Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector

As few or no failures occur during accelerated life test,it is difficult to assess reliability for long-life products with traditional life tests.Reliability assessment using degradation data of product performance over time becomes a significant approach.Aerospace electrical connector is researched in this paper.Through the analysis of failure mechanism,the performance degradation law is obtained and the statistical model for degradation failure is set up; according to the research on statistical analysis methods for degradation data,accelerated life test theory and method for aerospace electrical connector based on performance degradation is proposed by improving time series analysis method,and the storage reliability is assessed for Y11X series of aerospace electrical connector with degradation data from accelerated degradation test.The result obtained is basically consistent with that obtained from accelerated life test based on failure data,and the two estimates of product＇s characteristic life only have a difference of 8.7%,but the test time shortens about a half.As a result,a systemic approach is proposed for reliability assessment of highly reliable and long-life aerospace product.

Step-stress Accelerated Degradation Test Modeling and Statistical Analysis Methods

In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of product is adopted. Conducting a constant-stress accelerated degradation test（CSADT） is generally very costly as it requires a large sample size and long time for test. To overcome this problem, it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test （SSADT）. Taking electrical connectors as the object, a research is conducted on statistical model and assessment method for SSADT. On the basis of mixed-effect degradation path model, the statistical model of SSADT for electrical connectors is presented, the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed. SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors, and the storage reliability is assessed with the SSADT data. Compared with the result obtained from accelerated life test, the reliability estimation of 32-year storage period for electrical connectors obtained from S SADT data only have a difference of 0.869%, which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward.

Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions.It is necessary to use accelerated storage test to verify the storage life of long storage products.Especially for small sample products,it is very important to obtain prior information for the design and implementation of accelerated degradation test.In this paper,the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained.The results show that optocouplers have two failure modes,one is sudden failure and the other is degradation failure;the maximum temperature stress of optocoupler can’t exceed 140℃;the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip.The surface leakage current is proportional to the adsorption amount.The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler.The lifetime distribution model of the optocoupler is determined by the failure physics.The lifetime of the optocoupler is subject to the lognormal distribution.The degeneracy orbit of the optocoupler leakage current is described by a power law model.The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced.The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.

Bayesian optimal design of step stress accelerated degradation testing

This study presents a Bayesian methodology for de- signing step stress accelerated degradation testing （SSADT） and its application to batteries. First, the simulation-based Bayesian de- sign framework for SSADT is presented. Then, by considering his- torical data, specific optimal objectives oriented Kullback-Leibler （KL） divergence is established. A numerical example is discussed to illustrate the design approach. It is assumed that the degrada- tion model （or process） follows a drift Brownian motion; the accele- ration model follows Arrhenius equation; and the corresponding parameters follow normal and Gamma prior distributions. Using the Markov Chain Monte Carlo （MCMC） method and WinBUGS software, the comparison shows that KL divergence is better than quadratic loss for optimal criteria. Further, the effect of simulation outiiers on the optimization plan is analyzed and the preferred sur- face fitting algorithm is chosen. At the end of the paper, a NASA lithium-ion battery dataset is used as historical information and the KL divergence oriented Bayesian design is compared with maxi- mum likelihood theory oriented locally optimal design. The results show that the proposed method can provide a much better testing plan for this engineering application.

Multiple Objective Test Design for Accelerated Destructive Degradation Tests

Accelerated destructive degradation tests(ADDTs)are powerful to provide reliability information in the degradation processes with destructive measurements.In order to carry out an ADDT efficiently,both the estimation precision of parameters and the test cost should be considered.On the basis of the given degradation model and failure criterion,a multiple-objective optimization model for the design of ADDTs is proposed.Under constrains of the maximum measurement time,the total sample size and the number of stress levels,a comprehensive target function is suggested to reflect both the precision of lifetime estimation and total cost,and the optimal test plan is obtained,which is composed by optimal choices for samples size,measurement frequency,and the number of measurements at each stress level.A real example is illustrated to demonstrate the implementation of the proposed approach.

An Optimal Design of Accelerated Degradation Tests Based on Degradation Performance

This paper mainly talks about the relationship between an optimal design of accelerated degradation tests and the degradation performance. When there is a linear relationship between the parameter of distribution and the critical values, a special pattern of accelerated degradation tests is presented by taking the critical values as accelerated variable. And the optimal test plan is obtained by minimizing the asymptotic variance of the MLE of the parameter of distribution. Finally, a numerical example is presented to illustrate the procedures of the test plan.

Constant-Stress Accelerated Degradation Life Test of an Organic Light-Emitting Diode Display under Violet Light

The lifetime of commercial OLED display devices increases, so does the need for an accelerated lifetime testing method. The present work proposes a simple and accurate blackbox testing approach for commercial PMOLED display lifetime assessment using violet light-induced accelerated aging. Maximum likelihood estimations using lognormal distributions are performed based on datasets acquired from samples exposed to six different degrees of violet irradiance and accelerated life model is shown to accurately fit experimental data using an inverse power law. Based on these results, weighted average of the logarithmic standard deviation, the average life and median life can then be obtained for specific conditions of operation of the devices. As this method relies exclusively on violet light-induced degradation at room-temperature, this minimally-invasive testing procedure requires no significant modification to the display hardware architecture.

Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error

For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The population-based model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model.

Strength Degradation of Wood Members Based on the Correlation of Natural and Accelerated Decay Experiments

An accelerated decay test and a natural decay test were conducted synchronically to explore the strength degradation of decaying wood members under long-term exposure to natural environment.A natural decay test was carried out to measure the bending strength,compressive strength parallel to grain and modulus of elasticity of the wood members,with 6 groups of specimens decayed in natural environment for 3 to 18 months respectively.To compare with corresponding decay test,in which 6 other groups of specimens were measured under accelerated conditions.The experimental data collected were evaluated by Pearson productmoment for the correlation.The results indicate that the mechanical properties of the accelerated decay were highly correlated with those in natural environment,both of which decreased in the same trend.Under the given test conditions,the mean value of the accelerated decay test data were curve-fitted to achieve the time-dependent degradation model of the bending strength,the compressive strength parallel to grain,as well as the modulus of elasticity.Due to the high correlation,the acceleration shift factors(ASF)of the two tests were derived,where the bending strength of 2.934,the compressive strength parallel to grain of 2.519 and the elastic modulus of 2.346 were employed to formulate the strength degradation models in the long-term natural environment.The results verify that the exponential function
σ=σ0e^(-βt)enables to exactly capture the degradation of the mechanical properties of wood members decayed in natural environment.

Consistency check of degradation mechanism between natural storage and enhancement test for missile servo system

Reliability enhancement testing(RET) is an accelerated testing which hastens the performance degradation process to surface its inherent defects of design and manufacture. It is an important hypothesis that the degradation mechanism of the RET is the same as the one of the normal stress condition. In order to check the consistency of two mechanisms, we conduct two enhancement tests with a missile servo system as an object of the study, and preprocess two sets of test data to establish the accelerated degradation models regarding the temperature change rate that is assumed to be the main applied stress of the servo system during the natural storage. Based on the accelerated degradation models and natural storage profile of the servo system, we provide and demonstrate a procedure to check the consistency of two mechanisms by checking the correlation and difference of two sets of degradation data. The results indicate that the two degradation mechanisms are significantly consistent with each other.

Preload relaxation analysis and reliable life prediction of space connection and separation device based on accelerated degradation tests

The safety and reliability of space connection and separation device has become a key issue due to the increasing service span of deep space exploration mission.The long-term preload relaxation(a key failure mode)of connection and separation devices is focused in this paper.A series of tests have been designed and implemented to investigate the preload relaxation regulation and a comprehensive method has been constructed to analyze and predict the reliable lifetime of the device.The two-stage preload relaxation law of the device is found and reasonably considered.Due to the different relaxation mechanism,the first-stage preload relaxation is assessed based on the working-condition test results,and the second-stage preload relaxation is characterized by accelerated test results.Finally,the service reliability and reliable life are evaluated.The experiment and assessment results demonstrate the reasonability and effectiveness of the proposed method which can achieve long-service reliability analysis for space connection and separation device within limited time.

Reliability modeling of the bivariate deteriorating product with both monotonic and non-monotonic degradation paths

Fiber optical gyroscope(FOG)is a highly reliable navigation element,and the degradation trajectories of its two accuracy indexes are monotonic and non-monotonic respectively.In this paper,a flexible accelerated degradation testing(ADT)model is used for analyzing the bivariate dependent degradation process of FOG.The time-varying copulas are employed to consider the dynamic dependency structure between two marginal degradation processes as the Wiener process and the inverse Gaussian process.The statistical inference is implemented by utilizing an inference function for the margins(IFM)approach.It is demonstrated that the proposed method is powerful in modeling the joint distribution with various margins.

Lifetime prediction for tantalum capacitors with multiple degradation measures and particle swarm optimization based grey model

A lifetime prediction method for high-reliability tantalum(Ta) capacitors was proposed,based on multiple degradation measures and grey model(GM).For analyzing performance degradation data,a two-parameter model based on GM was developed.In order to improve the prediction accuracy of the two-parameter model,parameter selection based on particle swarm optimization(PSO) was used,Then,the new PSO-GM(1,2,ω) optimization model was constructed,which was validated experimentally by conducting an accelerated testing on the Ta capacitors.The experiments were conducted at three different stress levels of 85,120,and 145 °C.The results of two experiments were used in estimating the parameters.And the reliability of the Ta capacitors was estimated at the same stress conditions of the third experiment.The results indicate that the proposed method is valid and accurate.

Research on Decalcification Degradation Process of Cement Stone

An accelerated laboratory method（saturated ammonium nitrate solution immersion method） was used to analyze the degradation of cement decalcification process. By studying the changes of intensity, volume, elastic modulus, quality, p H value, the Ca/Si, and mineral phase, it could be found that the first cement decalcification degradation process was the decalcification of calcium hydroxide, and then CSH gel, AFm, etc. The secondary ettringite deposition happened and the decalcification degradation depth was proportional to the square root of time. Moreover, the corresponding strength of cement would be gradually reduced, cement rock volume shrinkage occurred, p H values decreased, the surface elastic modulus decreased down to a certain level, and slightly changed and the Ca/Si was 3.1 from the beginning and lasted down to 1.3.

基于加速退化试验的漏电信号调理电路性能退化及可靠性研究

在电子电路服役过程中,元器件退化会引起电路输出特性变化,降低电子电路的可靠性。漏电信号调理电路作为一种电子电路,其可靠性直接决定了漏电断路器的可靠性。以漏电信号调理电路为研究对象,首先基于灵敏度分析方法确定影响电路性能退化的关键元器件,并对漏电信号调理电路进行了以温度为加速应力、动作电流值为退化特征量的恒定应力加速退化试验;其次根据不同温度应力下的试验数据建立基于Wiener过程的漏电信号调理电路性能退化模型,并利用极大似然估计法求取退化模型的未知参数,进而得出寿命预测的概率密度函数和可靠度函数;最后利用阿伦尼斯(Arrhenius)方程外推出正常应力下漏电信号调理电路的预测寿命。相关结论可为不同电子电路的寿命预测及可靠度分析提供支撑。

基于温度循环加速退化试验的光纤连接器寿命评估

针对光纤连接器在温度交替变化下寿命评估难的问题,提出一种基于修正Coffin-Manson模型的寿命评估方法。首先,分析了光纤连接器失效模式、机理。接着,开展光纤连接器多个加速应力水平下的温度循环加速退化试验,基于插入损耗加速退化数据建立幂函数退化轨迹模型。然后,结合插入损耗的失效阈值,通过假设检验推导不同加速应力水平下光纤连接器的伪失效寿命。最后,引入修正Coffin-Manson加速模型,进而外推空间环境下光纤连接器寿命。本方法评估的某光纤连接器在实际应力水平下的寿命与实际寿命比较接近,验证了修正Coffin-Manson模型方法对光纤连接器寿命评估的有效性和可行性。

Step-stress accelerated degradation test planning based on Wiener processwith correlation

To assess the lifetime distribution of highly reliable or expensive product,one of the most commonly used strategies is to construct step-stress accelerated degradation test(SSADT)which can curtail the test duration and reduce the test cost.In reality,it is not unusual for a unit with a higher degradation rate which exhibits a more volatile degradation path.Recently,Ye,Chen,and Shen[(2015).A new class of Wiener process models for degradation analysis.Reliability Engineering and System Safety,139,58–67]proposed a Wiener process to capture the positive correlation between the drift rate and the volatility.In this paper,an optimal SSADT plan is developed under the assumption that the underlying degradation path follows the Wiener process with correlation.Firstly,the stochastic diffusion process is introduced to model a typical SSADT problem.Then the design variables,including the sample size,the measurement frequency and the numbers of measurements under each stress level,are optimised by minimising the asymptotic variance of the estimated p-percentile of the product’s lifetime distribution subject to the total experimental cost not exceeding a pre-specified budget.Finally,a numerical example is presented to illustrate the proposed method.

可靠性加速试验技术研究

为了更好地理解和运用可靠性加速试验技术,通过文献调研的方式,对加速寿命试验(ALT)、加速退化试验(ADT)、加速可靠性增长试验(ARGT)、高加速寿命试验(HALT)以及高加速应力筛选(HASS)等可靠性加速试验技术进行了研究。阐述了不同类型的可靠性加速试验技术在产品全生命周期内的适用阶段及其应用特点,并将可靠性加速试验与传统可靠性模拟试验技术进行了对比。对比结果表明,可靠性加速试验技术已经发展为产品寿命与可靠性评估的新途径,为高可靠性、小子样、长寿命、零失效产品的可靠性评估提供了有效方法,解决了传统可靠性模拟试验技术难以暴露产品设计缺陷和薄弱环节的问题。指出可靠性加速试验技术的应用前景以及未来方向。该研究有利于加强对可靠性加速试验技术的深入理解,以及推进该技术的长久发展。

微波电子产品贮存状态的SSADT评估方法

针对在贮存期内具有长寿命、高可靠性特点的系统级微波电子产品,为了快速评估其贮存寿命与可靠性指标,提出了使用步进应力加速退化试验(SSADT,Step Stress Ac-celerated Degradation Testig)的试验方法.首先给出SSADT的基本假设.基于该产品的故障模式影响及危害性分析和故障树分析结果,为该产品确定了加速模型.并结合线性漂移布朗运动的首达时(first passage time)分布服从逆高斯分布的特点,建立了SSADT的可靠性评估模型.其次,根据线性漂移布朗运动的独立增量性,给出了可靠性评估模型参数的极大似然法和最小二乘法相结合的评估方法.为了剔除试验中为检测产品性能而引入的通断电对产品贮存寿命与可靠性评估带来的影响,在借鉴可靠性相关标准的基础上,提出了通断电因子退化率折合方法,并得到了线性漂移布朗运动的通断电折合公式.最终的实例证明,采用提出的贮存寿命与可靠性方法能够得到合理的评估结果,从而验证了该方法的正确性.