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微焦点X射线分层成像无损检测方法 被引量:1
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作者 李政 王璟 +3 位作者 程建平 王学武 倪建平 康克军 《无损检测》 2002年第5期185-187,共3页
对薄层结构的复合材料及多层电路板进行密度分布情况及分层成像研究。提出一种新的成像方法 ,即在现有微焦点X辐射成像系统的基础上 ,采用一种特殊的摆动式扫描方式 ,非线性的层面合成可以仅仅从很少的投影中重建物体 ,该法具有扫描速... 对薄层结构的复合材料及多层电路板进行密度分布情况及分层成像研究。提出一种新的成像方法 ,即在现有微焦点X辐射成像系统的基础上 ,采用一种特殊的摆动式扫描方式 ,非线性的层面合成可以仅仅从很少的投影中重建物体 ,该法具有扫描速度快、算法简单、实时性好等特点 ,适于多层大面积复合材料以及多层电路板的快速成像检测。 展开更多
关键词 微焦点x射线分层成像 无损检测 复合材料 印制电路板
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自动实时X射线检测技术在半导体制程控制中的应用 被引量:1
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作者 Eckhard Sperschneider 《电子工业专用设备》 2003年第5期27-31,共5页
对X光检测的不同技术在半导体制程上的应用作了详细的介绍;着重讨论了全旋倾斜(off-axis)X射线技术的特点和优势。
关键词 全旋倾斜x射线技术 x射线透视检测技术 三维体层x射线摄像技术 机算机处理层 x射线成像 通用分层x射线成像 数字层析合成成像技术
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Study on Limited Projections in Micro—focus X—ray Swing Laminography
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作者 MingMING ZhengLI 《International Conference on Computing in High Energy and Nuclear Physics》 2001年第1期245-247,共3页
This paper resents a new X-ray imaging method swing Laminography(SL) that is suitalble to perform non-destructive testing on the slender-shaped multi-layer samples.Computer simulations are made to compare the limited ... This paper resents a new X-ray imaging method swing Laminography(SL) that is suitalble to perform non-destructive testing on the slender-shaped multi-layer samples.Computer simulations are made to compare the limited projections in SL and the principle of choosing Optimal Projection Angular Region(OPAR) is discussed.The experiment on a two-layer Printed Circuits Board shows that SL with 120° swing angles distributed in OPAR can get the separated images of each layer. 展开更多
关键词 计算机图像处理 x射线图像处理 摇摆x射线分层
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Investigation of nanometer-scale films using low angle Xray reflectivity analysis in IPOE 被引量:1
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作者 WANG Zhan-shan XU Yao WANG Hong-chang ZHU Jing-tao ZHANG Zhong WANG Feng-li CHEN Ling-yan 《Optoelectronics Letters》 EI 2007年第2期88-90,共3页
The X-ray low angle reflectivity measurement is used to investigate single and bilayer films to determine the parameters of nanometer-scale structures,three effectual methods are presented by using X-ray reflectivity ... The X-ray low angle reflectivity measurement is used to investigate single and bilayer films to determine the parameters of nanometer-scale structures,three effectual methods are presented by using X-ray reflectivity analysis to provide an accurate estimation of the nanometer film structures. The parameters of tungsten (W) single layer, such as the material density, interface roughness and deposition rate, were obtained easily and speedily. The base metal layer was introduced to measure the profiles of single low Z material film. A 0.3 nm chromium (Cr) film was also studied by low angle reflectivity analysis. 展开更多
关键词 IPOE 纳米级薄膜 x线反射率分析 多层结构 参数
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EFFECT OF AMPHIPHILIC POLY (STYRENE-B-ETHYLENE OXIDE) DIBLOCK COPOLYMER INTERCALATED LAYERED SILICATE AS FILLER ON ACRYLONITRILE-BUTADIENE-STYRENE RESIN 被引量:1
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作者 Guo Tianying Zhang Jie +2 位作者 Hao Guangjie Song Moudao Zhang Banghua 《Chinese Journal of Reactive Polymers》 2003年第1期87-91,共5页
The diblock copolymers intercalated layered silicate was prepared via a melt dispersion technique. Then the effect of intercalated hybrid as filler on acrylonitrile- butadiene-styrene resin was characterized by X-ray ... The diblock copolymers intercalated layered silicate was prepared via a melt dispersion technique. Then the effect of intercalated hybrid as filler on acrylonitrile- butadiene-styrene resin was characterized by X-ray diffraction, transmission electron microscopy, stress-strain measurements in elongation. 展开更多
关键词 MONTMORILLONITE diblock copolymer INTERCALATED nanocomposites
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完善组装工艺与实施统计过程控制(SPC)
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作者 杨建生 陈建军 《电子质量》 2003年第11期35-36,共2页
本文主要说明了X射线分层摄影法的在线检测,统计过程控制(SPC)在BGA装配中的应用,并通过BGA定位、制程能力、焊料桥接、焊料开路、焊料短路和把SPC应用于BGA,进一步简述了装配工艺与履行统计过程控制的关系。
关键词 组装工艺 SPC x射线分层摄影法 统计过程控制 BGA 球栅阵列封装 电子工业 焊接 桥接
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浅谈完善组装工艺与实施统计过程控制(SPC)的关系
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作者 杨建生 陈建军 《中国集成电路》 2003年第55期44-47,共4页
引言电子组装厂家成功的关键在于确保产品质量,降低产品缺陷。统计过程控制(SPC)是一种利用监控制造过程来保证产品质量的方法。采用 SPC 能对组装中的不合理问题及时进行修改,对生产过程中发现的问题及时解决,减少返修,降低生产成本。
关键词 组装工艺 统计过程控制 SPC 电子组装 球栅阵列封装 x射线分层摄影法
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扎哈·哈迪德的设计背景研究 被引量:1
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作者 纪岩 《城市住宅》 2020年第7期106-108,共3页
重点阐释现代主义建筑大师扎哈·哈迪德的作品对现今及未来设计的重要启示,探究其设计思想及技术手段的源头,研究其设计背景,分析其设计语言与严谨的设计逻辑。
关键词 现代主义 建筑设计 技术手段 x射线分层
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Reservoir characteristics of Donghe well No.1 in Tarim Basin 被引量:1
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作者 Liao Taiping Hu Jingjing +1 位作者 Lai Fuqiang Duan Yonggang 《International Journal of Mining Science and Technology》 SCIE EI 2014年第5期719-724,共6页
Based on the techniques of X-ray diffraction analysis, identification of the thin sections of core cast, phys- ical analysis and scanning electron microscopy analysis, this paper studied the reservoir characteristics ... Based on the techniques of X-ray diffraction analysis, identification of the thin sections of core cast, phys- ical analysis and scanning electron microscopy analysis, this paper studied the reservoir characteristics of the Carboniferous strata in Donghe well No.1 of Tarim region. The results show that the reservoir lithology is mainly the fine-grained quartz sandstone with ferrocalcite and pyrite, mud cement-based, the permeability concentrated in 5-40 × 10-3 μm2, a small part of the high permeability up to 150-327 ×10-3 μm2 and porosity ranged from 10% to 20%. The most part of the reservoirs is low perme- ability with a small part of the layer in moderate-high permeability. The types of reservoir space include intergranular pores, intra particle-molding pores, micro-pores and cracks, which mainly are intergranular pores with the pore diameter of 15-200 μm, 95.5μm on average. And the types of the throats are comolex with the main tvne of constricted l:hroats in this area and large contribution to the permeability. 展开更多
关键词 Tarim Basin Carboniferous system Sandstone reservoir Physical characteristics Features of pore throats
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Formation of Extended Covalently Bonded Ni Porphyrin Networks on the Au(lll) Surface
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作者 Sergey A. Krasnikov Catherine M. Doyle +6 位作者 Natalia N. Sergeeva Alexei B. Preobrajenski Nikolay A.Vinogradov Yulia N. Sergeeva Alexei A. Zakharov Mathias O. Senge Attilio A. Cafolla 《Nano Research》 SCIE EI CAS CSCD 2011年第4期376-384,共9页
The growth and ordering of {5,10,15,20-tetrakis(4-bromophenyl)porphyrinato}nickel(II) (NiTBrPP) molecules on the Au(111) surface have been investigated using scanning tunnelling microscopy, X-ray absorption, c... The growth and ordering of {5,10,15,20-tetrakis(4-bromophenyl)porphyrinato}nickel(II) (NiTBrPP) molecules on the Au(111) surface have been investigated using scanning tunnelling microscopy, X-ray absorption, core-level photoemission, and microbeam low-energy electron diffraction. When deposited onto the substrate at room temperature, the NiTBrPP forms a well-ordered close-packed molecular layer in which the molecules have a flat orientation with the porphyrin macrocycle plane lying parallel to the substrate. Annealing of the NiTBrPP layer on the Au(111) surface at 525 K leads to dissociation of bromine from the porphyrin followed by the formation of covalent bonds between the phenyl substituents of the porphyrin. This results in the formation of continuous covalently bonded porphyrin networks, which are stable up to 800 K and can be recovered after exposure to ambient conditions. By controlling the experimental conditions, a robust, extended porphyrin network can be prepared on the Au(111) surface that has many potential applications such as protective coatings, in sensing or as a host structure for molecules and clusters. 展开更多
关键词 PORPHYRINS covalently bonded networks scanning tunnelling microscopy x-ray photoemission spectroscopy near-edge x-ray absorption fine structure Au(111)
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