Analytical solutions of uniform extended dislocations and tractions over a circular area in anisotropic magnetoelectroelastic bimaterials

In this paper, we derive the analytical solutions in a three-dimensional anisotropic magnetoelectroelastic bimaterial space subject to uniform extended dislocations and tractions within a horizontal circular area. By virtue of the Stroh formalism and Fourier transformation, the final expression of solutions in the physical domain contains only line integrals over [0, 2π] rather than infinite integrals. As the reduced cases, the half-space and homogeneous full-space solutions can be directly derived from the present solutions. Also, in terms of material domains, the present solutions can be reduced to the piezoelectric, piezomagnetic, purely elastic materials with different symmetries of material prop- erty. To carry out numerical calculations, Gauss quadrature is adopted. In the numerical examples, the effect of different loading locations on the response at the interface is analyzed. It is shown that, when the magnetic traction or electric dislocation is applied, the physical quantities on the interface may not decrease monotonically as the loading area moves away from the interface. The distributions of different in-plane physical quantities on the upper and lower interfaces under various extended horizontal loadings are compared and the differences are discussed. The work presented in this paper can serve as benchmarks for future numerical studies in related research fields.

A moving screw dislocation near interfacial rigid lines in two dissimilar anisotropic media

This paper attempts to investigate the problem for the interaction between a uniformly moving screw dislocation and interface rigid lines in two dissimilar.anisotropic. materials. Integrating Riemann-Schwarz＇s symmetry principle with the analysis singularity of complex functions, we present the general elastic solutions of this problem and the closed form solutions for interfaces containing one and two rigid lines. The expressions of stress intensity factors, at the rigid line tips and image force acting on moving dislocation are derived explicitly. The results show that dislocation velocity has an antishielding effect on the rigid line tip and a larger dislocation velocity leads to the equilibrium position of dislocation closing with the rigid line. The presented solutions contain previously known results as the special cases.

Modeling core-spreading of interface dislocation and its elastic response in anisotropic bimaterial

Interracial dislocation may have a spreading core corresponding to a weak shear resistance of interfaces. In this paper, a conic model is proposed to mimic the spreading core of interfacial dislocation in anisotropic bimaterials. By the Stroh formalism and Green＇s function, the analytical expressions of the elastic fields are deduced for such a dislocation. Taking Cu/Nb bimaterial as an example, it is demonstrated that the accuracy and efficiency of the method are well validated by the interface conditions, a spreading core can greatly reduce the stress intensity near the interfacial dislocation compared with the compact core, and the elastic fields near the spreading core region are significantly different from the condensed core, while they are less sensitive to a field point that is 1.5 times the core width away from the center of the spreading core.

FURTHER INVESTIGATION OF INTERACTION BETWEEN INTERFACE MACROCRACK AND PARALLEL MICROCRACKS IN BIMATERIAL ANISOTROPIC SOLIDS

In this paper, with the aid of superimposing technique and the Pseudo Traction Method (PTM), the interaction problem between an interface macrocrack and parallel microcracks in the process zone in bimaterial anisotropic solids is reduced to a system of integral equations. After the integral equations are solved numerically, a conservation law among three kinds ofJ-integrals is obtained which are induced from the interface macrocrack tip, the microcrack and the remote field, respectively. This conservation law reveals that the microcrack shielding effect in such materials could be considered as the redistribution of the remoteJ-integral.