Bayesian optimal design of step stress accelerated degradation testing

This study presents a Bayesian methodology for de- signing step stress accelerated degradation testing （SSADT） and its application to batteries. First, the simulation-based Bayesian de- sign framework for SSADT is presented. Then, by considering his- torical data, specific optimal objectives oriented Kullback-Leibler （KL） divergence is established. A numerical example is discussed to illustrate the design approach. It is assumed that the degrada- tion model （or process） follows a drift Brownian motion; the accele- ration model follows Arrhenius equation; and the corresponding parameters follow normal and Gamma prior distributions. Using the Markov Chain Monte Carlo （MCMC） method and WinBUGS software, the comparison shows that KL divergence is better than quadratic loss for optimal criteria. Further, the effect of simulation outiiers on the optimization plan is analyzed and the preferred sur- face fitting algorithm is chosen. At the end of the paper, a NASA lithium-ion battery dataset is used as historical information and the KL divergence oriented Bayesian design is compared with maxi- mum likelihood theory oriented locally optimal design. The results show that the proposed method can provide a much better testing plan for this engineering application.

Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector

As few or no failures occur during accelerated life test,it is difficult to assess reliability for long-life products with traditional life tests.Reliability assessment using degradation data of product performance over time becomes a significant approach.Aerospace electrical connector is researched in this paper.Through the analysis of failure mechanism,the performance degradation law is obtained and the statistical model for degradation failure is set up; according to the research on statistical analysis methods for degradation data,accelerated life test theory and method for aerospace electrical connector based on performance degradation is proposed by improving time series analysis method,and the storage reliability is assessed for Y11X series of aerospace electrical connector with degradation data from accelerated degradation test.The result obtained is basically consistent with that obtained from accelerated life test based on failure data,and the two estimates of product＇s characteristic life only have a difference of 8.7%,but the test time shortens about a half.As a result,a systemic approach is proposed for reliability assessment of highly reliable and long-life aerospace product.

Step-stress Accelerated Degradation Test Modeling and Statistical Analysis Methods

In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of product is adopted. Conducting a constant-stress accelerated degradation test（CSADT） is generally very costly as it requires a large sample size and long time for test. To overcome this problem, it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test （SSADT）. Taking electrical connectors as the object, a research is conducted on statistical model and assessment method for SSADT. On the basis of mixed-effect degradation path model, the statistical model of SSADT for electrical connectors is presented, the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed. SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors, and the storage reliability is assessed with the SSADT data. Compared with the result obtained from accelerated life test, the reliability estimation of 32-year storage period for electrical connectors obtained from S SADT data only have a difference of 0.869%, which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward.

Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error

For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The population-based model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model.

Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test

The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions.It is necessary to use accelerated storage test to verify the storage life of long storage products.Especially for small sample products,it is very important to obtain prior information for the design and implementation of accelerated degradation test.In this paper,the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained.The results show that optocouplers have two failure modes,one is sudden failure and the other is degradation failure;the maximum temperature stress of optocoupler can’t exceed 140℃;the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip.The surface leakage current is proportional to the adsorption amount.The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler.The lifetime distribution model of the optocoupler is determined by the failure physics.The lifetime of the optocoupler is subject to the lognormal distribution.The degeneracy orbit of the optocoupler leakage current is described by a power law model.The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced.The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment.

Strength Degradation of Wood Members Based on the Correlation of Natural and Accelerated Decay Experiments

An accelerated decay test and a natural decay test were conducted synchronically to explore the strength degradation of decaying wood members under long-term exposure to natural environment.A natural decay test was carried out to measure the bending strength,compressive strength parallel to grain and modulus of elasticity of the wood members,with 6 groups of specimens decayed in natural environment for 3 to 18 months respectively.To compare with corresponding decay test,in which 6 other groups of specimens were measured under accelerated conditions.The experimental data collected were evaluated by Pearson productmoment for the correlation.The results indicate that the mechanical properties of the accelerated decay were highly correlated with those in natural environment,both of which decreased in the same trend.Under the given test conditions,the mean value of the accelerated decay test data were curve-fitted to achieve the time-dependent degradation model of the bending strength,the compressive strength parallel to grain,as well as the modulus of elasticity.Due to the high correlation,the acceleration shift factors(ASF)of the two tests were derived,where the bending strength of 2.934,the compressive strength parallel to grain of 2.519 and the elastic modulus of 2.346 were employed to formulate the strength degradation models in the long-term natural environment.The results verify that the exponential function
σ=σ0e^(-βt)enables to exactly capture the degradation of the mechanical properties of wood members decayed in natural environment.

Multiple Objective Test Design for Accelerated Destructive Degradation Tests

Accelerated destructive degradation tests(ADDTs)are powerful to provide reliability information in the degradation processes with destructive measurements.In order to carry out an ADDT efficiently,both the estimation precision of parameters and the test cost should be considered.On the basis of the given degradation model and failure criterion,a multiple-objective optimization model for the design of ADDTs is proposed.Under constrains of the maximum measurement time,the total sample size and the number of stress levels,a comprehensive target function is suggested to reflect both the precision of lifetime estimation and total cost,and the optimal test plan is obtained,which is composed by optimal choices for samples size,measurement frequency,and the number of measurements at each stress level.A real example is illustrated to demonstrate the implementation of the proposed approach.

An Optimal Design of Accelerated Degradation Tests Based on Degradation Performance

This paper mainly talks about the relationship between an optimal design of accelerated degradation tests and the degradation performance. When there is a linear relationship between the parameter of distribution and the critical values, a special pattern of accelerated degradation tests is presented by taking the critical values as accelerated variable. And the optimal test plan is obtained by minimizing the asymptotic variance of the MLE of the parameter of distribution. Finally, a numerical example is presented to illustrate the procedures of the test plan.

Constant-Stress Accelerated Degradation Life Test of an Organic Light-Emitting Diode Display under Violet Light

The lifetime of commercial OLED display devices increases, so does the need for an accelerated lifetime testing method. The present work proposes a simple and accurate blackbox testing approach for commercial PMOLED display lifetime assessment using violet light-induced accelerated aging. Maximum likelihood estimations using lognormal distributions are performed based on datasets acquired from samples exposed to six different degrees of violet irradiance and accelerated life model is shown to accurately fit experimental data using an inverse power law. Based on these results, weighted average of the logarithmic standard deviation, the average life and median life can then be obtained for specific conditions of operation of the devices. As this method relies exclusively on violet light-induced degradation at room-temperature, this minimally-invasive testing procedure requires no significant modification to the display hardware architecture.

微波电子产品贮存状态的SSADT评估方法

针对在贮存期内具有长寿命、高可靠性特点的系统级微波电子产品,为了快速评估其贮存寿命与可靠性指标,提出了使用步进应力加速退化试验(SSADT,Step Stress Ac-celerated Degradation Testig)的试验方法.首先给出SSADT的基本假设.基于该产品的故障模式影响及危害性分析和故障树分析结果,为该产品确定了加速模型.并结合线性漂移布朗运动的首达时(first passage time)分布服从逆高斯分布的特点,建立了SSADT的可靠性评估模型.其次,根据线性漂移布朗运动的独立增量性,给出了可靠性评估模型参数的极大似然法和最小二乘法相结合的评估方法.为了剔除试验中为检测产品性能而引入的通断电对产品贮存寿命与可靠性评估带来的影响,在借鉴可靠性相关标准的基础上,提出了通断电因子退化率折合方法,并得到了线性漂移布朗运动的通断电折合公式.最终的实例证明,采用提出的贮存寿命与可靠性方法能够得到合理的评估结果,从而验证了该方法的正确性.

基于累积退化量的电子部件SSADT可靠性评估

为快速评估新型弹药中电子部件的储存可靠性,提出了使用步进应力加速退化试验(SSADT)的方法。首先给出了电子部件SSADT方案,接着提出了基于累积退化量的电子部件SSADT可靠性评估的基本假设,然后详细分析了基于累积退化量的电子部件SSADT可靠性评估思路和方法。该方法实现了"零失效"情况下弹药电子部件的储存可靠性评估。

费用约束下含应力优化的CSADT设计

恒定应力加速退化试验(CSADT,Constant Stress Accelerated Degradation Tes-ting)方案中需要确定的变量有应力水平、各应力下样本量、监测间隔和各应力下监测次数.如何对CSADT的应力水平进行优化目前很少有人探讨.针对这一问题提出一种在费用约束下将上述4个变量进行综合优化的方法.首先用随机过程描述CSADT下产品的性能退化过程,然后以产品在使用条件下p分位寿命可靠度的渐近方差最小为目标,以试验费用不超过预算为约束条件,给出CSADT的4个优化变量,并给出应用该优化方法的仿真算例.最后,优化方案对模型参数偏差的敏感性分析表明,在一定偏差范围内优化结果具有良好的稳健性.

基于ADT数据的SLD温度建模方法

在对超辐射发光二极管(SLD)实施加速退化试验(ADT)并评估其寿命及可靠性的过程中,其性能参数的温度漂移特性影响了评估的精度,为了剔除这种影响,进而提高评估的精度,需要建立相应的温度与性能参数的关系模型来对试验数据进行处理。对SLD的温度建模进行了研究,为了确定一种适用于SLD及ADT数据处理的温度建模方法。通过调研分析讨论了回归方法、人工神经网络、支持向量机等3种温度建模方法;从建模精度、稳定性等方面对上述方法进行了对比分析,并总结了各种温度建模方法的特点;最终确定支持向量机的温度建模方法更适用于开展SLD及ADT的温度建模工作,从而为SLD及相关产品的温度建模和ADT的评估提供了理论依据。

基于状态转移随机模型的SSADT可靠性评估方法

为评估步进应力加速退化试验(step stress accelerated degradation test,SSADT)中具有非线性退化趋势的产品的可靠性,提出一种基于状态转移的随机退化建模与可靠性评估方法。首先将状态转移关系与高斯随机过程相结合建立步进应力随机退化模型,以表征微观缺陷的产生和发展对宏观性能的影响;然后应用最佳线性逼近和随机过程曲线边界首达理论建立可靠性模型;最后将其应用在介质振荡器(dielectric resonator oscilla-tor,DRO)贮存可靠性评估中。以修正高斯牛顿算法和Powell共轭梯度算法相结合的方法对退化模型参数进行识别,其结果表明,状态转移随机退化模型能够有效地刻画产品SSADT中性能退化的非线性趋势特性和随机特性,得到较为准确的评估结果。

基于ADT的电阻型湿度传感器可靠性评估

传统的寿命试验对电子元件可靠性进行评估需较长时间。如何快速、准确获取电子元件的性能指标是工程实践和试验研究迫切需要解决的问题。本文以电阻型湿度传感器为研究对象,基于加速退化试验(ADT)的可靠性评估方法,建立加速模型和退化轨迹,结合最大似然估计和最小二乘法求解加速应力下伪失效寿命分布参数,从而得出正常应力水平下可靠度函数。结果表明,采用ADT能够准确获取湿度传感器的可靠性信息,缩短试验周期,此评估方法同样适用于其它电子元件的可靠性研究,存在广泛的应用价值。

基于D优化方法的CSADT设计

考虑到试验设计人员更关注模型参数的估计精度,而传统试验优化方法以产品可靠性与寿命相关参数的预测精度为目标,提出将D优化方法引入恒定应力加速退化试验(CSADT)设计中。首先,用随机过程描述CSADT中产品性能退化的过程,通过对数似然函数,推导Fisher信息矩阵,基于D优化方法建立优化目标,以试验费用为约束条件,明确优化问题,给出最优试验变量:各应力水平、各应力下样本分配和试验时间分配。然后,应用该方法给出仿真实例。最后,通过模型参数偏差的敏感性分析,说明在一定偏差范围内,优化结果具有良好的稳健性。

Consistency check of degradation mechanism between natural storage and enhancement test for missile servo system

Reliability enhancement testing(RET) is an accelerated testing which hastens the performance degradation process to surface its inherent defects of design and manufacture. It is an important hypothesis that the degradation mechanism of the RET is the same as the one of the normal stress condition. In order to check the consistency of two mechanisms, we conduct two enhancement tests with a missile servo system as an object of the study, and preprocess two sets of test data to establish the accelerated degradation models regarding the temperature change rate that is assumed to be the main applied stress of the servo system during the natural storage. Based on the accelerated degradation models and natural storage profile of the servo system, we provide and demonstrate a procedure to check the consistency of two mechanisms by checking the correlation and difference of two sets of degradation data. The results indicate that the two degradation mechanisms are significantly consistent with each other.

Lifetime prediction for tantalum capacitors with multiple degradation measures and particle swarm optimization based grey model

A lifetime prediction method for high-reliability tantalum （Ta） capacitors was proposed, based on multiple degradation measures and grey model （GM）. For analyzing performance degradation data, a two-parameter model based on GM was developed. In order to improve the prediction accuracy of the two-parameter model, parameter selection based on particle swarm optimization （PSO） was used. Then, the new PSO-GM（1, 2, co） optimization model was constructed, which was validated experimentally by conducting an accelerated testing on the Ta capacitors. The experiments were conducted at three different stress levels of 85, 120, and 145℃. The results of two experiments were used in estimating the parameters. And the reliability of the Ta capacitors was estimated at the same stress conditions of the third experiment. The results indicate that the proposed method is valid and accurate.

Reliability modeling of the bivariate deteriorating product with both monotonic and non-monotonic degradation paths

Fiber optical gyroscope(FOG)is a highly reliable navigation element,and the degradation trajectories of its two accuracy indexes are monotonic and non-monotonic respectively.In this paper,a flexible accelerated degradation testing(ADT)model is used for analyzing the bivariate dependent degradation process of FOG.The time-varying copulas are employed to consider the dynamic dependency structure between two marginal degradation processes as the Wiener process and the inverse Gaussian process.The statistical inference is implemented by utilizing an inference function for the margins(IFM)approach.It is demonstrated that the proposed method is powerful in modeling the joint distribution with various margins.

基于动态SSI模型和ADT相结合的可靠性预测方法研究

提出一种基于动态应力-强度干涉模型和恒定应力加速试验相结合的可靠性定量预测方法。利用加速退化试验数据获得产品可靠度值,通过SSI模型外推得到产品在各应力水平下强度随时间退化的数据,并推导得出产品在动态环境作用下的可靠性变化趋势,有效解决了电子产品在动态时变环境下的可靠性预测难题,并通过仿真实例验证了方法有效性。