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Sensitivity analysis of pull-in voltage for RF MEMS switch based on modified couple stress theory 被引量:1
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作者 Junhua ZHU Renhuai LIU 《Applied Mathematics and Mechanics(English Edition)》 SCIE EI CSCD 2015年第12期1555-1568,共14页
An approximate analytical model for calculating the pull-in voltage of a stepped cantilever-type radio frequency (RF) micro electro-mechanical system (MEMS) switch is developed based on the Euler-Bernoulli beam an... An approximate analytical model for calculating the pull-in voltage of a stepped cantilever-type radio frequency (RF) micro electro-mechanical system (MEMS) switch is developed based on the Euler-Bernoulli beam and a modified couple stress theory, and is validated by comparison with the finite element results. The sensitivity functions of the pull-in voltage to the designed parameters are derived based on the proposed model. The sensitivity investigation shows that the pull-in voltage sensitivities increase/decrease nonlinearly with the increases in the designed parameters. For the stepped cantilever beam, there exists a nonzero optimal dimensionless length ratio, where the pull-in voltage is insensitive. The optimal value of the dimensionless length ratio only depends on the dimensionless width ratio, and can be obtained by solving a nonlinear equation. The determination of the designed parameters is discussed, and some recommendations are made for the RF MEMS switch optimization. 展开更多
关键词 stepped cantilever beam pull-in voltage modified couple stress theory radio frequency (RF) micro electro-mechanical system (MEMS) switch analytical solution sensitivity analysis
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