The ESA and CAS SMILE mission orbit is highly elliptical and will pass through multiple radiation environments.The Soft X-ray Imager(SXI)instrument aboard has a radiation shutter door designed to close when the surrou...The ESA and CAS SMILE mission orbit is highly elliptical and will pass through multiple radiation environments.The Soft X-ray Imager(SXI)instrument aboard has a radiation shutter door designed to close when the surrounding radiation flux is high.The shutter door will close when passing below an altitude threshold to protect against trapped particles in the Earth’s Van Allen Belts.Therefore,two radiation environments can be approximated based on the shutter door position:open and closed.The instrument background for the CCDs(Charge-Coupled Devices)that form the focal plane array of the SXI were evaluated for the two environments.Due to the correlation of the space environment with the solar cycle,the solar minima and maxima,the background was also evaluated at these two extremes.The results demonstrated that the highest instrument background will occur during solar minima due to the main contributing source being Galactic Cosmic Rays(GCRs).It was also found that the open background was highest for solar minima and that the closed background was highest during solar maxima.This is due to the radiation shutter door acting as a scattering centre and the changes in the energy flux distribution of the GCRs between the two solar extremes.展开更多
The X-ray sources of the universe are extraterrestrial in nature which emit X-ray photons.The closest strong X-ray source is the Sun,which is followed by various compact sources such as neutron stars,black holes,the C...The X-ray sources of the universe are extraterrestrial in nature which emit X-ray photons.The closest strong X-ray source is the Sun,which is followed by various compact sources such as neutron stars,black holes,the Crab pulsar,etc.In this paper,we analyze the data received from several low-cost lightweight meteorological balloon-borne missions launched by the Indian Centre for Space Physics.Our main interest is to study the variation of the vertical intensity of secondary cosmic rays,the detection of strong X-ray sources,and their spectra in the energy band of^(1)0–80 keV during the complete flights.Due to the lack of an onboard pointing system,low exposure time,achieving a maximum altitude of only~42 km,and freely rotating the payload about its axis,we modeled the background radiation flux for the X-ray detector using physical assumptions.We also present the source detection method,observation of the pulsation of the Crab(^(3)3 Hz),and spectra of some sources such as the quiet Sun and the Crab pulsar.展开更多
The effect of silicon doping on the residual stress of CVD diamond films is examined using both X-ray diffraction (XRD) analysis and Raman spectroscopy measurements. The examined Si-doped diamond films are deposited o...The effect of silicon doping on the residual stress of CVD diamond films is examined using both X-ray diffraction (XRD) analysis and Raman spectroscopy measurements. The examined Si-doped diamond films are deposited on WC-Co substrates in a home-made bias-enhanced HFCVD apparatus. Ethyl silicate (Si(OC2H5)4) is dissolved in acetone to obtain various Si/C mole ratio ranging from 0.1% to 1.4% in the reaction gas. Characterizations with SEM and XRD indicate increasing silicon concentration may result in grain size decreasing and diamond [110] texture becoming dominant. The residual stress values of as-deposited Si-doped diamond films are evaluated by both sin2ψ method, which measures the (220) diamond Bragg diffraction peaks using XRD, with ψ-values ranging from 0° to 45°, and Raman spectroscopy, which detects the diamond Raman peak shift from the natural diamond line at 1332 cm-1. The residual stress evolution on the silicon doping level estimated from the above two methods presents rather good agreements, exhibiting that all deposited Si-doped diamond films present compressive stress and the sample with Si/C mole ratio of 0.1% possesses the largest residual stress of ~1.75 GPa (Raman) or ~2.3 GPa (XRD). As the silicon doping level is up further, the residual stress reduces to a relative stable value around 1.3 GPa.展开更多
Engineering geological disasters such as rockburst have always been a critical factor affecting the safety of coal mine production.Thus,residual stress is considered a feasible method to explain these geomechanical ph...Engineering geological disasters such as rockburst have always been a critical factor affecting the safety of coal mine production.Thus,residual stress is considered a feasible method to explain these geomechanical phenomena.In this study,electron backscatter diffraction(EBSD)and optical microscopy were used to characterize the rock microcosm.A measuring area that met the requirements of X-ray diffraction(XRD)residual stress measurement was determined to account for the mechanism of rock residual stress.Then,the residual stress of a siliceous slate-containing quartz vein was measured and calculated using the sin^(2) ϕ method equipped with an X-ray diffractometer.Analysis of microscopic test results showed homogeneous areas with small particles within the millimeter range,meeting the requirements of XRD stress measurement statistics.Quartz was determined as the calibration mineral for slate samples containing quartz veins.The diffraction patterns of the(324)crystal plane were obtained under different ϕ and φ.The deviation direction of the diffraction peaks was consistent,indicating that the sample tested had residual stress.In addition,the principal residual stress within the quartz vein measured by XRD was compressive,ranging from 10 to 33 MPa.The maximum principal stress was parallel to the vein trend,whereas the minimum principal stress was perpendicular to the vein trend.Furthermore,the content of the low-angle boundary and twin boundary in the quartz veins was relatively high,which enhances the resistance of the rock mass to deformation and promotes the easy formation of strain concentrations,thereby resulting in residual stress.The proposed method for measuring residual stress can serve as a reference for subsequent observation and related research on residual stress in different types of rocks.展开更多
X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the as- sumptions that the material is composed of fine crystals with random orientation and the stress state is...X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the as- sumptions that the material is composed of fine crystals with random orientation and the stress state is biaxial and homogeneous through the x-ray penetrating region. The stress is calculated from the gradient of ε ~ sin^2 φ linear relation. But the method cannot be used in textured films due to nonlinear relation. In this paper, a novel method is proposed for measuring the multiaxial stresses in cubic films with any [hkl] fibre texture. As an example, a detailed analysis is given for measuring three-dimensional stresses in FCC films with [111] fibre texture.展开更多
A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorptio...A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorption of pure diffraction intensity.Experimental results revealed this to be a reliable correction method.展开更多
The X-ray diffractive technology was adopted for tentative study of plastic bonded explosive.The datum of some new diffractive peaks in standard PDF cards were added.The effects of strain to interplanar distance and c...The X-ray diffractive technology was adopted for tentative study of plastic bonded explosive.The datum of some new diffractive peaks in standard PDF cards were added.The effects of strain to interplanar distance and crystal size of the explosive were studied.The results show that grain size of plastic bonded explosive is decreasing with the increasing of the pressure,and the residual stress of the explosive is draw stress.展开更多
When measuring residual stress of coarse-grain aluminum alloy using X-ray diffraction method, the diffraction profile shows two peaks and position of measured 20 will be changed, which lead to an inaccurate measuremen...When measuring residual stress of coarse-grain aluminum alloy using X-ray diffraction method, the diffraction profile shows two peaks and position of measured 20 will be changed, which lead to an inaccurate measurement result. Hence, in this paper, some methods were employed to improve the measurement accuracy. During the measuring process, different parameters (diameter of irradiated area, Ψ-oscillation range and exposure time) were selected and profile peak shift method was utilized. Moreover, when the 20 of profiles was determined, different calculation methods were used to calculate the residual stress. The results show that diameter of irradiated area and Ψ-oscillation range have significant influence on the measuring result. For stress value calculated directly from the test equipment, cross correlation method is more accurate than the absolute peak. Furthermore, another two calculation methods of slope with 2θ- sin^2Ψ and ε- sin^2Ψwere used to calculate the stress based on parameters (2θ, ε) obtained from cross correlation method. It is concluded that 2θ - sin^2Ψ method can further improve the measurement accuracy.展开更多
Pure W and W-Cu-W trilayer coatings were deposited on an Fe substrate by d.c. magnetron sputtering. The α-β phase evolution, intragranular stress evolution in sputter-deposited W layer were investigated by x-ray dif...Pure W and W-Cu-W trilayer coatings were deposited on an Fe substrate by d.c. magnetron sputtering. The α-β phase evolution, intragranular stress evolution in sputter-deposited W layer were investigated by x-ray diffraction. They are directly related to the film microstructure, density and adhesion. Therefore, control of the film stress and phase component transition is essential for its applications. The phase component transition from β-W to α-W and intragranular stress evolution from tensile to compressive strongly depend on the deposition parameters and can be induced by lowering Ar pressure and rising target power. The compressively stressed films with α-W phase have a dense microstructure and high adhesion to Fe substrate.展开更多
In-depth studies of solar flares emissions and energy releases include analyses of polarization data. Polarization gives clear information about mechanisms and processes leading to electron acceleration and photon pro...In-depth studies of solar flares emissions and energy releases include analyses of polarization data. Polarization gives clear information about mechanisms and processes leading to electron acceleration and photon production. Despite of many past attempts, the key energy range of hard X-rays was only rarely explored and results were inconclusive. To large extend it was due to greater instrumental complications. Currently several novel polarimeters are either to be employed or under constructions for both balloon and satellite based observations. The novel hard X-ray polarimeter POLAR is an instrument developed by a collaboration between Switzerland, China and Poland. It is primarily designed for high accuracy polarization measurements from the prompt photon emissions of the gamma-ray bursts. The satellite orientation and instrument pointing direction make it also capable for precise measurements of polarization in solar flares. The instrument should fly in near future onboard of the Chinese Space Station TG2.展开更多
Different physical, mechanical and chemical processes, such as: ion implantation, oxidation, nitridation and others create on the surface of materials residual stress state, characterized by high level and strong gra...Different physical, mechanical and chemical processes, such as: ion implantation, oxidation, nitridation and others create on the surface of materials residual stress state, characterized by high level and strong gradient. X-ray diffraction method widely used for stress measurements has some difficulties in interpretation of experimental data, when the depth of X-ray penetration is compared with thickness of surface layer where inhomogeneous stress distribution is localized. Early it has been shown by authors that diffraction line broadening occurs when analyzed surface is characterized by strong gradient. The interest to study the diffraction line broadening is connected to the possibility of obtaining information about parameters of surface stress distribution. In the present paper the convolution and deconvolution concepts of Fourier analysis were applied to study X ray diffraction line broadening caused by surface stress gradients. Developed methodology allows determining of stress distribution in superficial layers of materials.展开更多
Some meaningful advances have been made these last years to value precise and reliable way the residual stresses experimentally created by the autofrettage. The autofrettage process is used widely to introduce residua...Some meaningful advances have been made these last years to value precise and reliable way the residual stresses experimentally created by the autofrettage. The autofrettage process is used widely to introduce residual stresses into thick walled tubes;traditionally residual stresses have been measured using the Sachs method destructive or non-destructive methods. In this paper we describe the application of the X-rays diffraction;this technique permits to justify the presence of the compressive tangential residual stresses, and to value their distribution after two different autofrettage internal pressures loading. The results show that there is a large difference in the residual stresses find in the different autofrettege pressure. One can see the influence of the autofrettage’s pressure quantity on residual stresses created in the thickness of the test tubes.展开更多
This article about possibility of automations of choice of instrumental equipment. In it described problems of choice of equipment, which are decided by means of mathematical model, developed on the base of finite ele...This article about possibility of automations of choice of instrumental equipment. In it described problems of choice of equipment, which are decided by means of mathematical model, developed on the base of finite element method.展开更多
The mechanical behaviors of deep rocks have always posed a challenge for the implementation and safe operation of major underground engineering projects.To this end,this study modified the existing mainstream rock mec...The mechanical behaviors of deep rocks have always posed a challenge for the implementation and safe operation of major underground engineering projects.To this end,this study modified the existing mainstream rock mechanics instruments equipped with a dynamic disturbance loading system and developed a second‐generation TFD‐2000/D triaxial instrument.The first‐generation device is equipped with an independent disturbance system and an advanced EDC‐580 all‐digital servo controller,which can apply disturbing load independently,implement the function of cyclic disturbance,and combine dynamic and static disturbances.The instrument was found to be reliable for use in analyzing the damage process of rocks in the disturbance test of marbles.The second‐generation instrument tackles three limitations of the first‐generation instrument:(i)it upgrades the strain measurement system and uses extensometers with linear variable differential transformers to accurately measure deformation;(ii)it uses the self‐balanced chamber to replace the Hoek–Franklin triaxial cell and auto‐balancing triaxial pressure chamber;and(iii)the loading rod is independently equipped with an EDC‐580 all‐digital servo controller,which measures precise loads.The experimental findings confirmed that the second‐generation instrument can be used for rock mechanics testing under cyclic disturbance loading,the disturbance–stress relaxation cycle,and the creep–fatigue cycle.In this sense,the second‐generation instrument can be a useful addition to deep rock mechanical instruments and provide a valuable reference.展开更多
文摘The ESA and CAS SMILE mission orbit is highly elliptical and will pass through multiple radiation environments.The Soft X-ray Imager(SXI)instrument aboard has a radiation shutter door designed to close when the surrounding radiation flux is high.The shutter door will close when passing below an altitude threshold to protect against trapped particles in the Earth’s Van Allen Belts.Therefore,two radiation environments can be approximated based on the shutter door position:open and closed.The instrument background for the CCDs(Charge-Coupled Devices)that form the focal plane array of the SXI were evaluated for the two environments.Due to the correlation of the space environment with the solar cycle,the solar minima and maxima,the background was also evaluated at these two extremes.The results demonstrated that the highest instrument background will occur during solar minima due to the main contributing source being Galactic Cosmic Rays(GCRs).It was also found that the open background was highest for solar minima and that the closed background was highest during solar maxima.This is due to the radiation shutter door acting as a scattering centre and the changes in the energy flux distribution of the GCRs between the two solar extremes.
文摘The X-ray sources of the universe are extraterrestrial in nature which emit X-ray photons.The closest strong X-ray source is the Sun,which is followed by various compact sources such as neutron stars,black holes,the Crab pulsar,etc.In this paper,we analyze the data received from several low-cost lightweight meteorological balloon-borne missions launched by the Indian Centre for Space Physics.Our main interest is to study the variation of the vertical intensity of secondary cosmic rays,the detection of strong X-ray sources,and their spectra in the energy band of^(1)0–80 keV during the complete flights.Due to the lack of an onboard pointing system,low exposure time,achieving a maximum altitude of only~42 km,and freely rotating the payload about its axis,we modeled the background radiation flux for the X-ray detector using physical assumptions.We also present the source detection method,observation of the pulsation of the Crab(^(3)3 Hz),and spectra of some sources such as the quiet Sun and the Crab pulsar.
基金Project (51005154) supported by the National Natural Science Foundation of ChinaProject (12CG11) supported by the Chenguang Program of Shanghai Municipal Education Commission, ChinaProject (201104271) supported by the China Postdoctoral Science Foundation
文摘The effect of silicon doping on the residual stress of CVD diamond films is examined using both X-ray diffraction (XRD) analysis and Raman spectroscopy measurements. The examined Si-doped diamond films are deposited on WC-Co substrates in a home-made bias-enhanced HFCVD apparatus. Ethyl silicate (Si(OC2H5)4) is dissolved in acetone to obtain various Si/C mole ratio ranging from 0.1% to 1.4% in the reaction gas. Characterizations with SEM and XRD indicate increasing silicon concentration may result in grain size decreasing and diamond [110] texture becoming dominant. The residual stress values of as-deposited Si-doped diamond films are evaluated by both sin2ψ method, which measures the (220) diamond Bragg diffraction peaks using XRD, with ψ-values ranging from 0° to 45°, and Raman spectroscopy, which detects the diamond Raman peak shift from the natural diamond line at 1332 cm-1. The residual stress evolution on the silicon doping level estimated from the above two methods presents rather good agreements, exhibiting that all deposited Si-doped diamond films present compressive stress and the sample with Si/C mole ratio of 0.1% possesses the largest residual stress of ~1.75 GPa (Raman) or ~2.3 GPa (XRD). As the silicon doping level is up further, the residual stress reduces to a relative stable value around 1.3 GPa.
基金funded by the National Natural Science Foundation of China(Nos.51874014,52004015,and 52311530070)the fellowship of China National Postdoctoral Program for Innovative Talents(No.BX2021033)+2 种基金the fellowship of China Postdoctoral Science Foundation(No.2021M700389)the Fundamental Research Funds for the Central Universities of China(Nos.FRF-IDRY-20-003 and QNXM20210001)State Key Laboratory of Strata Intelligent Control and Green Mining Co-founded by Shandong Province and the Ministry of Science and Technology,China(No.SICGM202108)。
文摘Engineering geological disasters such as rockburst have always been a critical factor affecting the safety of coal mine production.Thus,residual stress is considered a feasible method to explain these geomechanical phenomena.In this study,electron backscatter diffraction(EBSD)and optical microscopy were used to characterize the rock microcosm.A measuring area that met the requirements of X-ray diffraction(XRD)residual stress measurement was determined to account for the mechanism of rock residual stress.Then,the residual stress of a siliceous slate-containing quartz vein was measured and calculated using the sin^(2) ϕ method equipped with an X-ray diffractometer.Analysis of microscopic test results showed homogeneous areas with small particles within the millimeter range,meeting the requirements of XRD stress measurement statistics.Quartz was determined as the calibration mineral for slate samples containing quartz veins.The diffraction patterns of the(324)crystal plane were obtained under different ϕ and φ.The deviation direction of the diffraction peaks was consistent,indicating that the sample tested had residual stress.In addition,the principal residual stress within the quartz vein measured by XRD was compressive,ranging from 10 to 33 MPa.The maximum principal stress was parallel to the vein trend,whereas the minimum principal stress was perpendicular to the vein trend.Furthermore,the content of the low-angle boundary and twin boundary in the quartz veins was relatively high,which enhances the resistance of the rock mass to deformation and promotes the easy formation of strain concentrations,thereby resulting in residual stress.The proposed method for measuring residual stress can serve as a reference for subsequent observation and related research on residual stress in different types of rocks.
基金Project supported by the State Key Development Program for Basic Research of China (Grant No 2004CB619302), and the National Natural Science Foundation of China (Grant No 50271038).
文摘X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the as- sumptions that the material is composed of fine crystals with random orientation and the stress state is biaxial and homogeneous through the x-ray penetrating region. The stress is calculated from the gradient of ε ~ sin^2 φ linear relation. But the method cannot be used in textured films due to nonlinear relation. In this paper, a novel method is proposed for measuring the multiaxial stresses in cubic films with any [hkl] fibre texture. As an example, a detailed analysis is given for measuring three-dimensional stresses in FCC films with [111] fibre texture.
文摘A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorption of pure diffraction intensity.Experimental results revealed this to be a reliable correction method.
文摘The X-ray diffractive technology was adopted for tentative study of plastic bonded explosive.The datum of some new diffractive peaks in standard PDF cards were added.The effects of strain to interplanar distance and crystal size of the explosive were studied.The results show that grain size of plastic bonded explosive is decreasing with the increasing of the pressure,and the residual stress of the explosive is draw stress.
文摘When measuring residual stress of coarse-grain aluminum alloy using X-ray diffraction method, the diffraction profile shows two peaks and position of measured 20 will be changed, which lead to an inaccurate measurement result. Hence, in this paper, some methods were employed to improve the measurement accuracy. During the measuring process, different parameters (diameter of irradiated area, Ψ-oscillation range and exposure time) were selected and profile peak shift method was utilized. Moreover, when the 20 of profiles was determined, different calculation methods were used to calculate the residual stress. The results show that diameter of irradiated area and Ψ-oscillation range have significant influence on the measuring result. For stress value calculated directly from the test equipment, cross correlation method is more accurate than the absolute peak. Furthermore, another two calculation methods of slope with 2θ- sin^2Ψ and ε- sin^2Ψwere used to calculate the stress based on parameters (2θ, ε) obtained from cross correlation method. It is concluded that 2θ - sin^2Ψ method can further improve the measurement accuracy.
文摘Pure W and W-Cu-W trilayer coatings were deposited on an Fe substrate by d.c. magnetron sputtering. The α-β phase evolution, intragranular stress evolution in sputter-deposited W layer were investigated by x-ray diffraction. They are directly related to the film microstructure, density and adhesion. Therefore, control of the film stress and phase component transition is essential for its applications. The phase component transition from β-W to α-W and intragranular stress evolution from tensile to compressive strongly depend on the deposition parameters and can be induced by lowering Ar pressure and rising target power. The compressively stressed films with α-W phase have a dense microstructure and high adhesion to Fe substrate.
文摘In-depth studies of solar flares emissions and energy releases include analyses of polarization data. Polarization gives clear information about mechanisms and processes leading to electron acceleration and photon production. Despite of many past attempts, the key energy range of hard X-rays was only rarely explored and results were inconclusive. To large extend it was due to greater instrumental complications. Currently several novel polarimeters are either to be employed or under constructions for both balloon and satellite based observations. The novel hard X-ray polarimeter POLAR is an instrument developed by a collaboration between Switzerland, China and Poland. It is primarily designed for high accuracy polarization measurements from the prompt photon emissions of the gamma-ray bursts. The satellite orientation and instrument pointing direction make it also capable for precise measurements of polarization in solar flares. The instrument should fly in near future onboard of the Chinese Space Station TG2.
文摘Different physical, mechanical and chemical processes, such as: ion implantation, oxidation, nitridation and others create on the surface of materials residual stress state, characterized by high level and strong gradient. X-ray diffraction method widely used for stress measurements has some difficulties in interpretation of experimental data, when the depth of X-ray penetration is compared with thickness of surface layer where inhomogeneous stress distribution is localized. Early it has been shown by authors that diffraction line broadening occurs when analyzed surface is characterized by strong gradient. The interest to study the diffraction line broadening is connected to the possibility of obtaining information about parameters of surface stress distribution. In the present paper the convolution and deconvolution concepts of Fourier analysis were applied to study X ray diffraction line broadening caused by surface stress gradients. Developed methodology allows determining of stress distribution in superficial layers of materials.
文摘Some meaningful advances have been made these last years to value precise and reliable way the residual stresses experimentally created by the autofrettage. The autofrettage process is used widely to introduce residual stresses into thick walled tubes;traditionally residual stresses have been measured using the Sachs method destructive or non-destructive methods. In this paper we describe the application of the X-rays diffraction;this technique permits to justify the presence of the compressive tangential residual stresses, and to value their distribution after two different autofrettage internal pressures loading. The results show that there is a large difference in the residual stresses find in the different autofrettege pressure. One can see the influence of the autofrettage’s pressure quantity on residual stresses created in the thickness of the test tubes.
文摘This article about possibility of automations of choice of instrumental equipment. In it described problems of choice of equipment, which are decided by means of mathematical model, developed on the base of finite element method.
基金financial support from the National Natural Science Foundation of China(52278351 and 51978292).
文摘The mechanical behaviors of deep rocks have always posed a challenge for the implementation and safe operation of major underground engineering projects.To this end,this study modified the existing mainstream rock mechanics instruments equipped with a dynamic disturbance loading system and developed a second‐generation TFD‐2000/D triaxial instrument.The first‐generation device is equipped with an independent disturbance system and an advanced EDC‐580 all‐digital servo controller,which can apply disturbing load independently,implement the function of cyclic disturbance,and combine dynamic and static disturbances.The instrument was found to be reliable for use in analyzing the damage process of rocks in the disturbance test of marbles.The second‐generation instrument tackles three limitations of the first‐generation instrument:(i)it upgrades the strain measurement system and uses extensometers with linear variable differential transformers to accurately measure deformation;(ii)it uses the self‐balanced chamber to replace the Hoek–Franklin triaxial cell and auto‐balancing triaxial pressure chamber;and(iii)the loading rod is independently equipped with an EDC‐580 all‐digital servo controller,which measures precise loads.The experimental findings confirmed that the second‐generation instrument can be used for rock mechanics testing under cyclic disturbance loading,the disturbance–stress relaxation cycle,and the creep–fatigue cycle.In this sense,the second‐generation instrument can be a useful addition to deep rock mechanical instruments and provide a valuable reference.