To investigate the effect of Au thickness on evolution of AuSnx IMCs, pads with 0. 1, 0. 5 and 4. 0 μm thickness of Au surface finish were utilized. Laser reflowed solder joints were aged in 125℃ isothermal ovens. R...To investigate the effect of Au thickness on evolution of AuSnx IMCs, pads with 0. 1, 0. 5 and 4. 0 μm thickness of Au surface finish were utilized. Laser reflowed solder joints were aged in 125℃ isothermal ovens. Results indicated that little IMC formed at the interface of solder and pad with 0. 1 μm thickness of Au. Even in condition of 744 hours aging, thickness of lMCs did not increase obviously. As for the joints with 0. 5 μm thickness of Au, most of AuSn4 IMCs stayed at the inteornce and were in needle-like or dendritic morphology. With the increase of aging time, AuSn4 IMCs beeame flat and changed to a continuous layer. In the joints with 4. 0 μm thickness of Au on pads, AuSn, AuSn2, AuSn4 IMCs and Au2Sn phase formed at the interface. As aging time was increased, more Sn rich IMCs formed at the interface, and evolved to AuSn4 IMCs in condition of long time aging. Thickness of AuSn4 IMCs reached about 30μm.展开更多
The influence of thermal cycling on the microstructure and joint strength of Sn3.5Ag0.75Cu （SAC） and Sn63Pb37 （SnPb） solder joints was investigated. SAC and SnPb solder balls were soldered on 0.1 and 0.9 μm Au fi...The influence of thermal cycling on the microstructure and joint strength of Sn3.5Ag0.75Cu （SAC） and Sn63Pb37 （SnPb） solder joints was investigated. SAC and SnPb solder balls were soldered on 0.1 and 0.9 μm Au finished metallization, respectively. After 1000 thermal cycles between -40℃ and 125℃, a very thin intermetallic compound （IMC） layer containing Au, Sn, Ni, and Cu formed at the interface between SAC solder joints and underneath metallization with 0.1 μm Au finish, and （Au, Ni, Cu）Sn4 and a very thin AuSn-Ni-Cu IMC layer formed between SAC solder joints and underneath metallization with 0.9 μm Au finish. For SnPb solder joints with 0.1 μm Au finish, a thin （Ni, Cu, Au）3Sn4 IMC layer and a Pb-rich layer formed below and above the （Au, Ni）Sn4 IMC, respectively. Cu diffused through Ni layer and was involved into the IMC formation process. Similar interfacial microstructure was also found for SnPb solder joints with 0.9μm Au finish. The results of shear test show that the shear strength of SAC solder joints is consistently higher than that of SnPb eutectic solder joints during thermal cycling.展开更多
The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds（IMCs） layer（η-Cu6 Sn5 + e-Cu3 Sn） for various soldering t...The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds（IMCs） layer（η-Cu6 Sn5 + e-Cu3 Sn） for various soldering time and the influence of Bi addition on the thermal behavior of Sn-x Bi solder alloys were investigated. The Cu6 Sn5 IMC could be observed as long as the molten solder contacted with the Cu substrate. However, with the longer welding time such as 60 and 300 s, the Cu3 Sn IMC was formed at the interface between Cu6 Sn5 and Cu substrate. With the increase of soldering time, the thickness of total IMCs increased, meanwhile, the grain size of Cu6 Sn5 also increased. An appropriate amount of Bi element was beneficial for the growth of total IMCs,but excessive Bi（≥ 5 wt%） inhibited the growth of Cu6 Sn5 and Cu3 Sn IMC in Sn-x Bi/Cu microelectronic interconnects. Furthermore, with the Bi contents increasing（Sn-10 Bi solder in this present investigation）, some Bi particles accumulated at the interface between Cu6 Sn5 layer and the solder.展开更多
By means of adding low content of rare earth element La into Sn60 Pb40 solder alloy, the growth of Cu 6Sn 5 intermetallic compound at the interface of solder joint is hindered, and the thermal fatigue life of solde...By means of adding low content of rare earth element La into Sn60 Pb40 solder alloy, the growth of Cu 6Sn 5 intermetallic compound at the interface of solder joint is hindered, and the thermal fatigue life of solder joint is increased by 2 times. The results of thermodynamic calculation based on diffusion kinetics show that, the driving force for Cu 6Sn 5 growth is lowered by adding small content of La in Sn60 Pb40 solder alloy. Meanwhile, there is an effective local mole fraction range of La, in which, 0 18% is the limited value and 0 08% is the best value.展开更多
Different amounts of Fe(0.005,0.01,0.03,0.05,and 0.07 wt%)were added to SAC305 to study the shear behavior damage of Fe-doped SAC solder joints under thermal loading(170℃,holding time of 0,250,500,and 750 h).The resu...Different amounts of Fe(0.005,0.01,0.03,0.05,and 0.07 wt%)were added to SAC305 to study the shear behavior damage of Fe-doped SAC solder joints under thermal loading(170℃,holding time of 0,250,500,and 750 h).The results show that during isothermal aging at 170℃,the average shear force of all solder joints decreases with increasing aging time,while the average fracture energy first increases and then decreases,reaching a maximum at 500 h.Minor Fe doping could both increase shear forces and related fracture energy,with the optimum Fe doping amount being 0.03 wt%within the entire aging range.This is because the doping Fe reduces the undercooling of the SAC305 alloy,resulting in the microstructure refining of solder joints.This in turn causes the microstructure changing from network structure(SAC305 joint:eutectic network+β-Sn)to a single matrix structure(0.03Fe-doped SAC305 joint:β-Sn matrix+small compound particles).Specifically,Fe atoms can replace some Cu in Cu_(6)Sn_(5)(both inside the solder joint and at the interface),and then form(Cu,Fe)_(6)Sn_(5) compounds,resulting in an increase in the elastic modulus and nanohardness of the compounds.Moreover,the growth of Cu_(6)Sn_(5) and Cu_(3)Sn intermetallic compounds(IMC)layer are inhibited by Fe doping even after the aging time prolonging,and Fe aggregates near the interface compound to form FeSn_(2).This study is of great significance for controlling the growth of interfacial compounds,stabilizing the microstructures,and providing strengthening strategy for solder joint alloy design.展开更多
The microstructural evolution and inteffacial reaction of the Au/Sn/Au/Sn/Au/Sn/Au couples were investigated during annealing at 453, 523, and 543 K for up to 240 h. The Au/Sn combination formed a rapid diffusion syst...The microstructural evolution and inteffacial reaction of the Au/Sn/Au/Sn/Au/Sn/Au couples were investigated during annealing at 453, 523, and 543 K for up to 240 h. The Au/Sn combination formed a rapid diffusion system. Even in rolled Au-Sn solder, three phases, such as AuSn, AuSn2, and AuSn4, were formed. After initial annealing at 453 K, the diffusion layers of AuSn, AuSn2, and AuSn4, which were formed after rolling, expanded gradually and then fully transformed into phase （containing Sn from 10% to 18.5%, mole fraction） and 6 （AuSn） phase. As a whole, the microstmcture of the couple was stable during annealing at 453 K. The solid-state interracial reaction was much faster at 523 K than at 453 K. After annealing at 523 K for 6 h, the AuSn, AuSn2, and AuSn4 were fully transformed into the phase and phase （AuSn）. In spite of the prolonged annealing time for up to 240 h, no significant change of the interfacial microstructure occurred, and the microstructure of the couple was stable during annealing at 523 K. When annealing at 543 K, however, the interfacial of Au/Sn was transformed into solid-liquid state, and the whole couple formed a eutecfic structure rapidly, causing the solder to be brittle. The study results clearly demonstrate that the service temperature of the Au-Sn solder should be lower than 543 K.展开更多
An experimental study on the microstructures of a rapid directionally solidified metallo-eutectic Sn-Cu alloy was carried out. This material is an important alloy that is used as a lead-free solder. The results showed...An experimental study on the microstructures of a rapid directionally solidified metallo-eutectic Sn-Cu alloy was carried out. This material is an important alloy that is used as a lead-free solder. The results showed that the kinetic undercooling due to the rapid solidification process led to the formation of a pseudoeutectic zone, whereas the hypereutectic reaction produced the regular lamellar structure in the hypereutectic Sn-1.0Cu alloy. The corresponding arm spacing in the obtained lamellar phases decreased gradually with the increase of the applied cooling rate, which corresponded well with the prediction of a rapid directional solidification model.展开更多
基金Acknowledgement This work is finaneially supported by the National Natural Science Foundation of China （Grant No. 51005058）, National Hight- eeh R＆D Program （863 Program ） of China （Grant No. 2007AA04Z314） and Natural Scientific Research Innovation Foundation in Harbin Institute of Technology （ HIT. NSRIF. 2009037 ）.
文摘To investigate the effect of Au thickness on evolution of AuSnx IMCs, pads with 0. 1, 0. 5 and 4. 0 μm thickness of Au surface finish were utilized. Laser reflowed solder joints were aged in 125℃ isothermal ovens. Results indicated that little IMC formed at the interface of solder and pad with 0. 1 μm thickness of Au. Even in condition of 744 hours aging, thickness of lMCs did not increase obviously. As for the joints with 0. 5 μm thickness of Au, most of AuSn4 IMCs stayed at the inteornce and were in needle-like or dendritic morphology. With the increase of aging time, AuSn4 IMCs beeame flat and changed to a continuous layer. In the joints with 4. 0 μm thickness of Au on pads, AuSn, AuSn2, AuSn4 IMCs and Au2Sn phase formed at the interface. As aging time was increased, more Sn rich IMCs formed at the interface, and evolved to AuSn4 IMCs in condition of long time aging. Thickness of AuSn4 IMCs reached about 30μm.
文摘The influence of thermal cycling on the microstructure and joint strength of Sn3.5Ag0.75Cu （SAC） and Sn63Pb37 （SnPb） solder joints was investigated. SAC and SnPb solder balls were soldered on 0.1 and 0.9 μm Au finished metallization, respectively. After 1000 thermal cycles between -40℃ and 125℃, a very thin intermetallic compound （IMC） layer containing Au, Sn, Ni, and Cu formed at the interface between SAC solder joints and underneath metallization with 0.1 μm Au finish, and （Au, Ni, Cu）Sn4 and a very thin AuSn-Ni-Cu IMC layer formed between SAC solder joints and underneath metallization with 0.9 μm Au finish. For SnPb solder joints with 0.1 μm Au finish, a thin （Ni, Cu, Au）3Sn4 IMC layer and a Pb-rich layer formed below and above the （Au, Ni）Sn4 IMC, respectively. Cu diffused through Ni layer and was involved into the IMC formation process. Similar interfacial microstructure was also found for SnPb solder joints with 0.9μm Au finish. The results of shear test show that the shear strength of SAC solder joints is consistently higher than that of SnPb eutectic solder joints during thermal cycling.
基金Funded by the National Natural Science Foundation of China(No.51465039)Natural Science Foundation of Jiangxi Province(No.20151BAB206041,20161BAB206122)Fund of the State Key Laboratory of Solidification Processing in NWPU(No.SKLSP201508)
文摘The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds（IMCs） layer（η-Cu6 Sn5 + e-Cu3 Sn） for various soldering time and the influence of Bi addition on the thermal behavior of Sn-x Bi solder alloys were investigated. The Cu6 Sn5 IMC could be observed as long as the molten solder contacted with the Cu substrate. However, with the longer welding time such as 60 and 300 s, the Cu3 Sn IMC was formed at the interface between Cu6 Sn5 and Cu substrate. With the increase of soldering time, the thickness of total IMCs increased, meanwhile, the grain size of Cu6 Sn5 also increased. An appropriate amount of Bi element was beneficial for the growth of total IMCs,but excessive Bi（≥ 5 wt%） inhibited the growth of Cu6 Sn5 and Cu3 Sn IMC in Sn-x Bi/Cu microelectronic interconnects. Furthermore, with the Bi contents increasing（Sn-10 Bi solder in this present investigation）, some Bi particles accumulated at the interface between Cu6 Sn5 layer and the solder.
文摘By means of adding low content of rare earth element La into Sn60 Pb40 solder alloy, the growth of Cu 6Sn 5 intermetallic compound at the interface of solder joint is hindered, and the thermal fatigue life of solder joint is increased by 2 times. The results of thermodynamic calculation based on diffusion kinetics show that, the driving force for Cu 6Sn 5 growth is lowered by adding small content of La in Sn60 Pb40 solder alloy. Meanwhile, there is an effective local mole fraction range of La, in which, 0 18% is the limited value and 0 08% is the best value.
基金supported by the Yunnan Fundamental Research Projects(No.202301BC070001-001)funded by the Yunnan Provincial Department of Science and Technologythe Yunnan Provincial Science and Technology Plan Project(No.202005AF150045)+1 种基金the Jiangsu Province Industry-University-Research Cooperation Project(No.BY2022832)funded by the Jiangsu Provincial Department of Science and Technologythe National Natural Science Foundation of China(No.52275339).
文摘Different amounts of Fe(0.005,0.01,0.03,0.05,and 0.07 wt%)were added to SAC305 to study the shear behavior damage of Fe-doped SAC solder joints under thermal loading(170℃,holding time of 0,250,500,and 750 h).The results show that during isothermal aging at 170℃,the average shear force of all solder joints decreases with increasing aging time,while the average fracture energy first increases and then decreases,reaching a maximum at 500 h.Minor Fe doping could both increase shear forces and related fracture energy,with the optimum Fe doping amount being 0.03 wt%within the entire aging range.This is because the doping Fe reduces the undercooling of the SAC305 alloy,resulting in the microstructure refining of solder joints.This in turn causes the microstructure changing from network structure(SAC305 joint:eutectic network+β-Sn)to a single matrix structure(0.03Fe-doped SAC305 joint:β-Sn matrix+small compound particles).Specifically,Fe atoms can replace some Cu in Cu_(6)Sn_(5)(both inside the solder joint and at the interface),and then form(Cu,Fe)_(6)Sn_(5) compounds,resulting in an increase in the elastic modulus and nanohardness of the compounds.Moreover,the growth of Cu_(6)Sn_(5) and Cu_(3)Sn intermetallic compounds(IMC)layer are inhibited by Fe doping even after the aging time prolonging,and Fe aggregates near the interface compound to form FeSn_(2).This study is of great significance for controlling the growth of interfacial compounds,stabilizing the microstructures,and providing strengthening strategy for solder joint alloy design.
文摘The microstructural evolution and inteffacial reaction of the Au/Sn/Au/Sn/Au/Sn/Au couples were investigated during annealing at 453, 523, and 543 K for up to 240 h. The Au/Sn combination formed a rapid diffusion system. Even in rolled Au-Sn solder, three phases, such as AuSn, AuSn2, and AuSn4, were formed. After initial annealing at 453 K, the diffusion layers of AuSn, AuSn2, and AuSn4, which were formed after rolling, expanded gradually and then fully transformed into phase （containing Sn from 10% to 18.5%, mole fraction） and 6 （AuSn） phase. As a whole, the microstmcture of the couple was stable during annealing at 453 K. The solid-state interracial reaction was much faster at 523 K than at 453 K. After annealing at 523 K for 6 h, the AuSn, AuSn2, and AuSn4 were fully transformed into the phase and phase （AuSn）. In spite of the prolonged annealing time for up to 240 h, no significant change of the interfacial microstructure occurred, and the microstructure of the couple was stable during annealing at 523 K. When annealing at 543 K, however, the interfacial of Au/Sn was transformed into solid-liquid state, and the whole couple formed a eutecfic structure rapidly, causing the solder to be brittle. The study results clearly demonstrate that the service temperature of the Au-Sn solder should be lower than 543 K.
基金This work was financially supported by the National Natural Science Foundation of China (No. 50401003), Fok Ying Tong Education Foundation (No. 104015), and the Natural Science Foundation of Tianjin City (No. 033608811).
文摘An experimental study on the microstructures of a rapid directionally solidified metallo-eutectic Sn-Cu alloy was carried out. This material is an important alloy that is used as a lead-free solder. The results showed that the kinetic undercooling due to the rapid solidification process led to the formation of a pseudoeutectic zone, whereas the hypereutectic reaction produced the regular lamellar structure in the hypereutectic Sn-1.0Cu alloy. The corresponding arm spacing in the obtained lamellar phases decreased gradually with the increase of the applied cooling rate, which corresponded well with the prediction of a rapid directional solidification model.
