Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries

Scanning transmission electron microscopy（STEM） has been shown as powerful tools for material characterization,especially after the appearance of aberration-corrector which greatly enhances the resolution of STEM. High angle annular dark field（HAADF） and annular bright field（ABF） imaging of the aberration-corrected STEM are widely used due to their high-resolution capabilities and easily interpretable image contrasts. However, HAADF mode of the STEM is still limited in detecting light elements due to the weak electron-scattering power. ABF mode of the STEM could detect light and heavy elements simultaneously, providing unprecedented opportunities for probing unknown structures of materials. Atomiclevel structure investigation of materials has been achieved by means of these imaging modes, which is invaluable in many fields for either improving properties of materials or developing new materials. This paper aims to provide a introduction of HAADF and ABF imaging techniques and reviews their applications in characterization of cathode materials, study of electrochemical reaction mechanisms, and exploring the effective design of lithium-ion batteries（LIBs）. The future prospects of the STEM are also discussed.

Visualization of atomic scale reaction dynamics of supported nanocatalysts during oxidation and ammonia synthesis using in-situ environmental(scanning) transmission electron microscopy

Reaction dynamics in gases at operating temperatures at the atomic level are the basis of heterogeneous gas-solid catalyst reactions and are crucial to the catalyst function.Supported noble metal nanocatalysts such as platinum are of interest in fuel cells and as diesel oxidation catalysts for pollution control,and practical ruthenium nanocatalysts are explored for ammonia synthesis.Graphite and graphitic carbons are of interest as supports for the nanocatalysts.Despite considerable literature on the catalytic processes on graphite and graphitic supports,reaction dynamics of the nanocatalysts on the supports in different reactive gas environments and operating temperatures at the single atom level are not well understood.Here we present real time in-situ observations and analyses of reaction dynamics of Pt in oxidation,and practical Ru nanocatalysts in ammonia synthesis,on graphite and related supports under controlled reaction environments using a novel in-situ environmental(scanning) transmission electron microscope with single atom resolution.By recording snapshots of the reaction dynamics,the behaviour of the catalysts is imaged.The images reveal single metal atoms,clusters of a few atoms on the graphitic supports and the support function.These all play key roles in the mobility,sintering and growth of the catalysts.The experimental findings provide new structural insights into atomic scale reaction dynamics,morphology and stability of the nanocatalysts.

Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors

Halide perovskites are strategically important in the field of energy materials. Along with the rapid development of the materials and related devices, there is an urgent need to understand the structure–property relationship from nanoscale to atomic scale. Much effort has been made in the past few years to overcome the difficulty of imaging limited by electron dose,and to further extend the investigation towards operando conditions. This review is dedicated to recent studies of advanced transmission electron microscopy(TEM) characterizations for halide perovskites. The irradiation damage caused by the interaction of electron beams and perovskites under conventional imaging conditions are first summarized and discussed. Low-dose TEM is then discussed, including electron diffraction and emerging techniques for high-resolution TEM(HRTEM) imaging. Atomic-resolution imaging, defects identification and chemical mapping on halide perovskites are reviewed. Cryo-TEM for halide perovskites is discussed, since it can readily suppress irradiation damage and has been rapidly developed in the past few years. Finally, the applications of in-situ TEM in the degradation study of perovskites under environmental conditions such as heating,biasing, light illumination and humidity are reviewed. More applications of emerging TEM characterizations are foreseen in the coming future, unveiling the structural origin of halide perovskite’s unique properties and degradation mechanism under operando conditions, so to assist the design of a more efficient and robust energy material.

Nanoscale cathodoluminescence spectroscopy probing the nitride quantum wells in an electron microscope

To gain further understanding of the luminescence properties of multiquantum wells and the factors affecting them on a microscopic level,cathodoluminescence combined with scanning transmission electron microscopy and spectroscopy was used to measure the luminescence of In_(0.15)Ga_(0.85)N five-period multiquantum wells.The lattice-composition-energy relationship was established with the help of energy-dispersive x-ray spectroscopy,and the bandgaps of In_(0.15)Ga_(0.85)N and GaN in multiple quantum wells were extracted by electron energy loss spectroscopy to understand the features of cathodoluminescence spectra.The luminescence differences between different periods of multiquantum wells and the effects of defects such as composition fluctuation and dislocations on the luminescence of multiple quantum wells were revealed.Our study establishing the direct relationship between the atomic structure of In_(x)Ga_(1-x)N multiquantum wells and photoelectric properties provides useful information for nitride applications.

A machine perspective of atomic defects in scanning transmission electron microscopy

Enabled by the advances in aberration-corrected scanning transmission electron microscopy(STEM),atomic-resolution real space imaging of materials has allowed a direct structure-property investigation.Traditional ways of quantitative data analysis suffer from low yield and poor accuracy.New ideas in the field of computer vision and machine learning have provided more momentum to harness the wealth of big data and sophisticated information in STEM data analytics,which has transformed STEM from a localized characterization technique to a macroscopic tool with intelligence.In this review article,we discuss the prime significance of defect topology and density in two-dimensional(2D)materials,which have proved to be a powerful means to tune a wide range of properties.Subsequently,we systematically review advanced data analysis methods that have demonstrated promising prospects in analyzing STEM data,particularly for identifying structural defects,with high throughput and veracity.A unified framework for atomic structure identification is also summarized.

Three-Dimensional Analysis of Melanosomes Isolated from B16 Melanoma Cells by Using Ultra High Voltage Electron Microscopy

Melanosomes, isolated by centrifugal separation from culture broth of B16 melanoma cells derived from mouse, were observed by scanning electron microscopy (SEM), and by transmission electron microscopy (TEM). Some interesting structural features were found inside and outside of the melanosomes. By SEM observation, the melanosomes were ellipsoid shape, their surface was not smooth and was covered with rough substructure, 10 to 20 nm particles. By TEM, uneven structure and micro particles were observed in the melanosomes. Furthermore, three-dimensional analysis was tried by using the ultra-high voltage electron microscopy(UHVEM). Micrographs of the melanosomes were taken at various tilted angles by UHVEM, after preparing 500 nm thickness specimens stained with lead citrate. From the micrographs collected, the three-dimensional structures were reconstructed by using i-mode software. Melanin stained by lead and non stained parts was clearly observed in the reconstructed structure. Non stained parts were round, regular size, and distributed widely in the melanosomes.

Mssbauer and electron microscopy study of martensitic transformations in an Fe-Mn-Mo alloy

The kinetic,morphological,crystallographic,and magnetic characteristics of thermally induced martensites in Fe-13.4wt% Mn-5.2wt%Mo alloy were investigated by scanning electron microscopy（SEM）,transmission electron microscopy（TEM）,and M（o｜¨）ssbauer spectroscopy.The experimental results reveal that two types of thermal-induced martensites,e（hcp） andα＇（bcc） martensites,are formed in the as-quenched condition,and these transformations have athermal characters.Mo addition to the Fe-Mn alloy does not change the coexistence ofεandα＇ martensites with the Mn content between 10wt%and 15wt%.Besides,M（o｜¨）ssbauer spectra reveal a paramagnetic character with a singlet for theγ（fcc） austenite andεmartensite phases and a ferromagnetic character with a broad sextet for theα＇ martensite phase. The volume fraction ofα＇ martensite forming in the quenched alloy is much more than that of theεmartensite.

Visualizing quantum phenomena at complex oxide interfaces:An atomic view from scanning transmission electron microscopy

Complex oxide interfaces have been one of the central focuses in condensed matter physics and ma-terial science.Over the past decade,aberration corrected scanning transmission electron microscopy and spectroscopy has proven to be invaluable to visualize and understand the emerging quantum phenomena at an interface.In this paper,we briefly review some recent progress in the utilization of electron microscopy to probe interfaces.Specifically,we discuss several important challenges for electron microscopy to advance our understanding on interface phenomena,from the perspective of variable temperature,magnetism,electron energy loss spectroscopy analysis,electronic symmetry,and defects probing.

Defect-induced Surface and Interface Reconstruction in Novel Two-dimensional Materials Revealed by Low Voltage Scanning Transmission Electron Microscopy

Two-dimensional(2 D) materials attracted substantial attention due to their extraordinary physical properties resulting from the unique atomic thickness. 2 D materials could be considered as material systems with flat surfaces at both sides, while the van der Waals gap is a natural out-of-plane interface between two monolayers. However, defects are inevitably presented and often cause significant surface and interface reconstruction, which modify the physical properties of the materials being investigated. In this review article, we reviewed the effort achieved in probing the defect structures and the reconstruction of surface and interface in novel 2 D materials through aberration corrected low voltage scanning transmission electron microscopy(LVSTEM). The LVSTEM technique enables us to unveil the intrinsic atomic structure of defects atom-by-atom, and even directly visualize the dynamical reconstruction process with single atom precision. The effort in understanding the defect structures and their contributions in the surface and interface reconstructions in 2 D materials shed light on the origin of their novel physical phenomenon, and also pave the way for defect engineering in future potential applications.

Application of electron microscopy in gastroenterology

Electron microscopy has long been used in research in the fields of life sciences and materials sciences.Transmission and scanning electron microscopy and energy-dispersive X-ray spectroscopy(EDX)analyses have also been performed in the field of gastroenterology.Electron microscopy and EDX enable(1)Observation of ultrastructural differences in esophageal epithelial cells in patients with gastroesophageal reflux and eosinophilic esophagitis;(2)Detection of lanthanum deposition in the stomach and duodenum;(3)Ultrastructural and elemental analyses of enteroliths and bezoars;(4)Detection and characterization of microorganisms in the gastrointestinal tract;(5)Diagnosis of gastrointestinal tumors with neuroendocrine differentiation;and(6)Analysis of gold nanoparticles potentially used in endoscopic photodynamic therapy.This review aims to foster a better understanding of electron microscopy applications by reviewing relevant clinical studies,basic research findings,and the state of current research carried out in gastroenterology science.

Lithium mapping in a Mg-9Li-4Al-1Zn alloy using electron energy-loss spectroscopy

Magnesium-lithium alloys with high lithium content have been attracting significant attention because of their low density,high formability and corrosion resistance.These properties are dependent on the distribution of lithium,which is difficult to map in the presence of magnesium.In this work,a ratio spectrum-imaging method with electron energy-loss spectroscopy(EELS)is demonstrated,which enables the mapping of lithium.In application to LAZ941(Mg-9Li-4Al-1Zn in wt.%),this technique revealed that a key precipitate in the microstructure,previously thought by some to be Mg_(17)Al_(12),is in fact rich in lithium.This result was corroborated with a structural investigation by high-angle annular dark-field scanning transmission electron microscopy(HAADF-STEM),showing this phase to be Al_(1-x)Zn_(x)Li,with x<<1.This work indicates the potential offered by this technique for mapping lithium in materials.

体电子显微学前沿

电子显微成像技术的快速发展使得对完整细胞、组织乃至整个机体进行高分辨三维结构解析研究成为可能,这些可进行大尺度生物样品三维结构研究的电子显微成像技术统称为体电子显微学技术(volume electron microscopy,vEM)。近年来,v EM在研究尺度、分辨率、吞吐量和易用性等方面发展迅速,在整个生命科学领域的应用呈爆炸式增长,该技术因此被《自然》(Nature)评为2023年最值得关注的七项前沿技术之一。然而,vEM相关技术的发展和应用在国内起步较晚,亟待进一步推广。本综述涵盖了vEM的发展历程、技术分类、样品制备、数据收集、图像处理等全方位的内容,便于生命科学、医学等领域研究人员去了解、学习、应用和进一步发展该技术。

Development of advanced electron tomography in materials science based on TEM and STEM

The recent developments of electron tomography（ET） based on transmission electron microscopy（TEM） and scanning transmission electron microscopy（STEM） in the field of materials science were introduced. The various types of ET based on TEM as well as STEM were described in detail, which included bright-field（BF）-TEM tomography, dark-field（DF）-TEM tomography, weak-beam dark-field（WBDF）-TEM tomography, annular dark-field（ADF）-TEM tomography, energy-filtered transmission electron microscopy（EFTEM） tomography, high-angle annular dark-field（HAADF）-STEM tomography, ADF-STEM tomography, incoherent bright field（IBF）-STEM tomography, electron energy loss spectroscopy（EELS）-STEM tomography and X-ray energy dispersive spectrometry（XEDS）-STEM tomography, and so on. The optimized tilt series such as dual-axis tilt tomography, on-axis tilt tomography, conical tilt tomography and equally-sloped tomography（EST） were reported. The advanced reconstruction algorithms, such as discrete algebraic reconstruction technique（DART）, compressed sensing（CS） algorithm and EST were overviewed. At last, the development tendency of ET in materials science was presented.

扫描电镜中透射-反射式STEM明场成像装置的研制及应用

本文研制了一套透射-反射式扫描透射(STEM)明场成像装置,该装置使用背散射电子探头接收经过铂片反射的透射电子信号,可安装在FEI Quanta FEG系列扫描电镜中实现STEM明场成像。分别以埃洛石、Au@ZIF-8纳米颗粒和喷金乳胶标样验证自制STEM明场成像装置的实用性。结果表明:埃洛石STEM明场像的衬度与透射电镜中STEM明场像一致,管腔和管壁具有明显的衬度差异,可以清晰辨识管腔结构;在Au@ZIF-8纳米颗粒的STEM明场像中,Au颗粒衬度较暗,ZIF-8衬度较亮,通过两者之间的衬度差异可以观察到核壳结构;喷金乳胶标样上纳米金颗粒之间可识别的最小距离为2.03 nm,进一步验证了自制STEM明场成像装置具有较高的分辨率。

Visualizing extended defects at the atomic level in a Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire

The microstructure significantly influences the superconducting properties.Herein,the defect structures and atomic arrangements in high-temperature Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire are directly characterized via stateof-the-art scanning transmission electron microscopy.Interstitial oxygen atoms are observed in both the charge reservoir layers and grain boundaries in the doped superconductor.Inclusion phases with varied numbers of CuO_(2) layers are found,and twist interfaces with different angles are identified.This study provides insights into the structures of Bi-2212 wire and lays the groundwork for guiding the design of microstructures and optimizing the production methods to enhance superconducting performance.

Multiphase cooperation for multilevel strain accommodation in a single-crystalline BiFeO3 thin film

The functionalities and diverse metastable phases of multiferroic BiFeO3(BFO)thin films depend on the misfit strain.Although mixed phase-induced strain relaxation in multiphase BFO thin films is well known,it is unclear whether a singlecrystalline BFO thin film can accommodate misfit strain without the involvement of its polymorphs.Thus,understanding the strain relaxation behavior is key to elucidating the lattice strain–property relationship.In this study,a correlative strain analysis based on dark-field inline electron holography(DIH)and quantitative scanning transmission electron microscopy(STEM)was performed to reveal the structural mechanism for strain accommodation of a single-crystalline BFO thin film.The nanoscale DIH strain analysis results indicated a random combination of multiple strain states that acted as a primary strain relief,forming irregularly strained nanodomains.The STEM-based bond length measurement of the corresponding strained nanodomains revealed a unique strain accommodation behavior achieved by a statistical combination of multiple modes of distorted structures on the unit-cell scale.The globally integrated strain for each nanodomain was estimated to be close to1.5%,irrespective of the nanoscale strain states,which was consistent with the fully strained BFO film on the SrTiO3 substrate.Density functional theory calculations suggested that strain accommodation by the combination of metastable phases was energetically favored compared to single-phase-mediated relaxation.This discovery allows a comprehensive understanding of strain accommodation behavior in ferroelectric oxide films,such as BFO,with various low-symmetry polymorphs.

Multidimensional images and aberrations in STEM

Recent advances in scanning transmission electron microscopy(STEM)have led to increased development of multidimensional STEM imaging modalities and novel image reconstruction methods.This interest arises because the main electron lens in a modern transmission electron microscope usually has a diffraction-space information limit that is significantly better than the real-space resolution of the same lens.This state-of-affairs is sometimes shared by other scattering methods in modern physics and contributes to a broader excitement surrounding multidimensional techniques that scan a probe while recording diffraction-space images,such as ptychography and scanning nano-beam diffraction.However,the contrasting resolution in the two spaces raises the question as to what is limiting their effective performance.Here,we examine this paradox by considering the effects of aberrations in both image and diffraction planes,and likewise separate the contributions of pre-and post-sample aberrations.This consideration provides insight into aberration-measurement techniques and might also indicate improvements for super-resolution techniques.

Atomically self-healing of structural defects in monolayer WSe_(2)

Minimizing disorder and defects is crucial for realizing the full potential of two-dimensional transition metal dichalcogenides(TMDs) materials and improving device performance to desired properties. However, the methods in defect controlcurrently face challenges with overly large operational areas and a lack of precision in targeting specific defects. Therefore,we propose a new method for the precise and universal defect healing of TMD materials, integrating real-time imaging withscanning transmission electron microscopy (STEM). This method employs electron beam irradiation to stimulate the diffusionmigration of surface-adsorbed adatoms on TMD materials grown by low-temperature molecular beam epitaxy (MBE),and heal defects within the diffusion range. This approach covers defect repairs ranging from zero-dimensional vacancydefects to two-dimensional grain orientation alignment, demonstrating its universality in terms of the types of samples anddefects. These findings offer insights into the use of atomic-level focused electron beams at appropriate voltages in STEMfor defect healing, providing valuable experience for achieving atomic-level precise fabrication of TMD materials.

Probing nickelate superconductors at atomic scale:A STEM review

The discovery of nickelate superconductors,including doped infinite-layer(IL)nickelates RNiO2(R=La,Pr,Nd),layered square-planar nickelate Nd6Ni5O12,and the Ruddlesden–Popper(RP)phase La3Ni2O7,has spurred immense interest in fundamental research and potential applications.Scanning transmission electron microscopy(STEM)has proven crucial for understanding structure–property correlations in these diverse nickelate superconducting systems.In this review,we summarize the key findings from various modes of STEM,elucidating the mechanism of different nickelate superconductors.We also discuss future perspectives on emerging STEM techniques for unraveling the pairing mechanism in the“nickel age”of superconductivity.

Symmetry quantification and segmentation in STEM imaging through Zernike moments

We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy(STEM)images,aimed at improving structural analysis of materials at the atomic scale.This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects.We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS_(2),enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects.This approach enhances the analysis of structural variations in crystalline materials,marking a notable advancement in the characterization of structures in materials science.