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Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests 被引量:1
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作者 Pramote Charongrattanasakul Wimonmas Bamrungsetthapong Poom Kumam 《Computer Systems Science & Engineering》 SCIE EI 2023年第8期1631-1651,共21页
A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multi... A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan. 展开更多
关键词 accelerated life test acceleration factor adaptive of multiple dependent state sampling plan average sample number total cost of inspection weibull distribution
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Inference for constant-stress accelerated life test with Type-I progressively hybrid censored data from Burr-XII distribution
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作者 Jiao Zhao Yimin Shi Weian Yan 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2014年第2期340-348,共9页
This paper proposes a simple constant-stress accel- erated life test (ALT) model from Burr type XII distribution when the data are Type-I progressively hybrid censored. The maximum likelihood estimation (MLE) of t... This paper proposes a simple constant-stress accel- erated life test (ALT) model from Burr type XII distribution when the data are Type-I progressively hybrid censored. The maximum likelihood estimation (MLE) of the parameters is obtained through the numerical method for solving the likelihood equations. Approxi- mate confidence interval (CI), based on normal approximation to the asymptotic distribution of MLE and percentile bootstrap Cl is derived. Finally, a numerical example is introduced and then a Monte Carlo simulation study is carried out to illustrate the pro- posed method. 展开更多
关键词 constant-stress accelerated life test (alt Burr type-Xll distribution Type-I progressively hybrid censoring maximumlikelihood estimation (MLE) confidence interval (CI).
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Optimum design of equivalent accelerated life testing plans based on proportional hazards-proportional odds model 被引量:3
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作者 Tingting Huang Tongmin Jiang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2011年第5期871-878,共8页
The optimum design of equivalent accelerated life testing plan based on proportional hazards-proportional odds model using D-optimality is presented. The defined equivalent test plan is the test plan that has the same... The optimum design of equivalent accelerated life testing plan based on proportional hazards-proportional odds model using D-optimality is presented. The defined equivalent test plan is the test plan that has the same value of the determinant of Fisher information matrix. The equivalent test plan of step stress accelerated life testing (SSALT) to a baseline optimum constant stress accelerated life testing (CSALT) plan is obtained by adjusting the censoring time of SSALT and solving the optimization problem for each case to achieve the same value of the determinant of Fisher information matrix as in the baseline optimum CSALT plan. Numer- ical examples are given finally which demonstrate the equivalent SSALT plan to the baseline optimum CSALT plan reduces almost half of the test time while achieving approximately the same estimation errors of model parameters. 展开更多
关键词 equivalent test plan proportional hazards-proportional odds (PH-PO) model D-OPTIMALITY constant stress step stress accelerated life testing (alt).
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Analysis of Incomplete Data of Accelerated Life Testing with Competing Failure Modes 被引量:10
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作者 TAN Yuanyuan ZHANG Chunhua CHEN Xun 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2009年第6期883-889,共7页
Data obtained from accelerated life testing (ALT) when there are two or more failure modes, which is commonly referred to as competing failure modes, are often incomplete. The incompleteness is mainly due to censori... Data obtained from accelerated life testing (ALT) when there are two or more failure modes, which is commonly referred to as competing failure modes, are often incomplete. The incompleteness is mainly due to censoring, as well as masking which might be the case that the failure time is observed, but its corresponding failure mode is not identified. Because the identification of the failure mode may be expensive, or very difficult to investigate due to lack of appropriate diagnostics. A method is proposed for analyzing incomplete data of constant stress ALT with competing failure modes. It is assumed that failure modes have s-independent latent lifetimes and the log lifetime of each failure mode can be written as a linear function of stress. The parameters of the model are estimated by using the expectation maximum (EM) algorithm with incomplete data. Simulation studies are performed to check'model validity and investigate the properties of estimates. For further validation, the method is also illustrated by an example, which shows the process of analyze incomplete data from ALT of some insulation system. Because of considering the incompleteness of data in modeling and making use of the EM algorithm in estimating, the method becomes more flexible in ALT analysis. 展开更多
关键词 accelerated life testing competing failure modes expectation maximum algorithm incomplete data Monte Carlo simulation
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Optimal Design of Multiple Stress Constant Accelerated Life Test Plan on Non-rectangle Test Region 被引量:7
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作者 CHEN Wenhua GAO Liang +2 位作者 LIU Juan QIAN Ping PAN Jun 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2012年第6期1231-1237,共7页
For optimal design of constant stress accelerated life test(CSALT) with two-stress, if the stresses could not reach the highest levels simultaneously, the test region becomes non-rectangular. For optimal CSALT desig... For optimal design of constant stress accelerated life test(CSALT) with two-stress, if the stresses could not reach the highest levels simultaneously, the test region becomes non-rectangular. For optimal CSALT design on non-rectangle test region, the present method is only focused on non-rectangle test region with simple boundary, and the optimization algorithm is based on experience which can not ensure to obtain the optimal plan. In this paper, considering the linear-extreme value model and the optimization goal to minimize the variance of lifetime estimate under normal stress, the optimal design method of two-stress type-I censored CSALT plan on general non-rectangular test region is proposed. First, two properties of optimal test plans are proved and the relationship of all the optimal test plans is determined analytically. Then, on the basis of the two properties, the optimal problem is simplified and the optimal design method of two-stress CSALT plan on general non-rectangular test region is proposed. Finally, a numerical example is used to illustrate the feasibility and effectiveness of the method, The result shows that the proposed method could obtain the optimal test plan on non-rectangular test regions with arbitrary boundaries. This research provides the theory and method for two-stress optimal CSALT planning on non-rectangular test regions. 展开更多
关键词 accelerated life test non- rectangular test region test plan optimal design
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Estimation for constant-stress accelerated life test from generalized half-normal distribution 被引量:4
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作者 Liang Wang Yimin Shi 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2017年第4期810-816,共7页
In the constant-stress accelerated life test, estimation issues are discussed for a generalized half-normal distribution under a log-linear life-stress model. The maximum likelihood estimates with the corresponding fi... In the constant-stress accelerated life test, estimation issues are discussed for a generalized half-normal distribution under a log-linear life-stress model. The maximum likelihood estimates with the corresponding fixed point type iterative algorithm for unknown parameters are presented, and the least square estimates of the parameters are also proposed. Meanwhile, confidence intervals of model parameters are constructed by using the asymptotic theory and bootstrap technique. Numerical illustration is given to investigate the performance of our methods. 展开更多
关键词 accelerated life test maximum likelihood estimation least square method bootstrap technique asymptotic distribution
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Design of Accelerated Life Test Plans——Overview and Prospect 被引量:2
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作者 Wen-Hua Chen Liang Gao +2 位作者 Jun Pan Ping Qian Qing-Chuan He 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2018年第1期19-33,共15页
Accelerated life test(ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accura... Accelerated life test(ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accurately, quickly, and economically. With the promotion of the national strategy of civil-military integration, ALT will be widely used in the research and development(R&D) of various types of products, and the ALT plan design theory will face further challenges. To aid engineers in selecting appropriate theories and to stimulate researchers to develop the theories required in engineering, with focus on the demands for theory research that arise from the implementation of ALT, this paper reviews and summarizes the development of ALT plan design theory. The development of the theory and method for planning optimal ALT for location-scale distribution, which is the most applied and mature theory of designing the optimal ALT plan, are described in detail. Taking this as the center of radiation, some problems that ALT now faces, such as the verification of the statistical model, limitation of sample size, solutions of resource limits, optimization of the test arrangement, and management of product complexity, are discussed, and the general ideas and methods of solving these problems are analyzed. Suggestions for selecting appropriate ALT plan design theories are proposed, and the urgent solved theory problems and opinions of their solutions are proposed. Based on the principle of convenience for engineers to select appropriate methods according to the problems found in practice, this paper reviews the development of optimal ALT plan design theory by taking the engineering problems arising from the ALT implementation as the main thread, provides guidelines on selecting appropriate theories for engineers, and proposes opinions about the urgent solved theory problems for researchers. 展开更多
关键词 accelerated life test test plan Optimal design Reliability assessment
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Inference and optimal design on step-stress partially accelerated life test for hybrid system with masked data 被引量:1
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作者 SHI Xiaolin LU Pu SHI Yimin 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2018年第5期1089-1100,共12页
Under Type-Ⅱ progressively hybrid censoring, this paper discusses statistical inference and optimal design on stepstress partially accelerated life test for hybrid system in presence of masked data. It is assumed tha... Under Type-Ⅱ progressively hybrid censoring, this paper discusses statistical inference and optimal design on stepstress partially accelerated life test for hybrid system in presence of masked data. It is assumed that the lifetime of the component in hybrid systems follows independent and identical modified Weibull distributions. The maximum likelihood estimations(MLEs)of the unknown parameters, acceleration factor and reliability indexes are derived by using the Newton-Raphson algorithm. The asymptotic variance-covariance matrix and the approximate confidence intervals are obtained based on normal approximation to the asymptotic distribution of MLEs of model parameters. Moreover,two bootstrap confidence intervals are constructed by using the parametric bootstrap method. The optimal time of changing stress levels is determined under D-optimality and A-optimality criteria.Finally, the Monte Carlo simulation study is carried out to illustrate the proposed procedures. 展开更多
关键词 hybrid system step-stress partially accelerated life test Type-Ⅱ progressively hybrid censored and masked data statistical inference optimal test plan
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Constant-step stress accelerated life test of VFD under Weibull distribution case 被引量:4
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作者 张建平 耿新民 《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 SCIE EI CAS CSCD 2005年第7期722-727,共6页
Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, ... Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method (LSM)for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life. 展开更多
关键词 真空荧光显示器 寿命测试 VFD WEIBULL分布 Arrhenius方程
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Bayesian Analysis in Partially Accelerated Life Tests for Weighted Lomax Distribution 被引量:1
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作者 Rashad Bantan Amal S.Hassan +4 位作者 Ehab Almetwally M.Elgarhy Farrukh Jamal Christophe Chesneau Mahmoud Elsehetry 《Computers, Materials & Continua》 SCIE EI 2021年第9期2859-2875,共17页
Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditio... Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditional levels of stress,such as pressure,temperature,vibration,voltage,or load to induce early failures.In this paper,a step stress partially accelerated life test(SSPALT)is regarded under the progressive type-II censored data with random removals.The removals from the test are considered to have the binomial distribution.The life times of the testing items are assumed to follow lengthbiased weighted Lomax distribution.The maximum likelihood method is used for estimating the model parameters of length-biased weighted Lomax.The asymptotic confidence interval estimates of the model parameters are evaluated using the Fisher information matrix.The Bayesian estimators cannot be obtained in the explicit form,so the Markov chain Monte Carlo method is employed to address this problem,which ensures both obtaining the Bayesian estimates as well as constructing the credible interval of the involved parameters.The precision of the Bayesian estimates and the maximum likelihood estimates are compared by simulations.In addition,to compare the performance of the considered confidence intervals for different parameter values and sample sizes.The Bootstrap confidence intervals give more accurate results than the approximate confidence intervals since the lengths of the former are less than the lengths of latter,for different sample sizes,observed failures,and censoring schemes,in most cases.Also,the percentile Bootstrap confidence intervals give more accurate results than Bootstrap-t since the lengths of the former are less than the lengths of latter for different sample sizes,observed failures,and censoring schemes,in most cases.Further performance comparison is conducted by the experiments with real data. 展开更多
关键词 Partially accelerated life testing progressive type-II censoring length-biased weighted Lomax Bayesian and bootstrap confidence intervals
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ACCELERATED LIFE TEST STUDIES OF NEW COATED DISPENSER CATHODES 被引量:2
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作者 Zhang Mingchen Zhang Honglai Liu Pukun Su Xiaobao Li Yutao 《Journal of Electronics(China)》 2007年第5期717-720,共4页
The life of impregnated Ba-W cathodes with a new construction have been evaluated using an accelerated life test at three different temperatures (1170℃,1130℃,1090℃) and constant current density (2A/cm^2).According ... The life of impregnated Ba-W cathodes with a new construction have been evaluated using an accelerated life test at three different temperatures (1170℃,1130℃,1090℃) and constant current density (2A/cm^2).According to the relationship of life with operating temperatures,an accelerated equation has been set up.The cathode life at normal operating temperature is deducted based on the accelerated equation.The results show that life of the novel cathode exceeds 190,000 hour at a current density of 2A/cm^2. 展开更多
关键词 加速实验 分配器 阴极 电子设备
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Empirical Approach for Planning and Designing Constant Stress Accelerated Life Tests
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作者 蒋仁言 龙旭 《Journal of Donghua University(English Edition)》 EI CAS 2015年第6期1025-1028,共4页
Accelerated life testing(ALT)has been widely used to obtain information about the product's life characteristics at normal conditions in a relatively short period of time.Two key issues with ALT are test design an... Accelerated life testing(ALT)has been widely used to obtain information about the product's life characteristics at normal conditions in a relatively short period of time.Two key issues with ALT are test design and data analysis.The test design of constant stress ALT was studied in this paper.The test design usually combines engineering experiences with optimization models.Such approaches are hard to be implemented by practitioners.A"pure"empirical approach was presented to address this issue.With the proposed approach,some of the decision variables are determined based on the results from the literature,some of the other variables are determined based on engineering analysis and /or judgment,and the remaining variables are determined based on the empirical relations developed in this paper.A real-world example is included to illustrate the appropriateness of the proposed approach. 展开更多
关键词 accelerated life testing(alt)design constant stress stress levels test units allocation censoring type
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Constant-Step Stress Accelerated Life Test of VFD under Logarithmic Normal Distribution Case
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作者 张建平 谢秀中 赵科仁 《Journal of Shanghai Jiaotong university(Science)》 EI 2006年第1期14-17,共4页
In order to solve the life problem of vacuum fluorescent display (VFD) within shorter time, and reduce the life prediction cost, a constant-step stress accelerated life test was performed with its cathode temperature ... In order to solve the life problem of vacuum fluorescent display (VFD) within shorter time, and reduce the life prediction cost, a constant-step stress accelerated life test was performed with its cathode temperature increased. Statistical analysis was done by applying logarithmic normal distribution for describing the life, and least square method (LSM) for estimating logarithmic normal parameters. Self-designed special software was used to predict the VFD life. It is verified by numerical results that the VFD life follows logarithmic normal distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. The accurate calculation of the key parameters enables the rapid estimation of VFD life. 展开更多
关键词 vacuum fluorescent display accelerated life test logarithmic normal distribution
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On a Generalized Model in Accelerated Life Testing
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作者 Eduardo L. Cruz Adolfo M. De Guzman 《Open Journal of Statistics》 2012年第2期184-187,共4页
The main objective of accelerated life tests in this setting is the recovery of the distribution of the random variable representing lifetime which is difficult to observe at a certain level of a given stress factor. ... The main objective of accelerated life tests in this setting is the recovery of the distribution of the random variable representing lifetime which is difficult to observe at a certain level of a given stress factor. A general model for accelerated life test is proposed that utilizes the inverse problem approach, that is, the variable is observe at different level/s and the transfer function is used to recover the elusive random variable (life time). The problem then is reduced to finding the transfer function. We derive some properties of the proposed general model. The Lognormal distribution and the Arrhenius model for lifetime are used as examples. Its relationship with the Cox proportional hazards model is also discussed. 展开更多
关键词 accelerated life test ARRHENIUS Model INVERSE PROBLEM
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Constant Stress Accelerated Life Tests for Vacuum Fluorescent Display Based on Least Square Method
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作者 张建平 王睿韬 《Journal of Southwest Jiaotong University(English Edition)》 2010年第1期45-50,共6页
To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the... To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method (LSM) to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month. 展开更多
关键词 Vacuum fluorescent display Constant stress accelerated life tests Least square method Lognormal distribution
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Parameter Estimation Based on Censored Data under Partially Accelerated Life Testing for Hybrid Systems due to Unknown Failure Causes
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作者 Mustafa Kamal 《Computer Modeling in Engineering & Sciences》 SCIE EI 2022年第3期1239-1269,共31页
In general,simple subsystems like series or parallel are integrated to produce a complex hybrid system.The reliability of a system is determined by the reliability of its constituent components.It is often extremely d... In general,simple subsystems like series or parallel are integrated to produce a complex hybrid system.The reliability of a system is determined by the reliability of its constituent components.It is often extremely difficult or impossible to get specific information about the component that caused the system to fail.Unknown failure causes are instances in which the actual cause of systemfailure is unknown.On the other side,thanks to current advanced technology based on computers,automation,and simulation,products have become incredibly dependable and trustworthy,and as a result,obtaining failure data for testing such exceptionally reliable items have become a very costly and time-consuming procedure.Therefore,because of its capacity to produce rapid and adequate failure data in a short period of time,accelerated life testing(ALT)is the most utilized approach in the field of product reliability and life testing.Based on progressively hybrid censored(PrHC)data froma three-component parallel series hybrid system that failed to owe to unknown causes,this paper investigates a challenging problem of parameter estimation and reliability assessment under a step stress partially accelerated life-test(SSPALT).Failures of components are considered to follow a power linear hazard rate(PLHR),which can be used when the failure rate displays linear,decreasing,increasing or bathtub failure patterns.The Tempered random variable(TRV)model is considered to reflect the effect of the high stress level used to induce early failure data.The maximum likelihood estimation(MLE)approach is used to estimate the parameters of the PLHR distribution and the acceleration factor.A variance covariance matrix(VCM)is then obtained to construct the approximate confidence intervals(ACIs).In addition,studentized bootstrap confidence intervals(ST-B CIs)are also constructed and compared with ACIs in terms of their respective interval lengths(ILs).Moreover,a simulation study is conducted to demonstrate the performance of the estimation procedures and the methodology discussed in this paper.Finally,real failure data from the air conditioning systems of an airplane is used to illustrate further the performance of the suggested estimation technique. 展开更多
关键词 Step stress partially accelerated life test progressive hybrid censoring data masking power linear hazard rate distribution hybrid system
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Inference for accelerated bivariate dependent competing risks model based on Archimedean copulas under progressive censoring
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作者 ZHANG Chun-fang SHI Yi-min WANG Liang 《Applied Mathematics(A Journal of Chinese Universities)》 SCIE CSCD 2023年第4期475-492,共18页
Dependent competing risks model is a practical model in the analysis of lifetime and failure modes.The dependence can be captured using a statistical tool to explore the re-lationship among failure causes.In this pape... Dependent competing risks model is a practical model in the analysis of lifetime and failure modes.The dependence can be captured using a statistical tool to explore the re-lationship among failure causes.In this paper,an Archimedean copula is chosen to describe the dependence in a constant-stress accelerated life test.We study the Archimedean copula based dependent competing risks model using parametric and nonparametric methods.The parametric likelihood inference is presented by deriving the general expression of likelihood function based on assumed survival Archimedean copula associated with the model parameter estimation.Combining the nonparametric estimation with progressive censoring and the non-parametric copula estimation,we introduce a nonparametric reliability estimation method given competing risks data.A simulation study and a real data analysis are conducted to show the performance of the estimation methods. 展开更多
关键词 dependent competing risks model accelerated life tests Archimedean copula nonparametric reliability estimation
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Novel Accelerating Life Test Method and Its Application by Combining Constan Stress and Progressive Stress 被引量:1
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作者 Wen-Hua Chen Fan Yang +2 位作者 Ping Qian Jun Pan Qing-Chuan He 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2018年第5期17-24,共8页
Constant stress accelerated life tests(ALTs) can be applied to obtain a high estimation accuracy of reliability measure?ments, but these are time?consuming tests. Progressive stress ALTs can yield failures more quickl... Constant stress accelerated life tests(ALTs) can be applied to obtain a high estimation accuracy of reliability measure?ments, but these are time?consuming tests. Progressive stress ALTs can yield failures more quickly but cannot guaran tee the estimation accuracy of reliability measurements. In this paper, a progressive?constant combination stress ALT is proposed to combine the merits of both tests. The optimal plan, in which the design variables are the initial pro?gressive stress level, the progressive stress ramp rate, the sample allocation proportion of the progressive stress and the constant stress level, is determined using the principle of minimizing the asymptotic variance of the maximum likelihood estimator of the natural log reliable life for the connectors. A comparison between the optimal PCCSALT plan and the CSALT plan with the same sample size and estimation accuracy shows that the test time is reduced by 13.59% by applying the PCCSALT. 展开更多
关键词 Constant stress Progressive stress accelerated life test Optimal test plan Reliability test
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基于HALT方法的光纤陀螺用Y波导可靠性试验研究
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作者 石运来 向强 +2 位作者 于怀勇 冯喆 吴衍记 《导航定位与授时》 CSCD 2024年第1期124-132,共9页
Y波导集成光学器件(以下简称Y波导)作为光纤陀螺的核心部件,其可靠性对光纤陀螺整体的可靠性有很大影响。为了快速作出Y波导的可靠性及寿命估计,使用高加速寿命试验(HALT)的方法开展Y波导可靠性和寿命估计的研究,研究环境因素(高温、快... Y波导集成光学器件(以下简称Y波导)作为光纤陀螺的核心部件,其可靠性对光纤陀螺整体的可靠性有很大影响。为了快速作出Y波导的可靠性及寿命估计,使用高加速寿命试验(HALT)的方法开展Y波导可靠性和寿命估计的研究,研究环境因素(高温、快速温变以及高湿等)对Y波导性能的影响,结果表明高温会显著影响Y波导性能,且Y波导的高温破坏极限为150℃,工作极限为130℃,主要影响的参数是插入损耗和分束比。使用120℃的条件进行Y波导的高加速寿命试验,得到Y波导在120℃的寿命约为1120 h,等效于25℃的93年寿命,并根据失效数量随时间的变化绘制出了可靠性浴盆曲线。完成了对Y波导的可靠性评估和寿命估计。 展开更多
关键词 可靠性 高加速寿命试验(Halt) Y波导 寿命估计
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Detonator stepping stress acceleration life test
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作者 郑波 张红星 王波 《Journal of Measurement Science and Instrumentation》 CAS 2013年第2期139-141,共3页
Through the failure mechanism analysi s and simulation test of a certain kind of detonator,this paper confirms the str ess level of the stepping stress acceleration life test of the detonator,and t hen e stablishes th... Through the failure mechanism analysi s and simulation test of a certain kind of detonator,this paper confirms the str ess level of the stepping stress acceleration life test of the detonator,and t hen e stablishes the data processing mathematical model and storage life forecasting m ethod.At last,according to the result of the stepping stress acceleration lif e test of the detonator,this paper forecasts the reliable storage life of the detonator under the normal stress level. 展开更多
关键词 弹药 引信技术 测试技术 测试设备
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