IEC 62059 Standards' Application in Reliability Prediction and Verification of Smart Meters

This article introduces the current situation of the smart then describes the relationship of meter reliability characteristics meter＇s reliability and the failure mechanisms at first, and combined with its Bathtub Curve. It also introduces both the feasible failure tree model for meter lifecycle prediction based on actual experiences and meter reliability prediction methodology by SN 29500 norms based on this model. This article also brings forward that it is necessary that the ＂Learning Factor＂ shall be adopted in meter reliability prediction for new materials, new process, and customized parts by referring to GJB/Z299C. Thereafter, this article also tries to apply IEC 62059 and JB/T 50070 to introduce the feasible method for the lifecycle prediction result verification by accelerated lifecycle test. Furthermore, the article also explores ways to increase the firmware reliability in smart meter.

Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It is essential to carry out the reliability modeling and predict the lifetime. In the present work, the accelerated lifetime testing method which is on account of the uniform design method was designed to obtain the degradation data under multiple environmental stresses of temperature and particulate contamination for electrical connectors. Based on the degradation data, the pseudo life can be acquired. Then the reliability model was established by analyzing the pseudo life. Accordingly, the reliability function and reliable lifetime function were set up, and the reliable lifetime of the connectors under the multiple environment stresses of temperature and particulate contamination could be predicted for electrical connectors,

Rapid evaluation method for the normal lifetime of an infrared light-emitting diode

： Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy

Statistical Inference for a Simple Step Stress Model with Competing Risks Based on Generalized Type-ⅠHybrid Censoring

This paper investigates a simple step-stress accelerated lifetime test(SSALT)model for the inferential analysis of exponential competing risks data.A generalized type-I hybrid censoring scheme is employed to improve the efficiency and controllability of the test.Firstly,the MLEs for parameters are established based on the cumulative exposure model(CEM).Then the conditional moment generating function(MGF)for unknown parameters is set up using conditional expectation and multiple integral techniques.Thirdly,confidence intervals(CIs)are constructed by the exact MGF-based method,the approximate normality-based method,and the bias-corrected and accelerated(BCa)percentile bootstrap method.Finally,we present simulation studies and an illustrative example to compare the performances of different methods.