thermal cycle annealing (TCA) and strained layer superlattice (SLS) on InP epilayers. Compared with annealing, 10-periods Ga0.1In0.9P/InP SLS inserted into InP epilayers can improve the quality of epilayers dramatically, by this means, for 2.6-#m-thick heteroepitaxial InP, the full-widths at half-maximum (FWHMs) of XRD ω and ω-28 scans are 219 and 203 arcsec, respectively, the RT PL spectrum shows the band edge transition of InP, the FWHM is 42 meV. In addition, the successful growth of InP/In0.53Ga0.47As MQWs on GaAs(100) substrates indicates the quality of device demand of InP/GaAs heterostructures. 展开更多
关键词 ANNEALING Epitaxial growth Full width at half maximum HETEROJUNCTIONS Metallorganic chemical vapor deposition PHOTOLUMINESCENCE Semiconducting gallium arsenide SUPERLATTICES x ray diffraction analysis
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Optical properties and structures of silver thin films deposited by magnetron sputtering with different thicknesses 被引量:4
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作者 孙喜莲 洪瑞金 +2 位作者 侯海虹 范正修 邵建达 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第6期366-369,共4页
A series of thin Ag films with different thicknesses grown under identical conditions are analyzed by means of spectrophotometer. From these measurements the values of refractive index and extinction coefficient are c... A series of thin Ag films with different thicknesses grown under identical conditions are analyzed by means of spectrophotometer. From these measurements the values of refractive index and extinction coefficient are calculated. The films are deposited onto BK7 glass substrates by direct current (DC) magnetron sputtering. It is found that the optical properties of the Ag films can be affected by films thickness. Below critical thickness of 17 nm, which is the thickness at which Ag films form continuous films, the optical properties and constants vary significantly with thickness increasing and then tend to a stable value up to about 40 nm. At the same time, X-ray diffraction measurement is carried out to examine the microstructure evolution of Ag films as a function of films thickness. The relation between optical properties and microstructure is discussed. 展开更多
关键词 CALCULATIONS Film growth Magnetron sputtering Optical properties Refractive index Silver SPECTROPHOTOMETERS SUBSTRATES x ray diffraction analysis
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Enhancement of upconversion luminescence due to the formation of nanocrystals in Er^(3+)-doped tellurite glasses 被引量:2
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作者 周刚 戴世勋 +4 位作者 于春雷 张军杰 汪国年 温磊 姜中宏 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第1期36-38,共3页
Optically transparent Er^3+-doped tellurite-based nanocrystallized glasses with the composition of 70TeO2.15Li2O·15Nb2O5·0.5Er2O3 (mol) have been prepared bv a conventional melting quenching and the subse... Optically transparent Er^3+-doped tellurite-based nanocrystallized glasses with the composition of 70TeO2.15Li2O·15Nb2O5·0.5Er2O3 (mol) have been prepared bv a conventional melting quenching and the subsequent heat treatment processes. The sizes of grown nanocrystals in glass matrix appear to be 35-50 nm from the X-ray diffraction (XRD) measurement. The microhardness measurement shows that the Vickers hardness values of the nanoerystallized tellurite glasses are larger (33%-62%) than those in the base glass. The Raman spectra imply that the maximum phonon energy of the based glass decreases and shifts from 668 to 638 cm^-1 after heat-treatment. Visible upconversion luminescence and infrared luminescence of the base glass and heat-treated glasses under 980-nm laser diode (LD) excitation are investigated. The 524-, 546- and 656-nm upconversion intensities by 980-nm pumping increase significantly. 展开更多
关键词 Crystal growth ERBIUM Light transmission Luminescence of solids MICROHARDNESS Nanostructured materials QUENCHING TELLURIUM x ray diffraction analysis
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Preparation of nanodiamonds by laser irradiation of graphite 被引量:2
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作者 孙景 雷贻文 +3 位作者 翟琪 杨星 杨晶 杜希文 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第5期287-288,共2页
Graphite powders were irradiated by pulsed laser at room temperature and normal pressure and then boiled in perchloric acid. Samples were characterized by high-resolution transmission electron microscopy (HRTEM), elec... Graphite powders were irradiated by pulsed laser at room temperature and normal pressure and then boiled in perchloric acid. Samples were characterized by high-resolution transmission electron microscopy (HRTEM), electron diffraction pattern (EDP), X-ray diffraction (XRD) pattern, and Raman spectroscopy. The analyses on the HRTEM images, EDP, and XRD show that the diamond particles with a size of about 5 nm are obtained. The shifting and broadening of the diamond peak in Raman spectrum indicate that there are high defect density and residual internal stress in synthetic diamond. 展开更多
关键词 DEFECTS GRAPHITE High resolution electron microscopy Laser beam effects Nanostructured materials Pulsed laser applications Raman spectroscopy Transmission electron microscopy x ray diffraction analysis
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Effect of nanocrystals on up-conversion luminescence of Er^(3+),Yb^(3+) co-doped glass-ceramics 被引量:2
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作者 余华 赵丽娟 +4 位作者 孟婕 梁沁 禹宣伊 唐柏权 许京军 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第8期469-471,共3页
Different up-conversion luminescent spectra of Er^3+ ions were observed in the oxyfluoride glass-ceramics. The ratio of two fluorides in the original compositions was modified in order to form different nanocrystals.... Different up-conversion luminescent spectra of Er^3+ ions were observed in the oxyfluoride glass-ceramics. The ratio of two fluorides in the original compositions was modified in order to form different nanocrystals. The intensity of up-conversion luminescence increased sharply when the ratio of PbF2 and CdF2 was 40:10. The data of differential thermal analysis and X-ray diffraction were used to explain the optimization fluoride ratio. The intensity of up-conversion luminescence is not only decided by the crystallizability but also mainly related with the stoiehiometric proportion of fluoride nanocrystals in the glass-ceramics. 展开更多
关键词 Differential thermal analysis ERBIUM Luminescence of inorganic solids Nanostructured materials Optical materials Rare earth additions x ray diffraction analysis YTTERBIUM
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Synthesis and optical properties of PbMoO_4 nanoplates 被引量:1
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作者 贾润萍 张英强 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第12期1152-1155,共4页
Nanometer sized lead molybdate (PbMoO4) plates are prepared through conventional hydrothermal together with sonochemical methods. The plates are then characterized using field-emission scanning electron microscopy, ... Nanometer sized lead molybdate (PbMoO4) plates are prepared through conventional hydrothermal together with sonochemical methods. The plates are then characterized using field-emission scanning electron microscopy, X-ray diffractometry, Fourier transform infrared (FTIR) spectrometry, photoluminescence spectrometry, and ultraviolet-visible (UV-VIS) spectrometry. The results indicate that the nanoplates have a characteristically narrow particle size distribution and their tetragonal scheelite-type structure is confirmed by both X-ray diffractometry and FTIR spectrometry. When the nanoplates are compared with the corresponding bulk crystals, blue shifts in their photoluminescence peaks, wider optical band gaps, and the broadening of the X-ray diffractometer peaks are observed. These can be ascribed to the decrease in crystal size. 展开更多
关键词 diffraction Fourier transforms NANOSTRUCTURES Particle size analysis Photoluminescence Plates (structural components) Scanning electron microscopy SPECTROMETRY Tungstate minerals x ray diffraction analysis x rays
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Study on the laser treatment of electroless Ni-P-SiC composite coatings 被引量:1
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作者 邵红红 蒋小燕 +1 位作者 王兰 花银群 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第10期589-591,共3页
Effect of the laser treatment on electroless Ni-P-SiC composite coatings was investigated. The microscopic structure, surface morphology, ingredient, and performance of the Ni-P-SiC composite coatings were synthetical... Effect of the laser treatment on electroless Ni-P-SiC composite coatings was investigated. The microscopic structure, surface morphology, ingredient, and performance of the Ni-P-SiC composite coatings were synthetically analyzed by the use of X-ray diffraction apparatus, scanning electron microscope, energy distribution spectrometer, micro-hardness tester, wear tester and so on. It was found that the composite coatings did make crystalloblastic transformation after laser heating. Structural analysis confirmed that some new types of phase Ni2Si or Ni3Si compound would emerge in the Ni-P-SiC coatings after laser treatment. The micro-hardness measurement results showed that when the laser power was 450 W with scanning speed of 0.5 m/min, the hardness of the coating was superior to the coating obtained by the conventional furnace heating, and wear resistance of the composite coating after laser treating could also improve. 展开更多
关键词 Composite materials Energy dispersive spectroscopy HEATING Laser applications MICROHARDNESS MORPHOLOGY Scanning electron microscopy Structural analysis Wear resistance x ray diffraction analysis
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Nonlinear optical properties of a self-organized dye thin film 被引量:1
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作者 康海峰 元以中 +1 位作者 孙真荣 王祖赓 《Chinese Optics Letters》 SCIE EI CAS CSCD 2007年第7期428-431,共4页
A self-organized thin film of a cyanine dye is fabricated by the spin-coating technique and is characterized by ultraviolet-visible spectroscopy, infrared (IR) spectroscopy, small-angle X-ray diffraction, eUipsomete... A self-organized thin film of a cyanine dye is fabricated by the spin-coating technique and is characterized by ultraviolet-visible spectroscopy, infrared (IR) spectroscopy, small-angle X-ray diffraction, eUipsometer, and atomic force microscopy (AFM). The nonlinear optical properties of the thin films are investigated by degenerate four wave mixing (DFWM) technique. The cyanine dye thin film sample exhibits high optical nonlinearities (χ^(3) = 2.55 × 10^-12 esu), and the mechanism is analyzed by the exciton coupling theory. 展开更多
关键词 Atomic force microscopy Four wave mixing Infrared spectroscopy Nonlinear optics Optical properties Spin coating Thin films Ultraviolet visible spectroscopy x ray diffraction analysis
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Novel Tm^(3+)-doped transparent fluorozirconate glass-ceramic containing nanocrystalline 被引量:1
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作者 赖杨琼 张军杰 +1 位作者 于春雷 胡丽丽 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第10期592-594,共3页
A new transparent Tm^3+-doped ZrFa-based nanocrystallized glass with the composition of 55ZrFa-20BaF2- 18.8YF3-5A1F5-1.2TmF3 (tool%) (ZBYA) has been prepared by a conventional melting quenching technique and the ... A new transparent Tm^3+-doped ZrFa-based nanocrystallized glass with the composition of 55ZrFa-20BaF2- 18.8YF3-5A1F5-1.2TmF3 (tool%) (ZBYA) has been prepared by a conventional melting quenching technique and the subsequent heat treatment processes. The glass characteristic temperatures, the apparent activation energy, and the Avrami parameter for crystallization are estimated on the basis of different scanning calorimetry (DSC). The sizes of grown nanocrystals in the glass matrix appear to be 30-36.5 nm and it is studied as a function of the nucleation temperature, also the peak intensity of the nanocrystalline is studied as a function of the nucleation temperature from the X-ray diffraction (XRD) measurement. The microhardness measurement shows that the Vickers microhardness (Hy) values of the heat-treated glass samples are larger than that of the based glass about 17.26%-42.04%. 展开更多
关键词 Activation energy Composition CRYSTALLIZATION Differential scanning calorimetry Heat treatment MICROHARDNESS Nanostructured materials x ray diffraction analysis
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Laser induced self-propagating high-temperature synthesis of TiNi alloy 被引量:1
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作者 杨永强 张翠红 +1 位作者 杨云飞 陈林 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第1期35-37,共3页
TiNi alloy, especially porous TiNi, a good biocompatible material, can be made by laser induced self-propagating high-temperature synthesis (SHS). A 40-W CO2 laser was used to ignite the powders of Ti and Ni, and TiNi... TiNi alloy, especially porous TiNi, a good biocompatible material, can be made by laser induced self-propagating high-temperature synthesis (SHS). A 40-W CO2 laser was used to ignite the powders of Ti and Ni, and TiNi intermetallic compound was synthesized by SHS in a reaction kettle of stainless steel. High-speed photography, X-ray diffraction, and scanning electron microscopy were used to investigate and analyze the reaction process, phase composing, and microstructure of the product, respectively. The influence factors on the reaction process and the product were discussed. The results indicate that laser induced SHS is an efficient, energy-saving method; The phase ingredient of the product consists of TiNi, Ti2Ni, and Ni3Ti. With the increase of the preparing pressure of the sample, the reacting rate decreases; With the increase of the laser power and the preheating temperature, the reacting rate increases. Under the condition of 30℃/min, the synthesis reaction had been carried out consistently and completely. 展开更多
关键词 BIOCOMPATIBILITY BIOMATERIALS Carbon dioxide lasers High speed photography Laser applications Nickel alloys Scanning electron microscopy Titanium alloys x ray diffraction analysis
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Performance of optical amplifier employing silica host magnesium-aluminum-germanium co-doped erbium-doped fiber 被引量:1
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作者 傅永军 郑凯 +1 位作者 简伟 简水生 《Chinese Optics Letters》 SCIE EI CAS CSCD 2005年第4期187-189,共3页
Two silica host magnesium(Mg)-aluminum(Al)-germanium(Ge) co-doped erbium-doped fibers (EDFs) have been fabricated, which have different Mg concentrations. The concentration of all the compositions in the preform is me... Two silica host magnesium(Mg)-aluminum(Al)-germanium(Ge) co-doped erbium-doped fibers (EDFs) have been fabricated, which have different Mg concentrations. The concentration of all the compositions in the preform is measured through electronics probe micro analysis (EPMA). The maximum Mg concentrations of fibers A and B are 3.98 and 1.28 mol%, respectively. The performance characteristics including absorption spectrum and gain are measured and analyzed. The absorption coefficients of fibers A and B are 13.3 and 14.3 dB/m respectively at wavelength of 1532 nm. The max gains of these two erbium-doped fiber amplifiers (EDFAs) are 30.1 and 35.9 dB with input signal power of -30 dBm and pump power of 100 mW at 980 nm. Fiber B with maximum Mg concentration 1.28 mol% has better performance than fiber A. Fiber B has high absorption coefficient and high gain characteristics. The optimum fiber B length of C-band EDFA is 7 m and that of L-Band EDFA is about 30 m, which is much shorter than standard commercial EDFAs. The result of experiments showed that a few Mg added to silica host EDF can increase the concentration of erbium ions, which will shorten the EDF length much, but not degrade the performance characteristics. 展开更多
关键词 Coatings Composition Fourier transform infrared spectroscopy MORPHOLOGY Oxidation resistance Silicon carbide Synthesis (chemical) x ray diffraction analysis
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Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films
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作者 顾四朋 侯立松 +1 位作者 赵启涛 黄瑞安 《Chinese Optics Letters》 SCIE EI CAS CSCD 2003年第12期716-718,共3页
To improve the optical storage performance, Sn was doped into Ge2Sb2Te5 phase change thin films. The optical and thermal properties of Sn-doped Ge2Sb2Te5 film were investigated. The crystal structures of the as-sputte... To improve the optical storage performance, Sn was doped into Ge2Sb2Te5 phase change thin films. The optical and thermal properties of Sn-doped Ge2Sb2Te5 film were investigated. The crystal structures of the as-sputtered and the annealed films were identified by the X-ray diffraction (XRD) method. The differential scanning calorimeter (DSC) method is used to get the crystallization temperature and crystallization energy (Ea). It was found that proper Sn-doping could highly improve storage performance of the Ge2Sb2Te5 media. 展开更多
关键词 Differential scanning calorimetry Optical films x ray diffraction analysis
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