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Atomic and close-to-atomic scale manufacturing: perspectives and measures 被引量:15
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作者 Fengzhou Fang 《International Journal of Extreme Manufacturing》 2020年第3期2-15,共14页
This article presents the three paradigms of manufacturing advancement:Manufacturing I,craft-based manufacturing by hand,as in the Stone,Bronze,and Iron Ages,in which manufacturing precision was at the millimeter scal... This article presents the three paradigms of manufacturing advancement:Manufacturing I,craft-based manufacturing by hand,as in the Stone,Bronze,and Iron Ages,in which manufacturing precision was at the millimeter scale;ManufacturingⅡ,precision-controllable manufacturing using machinery whereby the scales of material removal,migration,and addition were reduced from millimeters to micrometers and even nanometers;and Manufacturing Ⅲ,manufacturing objectives and processes are directly focused on atoms,spanning the macro-through the micro-to the nanoscale,whereby manufacturing is based on removal,migration,and addition at the atomic scale,namely,atomic and close-to-atomic scale manufacturing(ACSM).A typical characteristic of ACSM is that energy directly impacts the atom to be removed,migrated,and added.ACSM,as the next generation of manufacturing technology,will be employed to build atomic-scale features for required functions and performance with the capacity of mass production.It will be the leading development trend in manufacturing technology and will play a significant role in the manufacturing of high-end components and future products. 展开更多
关键词 atomic and close-to-atomic scale ACSM manufacturing HI development trend
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Towards atomic and close-to-atomic scale manufacturing 被引量:8
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作者 Fengzhou Fang Nan Zhang +4 位作者 Dongming Guo Kornel Ehmann Benny Cheung Kui Liu Kazuya Yamamura 《International Journal of Extreme Manufacturing》 2019年第1期4-36,共33页
Human beings have witnessed unprecedented developments since the 1760s using precision tools and manufacturing methods that have led to ever-increasing precision,from millimeter to micrometer,to single nanometer,and t... Human beings have witnessed unprecedented developments since the 1760s using precision tools and manufacturing methods that have led to ever-increasing precision,from millimeter to micrometer,to single nanometer,and to atomic levels.The modes of manufacturing have also advanced from craft-based manufacturing in the Stone,Bronze,and Iron Ages to precisioncontrollable manufacturing using automatic machinery.In the past 30 years,since the invention of the scanning tunneling microscope,humans have become capable of manipulating single atoms,laying the groundwork for the coming era of atomic and close-to-atomic scale manufacturing(ACSM).Close-to-atomic scale manufacturing includes all necessary steps to convert raw materials,components,or parts into products designed to meet the user’s specifications.The processes involved in ACSM are not only atomically precise but also remove,add,or transform work material at the atomic and close-to-atomic scales.This review discusses the history of the development of ACSM and the current state-of-the-art processes to achieve atomically precise and/or atomic-scale manufacturing.Existing and future applications of ACSM in quantum computing,molecular circuitry,and the life and material sciences are also described.To further develop ACSM,it is critical to understand the underlying mechanisms of atomic-scale and atomically precise manufacturing;develop functional devices,materials,and processes for ACSM;and promote high throughput manufacturing. 展开更多
关键词 atomic and close-to-atomic scale ACSM manufacturing metrology single-atom manipulation
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Proposition of atomic and close-to-atomic scale manufacturing
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作者 Ju‑Fan Zhang Jens Ducree 《Advances in Manufacturing》 SCIE EI CAS CSCD 2024年第1期1-5,共5页
Atomic and close-to-atomic scale manufacturing(ACSM)is the core competence of Manufacturing III.Unlike other conceptions or terminologies that only focus on the atomic level precision,ACSM defnes a new realm of manufa... Atomic and close-to-atomic scale manufacturing(ACSM)is the core competence of Manufacturing III.Unlike other conceptions or terminologies that only focus on the atomic level precision,ACSM defnes a new realm of manufacturing where quantum mechanics plays the dominant role in the atom/molecule addition,migration and removal,considering the uncertainty principle and the discrete nature of particles.As ACSM is still in its infant stage,only little has been systematically elaborated at the core proposition of ACSM by now,hence there is a need to understand its concept and vision.This article elucidates the development of ACSM and clarifes its proposition,which aims to achieve a clearer understanding on ACSM and direct more efective eforts toward this promising area. 展开更多
关键词 atomic and close-to-atomic scale manufacturing(ACSM) atomic Precision manufacturing PARADIGM manufacturing III
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Laser machining fundamentals:micro,nano,atomic and close-to-atomic scales 被引量:5
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作者 Jinshi Wang Fengzhou Fang +4 位作者 Haojie An Shan Wu Huimin Qi Yuexuan Cai Guanyu Guo 《International Journal of Extreme Manufacturing》 SCIE EI CAS CSCD 2023年第1期125-151,共27页
With the rapid development in advanced industries,such as microelectronics and optics sectors,the functional feature size of devises/components has been decreasing from micro to nanometric,and even ACS for higher perf... With the rapid development in advanced industries,such as microelectronics and optics sectors,the functional feature size of devises/components has been decreasing from micro to nanometric,and even ACS for higher performance,smaller volume and lower energy consumption.By this time,a great many quantum structures are proposed,with not only an extreme scale of several or even single atom,but also a nearly ideal lattice structure with no material defect.It is almost no doubt that such structures play critical role in the next generation products,which shows an urgent demand for the ACSM.Laser machining is one of the most important approaches widely used in engineering and scientific research.It is high-efficient and applicable for most kinds of materials.Moreover,the processing scale covers a huge range from millimeters to nanometers,and has already touched the atomic level.Laser–material interaction mechanism,as the foundation of laser machining,determines the machining accuracy and surface quality.It becomes much more sophisticated and dominant with a decrease in processing scale,which is systematically reviewed in this article.In general,the mechanisms of laser-induced material removal are classified into ablation,CE and atomic desorption,with a decrease in the scale from above microns to angstroms.The effects of processing parameters on both fundamental material response and machined surface quality are discussed,as well as theoretical methods to simulate and understand the underlying mechanisms.Examples at nanometric to atomic scale are provided,which demonstrate the capability of laser machining in achieving the ultimate precision and becoming a promising approach to ACSM. 展开更多
关键词 laser machining mechanism atomic and close-to-atomic scale manufacturing ACSM manufacturing III
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Atomic and Close-to-Atomic Scale Manufacturing:A Review on Atomic Layer Removal Methods Using Atomic Force Microscopy 被引量:11
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作者 Paven Thomas Mathew Brian J.Rodriguez Fengzhou Fang 《Nanomanufacturing and Metrology》 2020年第3期167-186,共20页
Manufacturing at the atomic scale is the next generation of the industrial revolution.Atomic and close-to-atomic scalemanufacturing(ACSM)helps to achieve this.Atomic force microscopy(AFM)is a promising method for this... Manufacturing at the atomic scale is the next generation of the industrial revolution.Atomic and close-to-atomic scalemanufacturing(ACSM)helps to achieve this.Atomic force microscopy(AFM)is a promising method for this purposesince an instrument to machine at this small scale has not yet been developed.As the need for increasing the number ofelectronic components inside an integrated circuit chip is emerging in the present-day scenario,methods should be adoptedto reduce the size of connections inside the chip.This can be achieved using molecules.However,connecting moleculeswith the electrodes and then to the external world is challenging.Foundations must be laid to make this possible for thefuture.Atomic layer removal,down to one atom,can be employed for this purpose.Presently,theoretical works are beingperformed extensively to study the interactions happening at the molecule-electrode junction,and how electronic transportis affected by the functionality and robustness of the system.These theoretical studies can be verified experimentally only if nano electrodes are fabricated.Silicon is widely used in the semiconductor industry to fabricate electronic components.Likewise,carbon-based materials such as highly oriented pyrolytic graphite,gold,and silicon carbide find applications inthe electronic device manufacturing sector.Hence,ACSM of these materials should be developed intensively.This paperpresents a review on the state-of-the-art research performed on material removal at the atomic scale by electrochemical andmechanical methods of the mentioned materials using AFM and provides a roadmap to achieve effective mass productionof these devices. 展开更多
关键词 atomic force microscopy atomic-scale manufacturing Molecular scale devices ELECTROCHEMISTRY ACSM manufacturing
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A combined multiscale modeling and experimental study on surface modification of high-volume micro-nanoparticles with atomic accuracy 被引量:4
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作者 Zoushuang Li Junren Xiang +4 位作者 Xiao Liu Xiaobo Li Lijie Li Bin Shan Rong Chen 《International Journal of Extreme Manufacturing》 SCIE EI 2022年第2期129-144,共16页
Surface modification for micro-nanoparticles at the atomic and close-to-atomic scales is of great importance to enhance their performance in various applications,including high-volume battery,persistent luminescence,e... Surface modification for micro-nanoparticles at the atomic and close-to-atomic scales is of great importance to enhance their performance in various applications,including high-volume battery,persistent luminescence,etc.Fluidized bed atomic layer deposition(FB-ALD)is a promising atomic-scale manufacturing technology that offers ultrathin films on large amounts of particulate materials.Nevertheless,nanoparticles tend to agglomerate due to the strong cohesive forces,which is much unfavorable to the film conformality and also hinders their real applications.In this paper,the particle fluidization process in an ultrasonic vibration-assisted FB-ALD reactor is numerically investigated from micro-scale to macro-scale through the multiscale computational fluid dynamics and discrete element method(CFD-DEM)modeling with experimental verification.Various vibration amplitudes and frequencies are investigated in terms of their effects on the fluid dynamics,distribution of particle velocity and solid volume fraction,as well as the size of agglomerates.Results show that the fluid turbulent kinetic energy,which is the key power source for the particles to obtain the kinetic energy for overcoming the interparticle agglomeration forces,can be strengthened obviously by the ultrasonic vibration.Besides,the application of ultrasonic vibration is found to reduce the mean agglomerate size in the FB.This is bound to facilitate the heat transfer and precursor diffusion in the entire FB-ALD reactor and the agglomerates,which can largely shorten the coating time and improve the film conformality as well as precursor utilization.The simulation results also agree well with our battery experimental results,verifying the validity of the multiscale CFD-DEM model.This work has provided momentous guidance to the mass manufacturing of atomic-scale particle coating from lab-scale to industrial applications. 展开更多
关键词 atomic scale manufacturing fluidized bed atomic layer deposition(FB-ALD) computational fluid dynamics and discrete element method(CFD-DEM) nanoparticle agglomerates ultrasonic vibration
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Study on Mechanisms of Photon-Induced Material Removal on Silicon at Atomic and Close-to-Atomic Scale 被引量:1
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作者 Peizhi Wang Jinshi Wang Fengzhou Fang 《Nanomanufacturing and Metrology》 2021年第4期216-225,共10页
This paper presents a new approach for material removal on silicon at atomic and close-to-atomic scale assisted by photons.The corresponding mechanisms are also investigated.The proposed approach consists of two seque... This paper presents a new approach for material removal on silicon at atomic and close-to-atomic scale assisted by photons.The corresponding mechanisms are also investigated.The proposed approach consists of two sequential steps:surface modification and photon irradiation.The back bonds of silicon atoms are first weakened by the chemisorption of chlorine and then broken by photon energy,leading to the desorption of chlorinated silicon.The mechanisms of photon-induced desorption of chlorinated silicon,i.e.,SiCl_(2) and SiCl,are explained by two models:the Menzel-Gomer-Redhead(MGR)and Antoniewicz models.The desorption probability associated with the two models is numerically calculated by solving the Liouville-von Neumann equations for open quantum systems.The calculation accuracy is verified by comparison with the results in literatures in the case of the NO/Pt(111)system.The calculation method is then applied to the cases of SiCl_(2)/Si and SiCl/Si systems.The results show that the value of desorption probability first increases dramatically and then saturates to a stable value within hundreds of femtoseconds after excitation.The desorption probability shows a super-linear dependence on the lifetime of excited states. 展开更多
关键词 atomic and close-to-atomic scale manufacturing ACSM Surface chlorination Photon-induced desorption SILICON
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Material removal at atomic and close-to-atomic scale by highenergy photon:a case study using atomistic-continuum method
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作者 Hao-Jie An Jin-Shi Wang Feng-Zhou Fang 《Advances in Manufacturing》 SCIE EI CAS CSCD 2022年第1期59-71,共13页
Extreme ultraviolet(EUV)light plays an important role in various fields such as material characterization and semiconductor manufacturing.It is also a potential approach in material fabrication at atomic and close-to-... Extreme ultraviolet(EUV)light plays an important role in various fields such as material characterization and semiconductor manufacturing.It is also a potential approach in material fabrication at atomic and close-to-atomic scales.However,the material removal mechanism has not yet been fully understood.This paper studies the interaction of a femtosecond EUV pulse with monocrystalline silicon using molecular dynamics(MD)coupled with a two-temperature model(TTM).The photoionization mechanism,an important process occurring at a short wavelength,is introduced to the simulation and the results are compared with those of the traditional model.Dynamical processes including photoionization,atom desorption,and laser-induced shockwave are discussed under various fluencies,and the possibility of single atomic layer removal is explored.Results show that photoionization and the corresponding bond breakage are the main reasons of atom desorption.The method developed can be further employed to investigate the interaction between high-energy photons and the material at moderate fluence. 展开更多
关键词 Extreme ultraviolet(EUV) Molecular dynamics(MD) Two-temperature model(TTM)Photoionization atomic and close-to-atomic scale manufacturing(ACSM)
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制造发展的三个范式:制造发展规律的研究
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作者 房丰洲 赖敏 +11 位作者 王金石 吕鹏 于楠 罗熙淳 胡春光 陈远流 陈磊 邓辉 徐涛 康城玮 韩伟 冯俊元 《中国科学基金》 CSCD 北大核心 2024年第1期159-171,共13页
基于对人类社会发展历史和科学技术发展内在规律的认识,本文详细分析了制造发展的三个范式,论证了原子及近原子尺度制造是制造范式III的核心使能技术。文章回顾了国内外各机构对原子级制造研发规划现状,指出我国目前处于原子级制造技术... 基于对人类社会发展历史和科学技术发展内在规律的认识,本文详细分析了制造发展的三个范式,论证了原子及近原子尺度制造是制造范式III的核心使能技术。文章回顾了国内外各机构对原子级制造研发规划现状,指出我国目前处于原子级制造技术发展的重要战略机遇期,并从设计、材料、加工和检测等角度分析了原子级制造的技术体系内涵;梳理了原子级表面制造、原子级结构制造、原子级测量与表征等领域的研究进展,呈现了当前具有原子级制造能力的部分代表性技术,包括原子级切削、原子级抛光、电化学加工、等离子体原子级加工技术、原子精准操控以及原子分辨测量与表征技术,并对原子级制造战略规划提出发展建议。 展开更多
关键词 制造技术发展趋势 制造范式 原子及近原子尺度制造 原子精度制造 原子级制造
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原子精度制造新原理和新方法
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作者 张振宇 李琳 +16 位作者 巨阳 陈云飞 许剑锋 闫永达 徐飞飞 周天丰 段辉高 黄志权 徐凯臣 朱吴乐 彭小强 邓辉 司伟 王吉 王金石 吕鹏 冯俊元 《中国科学基金》 CSCD 北大核心 2024年第1期146-158,共13页
目前航空航天、核物理、微电子、光电子和半导体等国家战略领域高性能装备的性能需求日渐严苛,核心零部件的制造精度必须迈进原子级水平,亟需研究原子精度的高性能制造新原理和新方法。本文归纳并提出了目前迫切需求的原子级表面精度、... 目前航空航天、核物理、微电子、光电子和半导体等国家战略领域高性能装备的性能需求日渐严苛,核心零部件的制造精度必须迈进原子级水平,亟需研究原子精度的高性能制造新原理和新方法。本文归纳并提出了目前迫切需求的原子级表面精度、原子级结构精度、原子级损伤控制以及原子级特征尺寸结构创成四大原子精度制造核心能力,从能场辅助原子级切削、多能场辅助原子有序排布、表面能弱化原子精度材料去除以及超光学衍射极限的原子精度制造四大方向进行系统梳理,介绍了面向不同应用场景的原子精度制造新原理和新方法的研究现状,并概述了各类方法的优势和缺点,从中提炼出多能场耦合条件下的能量和原子间相互作用机理这一关键科学问题,并从四大方向上对未来我国原子级制造的基础研究提出了建议。 展开更多
关键词 原子精度制造 原子级切削 原子有序排布 表面能弱化加工 超光学衍射极限加工
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Cutting of Graphite at Atomic and Close-to-Atomic Scale Using Flexible Enhanced Molecular Dynamics 被引量:1
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作者 Jinshi Wang Fengzhou Fang Luan Li 《Nanomanufacturing and Metrology》 EI 2022年第3期240-249,共10页
Atomic and close-to-atomic scale manufacturing is the key technology for the production of next-generation devices with atomic precision.As an important approach of mechanical processing,cutting has evolved as a poten... Atomic and close-to-atomic scale manufacturing is the key technology for the production of next-generation devices with atomic precision.As an important approach of mechanical processing,cutting has evolved as a potential candidate to generate an atomically smooth surface;thus,exploring its ultimate capability is significant.In this paper,single-crystal graphite,whose lattice structure and chemical bond property are of representation for demonstration,is selected to study the mechanism of atomic layer removal using molecular dynamics.A localized workpiece,which is dynamically updated on the basis of the tool position,is used to improve the computation efficiency.The principle and bullet points of this modeling method are first introduced,followed by a series of simulations under various undeformed chip thicknesses and tool edge radi.In addition,different potentials for the tool-workpiece interaction are tested,and the effect on the material response is presented.Based on the analysis of deformation,the number of carbon layers removed,and cutting forces,the chip formation mechanism and further understanding of the controllability of cutting at atomic and close-to-atomic scale can be achieved. 展开更多
关键词 atomic and close-to-atomic scale CUTTING Enhanced molecular dynamics GRAPHITE ACSM
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原子及近原子尺度制造——制造技术发展趋势 被引量:14
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作者 房丰洲 《中国机械工程》 EI CAS CSCD 北大核心 2020年第9期1009-1021,共13页
探讨了制造技术发展趋势,论述了制造历史发展的三个阶段,指出原子及近原子尺度制造(ACSM)是下一代制造技术的主流发展趋势,对未来科技发展和高端元件制造具有重要意义。详细分析阐述了ACSM的主要研究内容及关键科学问题,并提出了相应的... 探讨了制造技术发展趋势,论述了制造历史发展的三个阶段,指出原子及近原子尺度制造(ACSM)是下一代制造技术的主流发展趋势,对未来科技发展和高端元件制造具有重要意义。详细分析阐述了ACSM的主要研究内容及关键科学问题,并提出了相应的建议和措施。 展开更多
关键词 原子及近原子尺度 原子及近原子尺度制造 制造Ⅲ 制造技术发展趋势
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Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching 被引量:2
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作者 Wei Han Paven Thomas Mathew +2 位作者 Srikanth Kolagatla Brian J.Rodriguez Fengzhou Fang 《Nanomanufacturing and Metrology》 EI 2022年第1期32-38,共7页
Atomic force microscopy(AFM)-based electrochemical etching of a highly oriented pyrolytic graphite(HOPG)surface is studied toward the single-atomic-layer lithography of intricate patterns.Electrochemical etching is pe... Atomic force microscopy(AFM)-based electrochemical etching of a highly oriented pyrolytic graphite(HOPG)surface is studied toward the single-atomic-layer lithography of intricate patterns.Electrochemical etching is performed in the water meniscus formed between the AFM tip apex and HOPG surface due to a capillary effect under controlled high relative humid-ity(~75%)at otherwise ambient conditions.The conditions to etch nano-holes,nano-lines,and other intricate patterns are investigated.The clectrochemical reactions of HOPG etching should not generatc debris duc to the conversion of graphite to gaseous CO and CO_(2)based on etching reactions.However,debris is observed on the etched HOPG surface,and incom-plete gasification of carbon occurs during the etching process,resulting in the generation of solid intermediates.Moreover,the applied potential is of critical importance for precise etching,and the precision is also significantly influenced by the AFM tip wear.This study shows that the AFM-based electrochemical etching has the potential to remove the material in a single-atomic-layer precision.This result is likely because the etching process is based on anodic dissolution,resulting in the material removal atom by atom. 展开更多
关键词 ETCHING LITHOGRAPHY Electrochemical machining atomic and close-to-atomic scale manufacturing(ACSM)
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原子尺度构建二维材料的第一性原理计算研究 被引量:6
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作者 刘子媛 潘金波 +1 位作者 张余洋 杜世萱 《物理学报》 SCIE EI CAS CSCD 北大核心 2021年第2期135-148,共14页
随着信息技术的不断进步,核心元器件朝着运行速度更快、能耗更低、尺寸更小的方向快速发展.尺寸不断减小导致的量子尺寸效应使得材料和器件呈现出许多与传统三维体系不同的新奇物性.从原子结构出发,预测低维材料物性、精准合成、表征、... 随着信息技术的不断进步,核心元器件朝着运行速度更快、能耗更低、尺寸更小的方向快速发展.尺寸不断减小导致的量子尺寸效应使得材料和器件呈现出许多与传统三维体系不同的新奇物性.从原子结构出发,预测低维材料物性、精准合成、表征、调控并制造性能良好的电子器件,对未来电子器件的发展及相关应用具有至关重要的意义.理论计算能在保持原子级准确度的情况下高效、低耗地预测材料结构、物性、界面效应等,是原子制造技术中不可或缺的重要研究手段.本综述从第一性原理计算角度出发,回顾了近年来其在二维材料结构探索、物性研究和异质结构造等方面的应用及取得的重要进展,并展望了在原子尺度制造背景下二维材料的发展前景. 展开更多
关键词 原子制造 二维材料 第一性原理计算
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面向近原子尺度制造的光学测量精度极限分析 被引量:2
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作者 战海洋 邢飞 张利 《物理学报》 SCIE EI CAS CSCD 北大核心 2021年第6期44-52,共9页
纳米级乃至更高精度的测量是原子及近原子尺度制造技术发展的基础和保障.光学测量具有精度高、测量范围广、测量直观等优点,其对单个成像光斑中心的定位可达远超衍射极限的精度.但由于光本身散粒噪声、探测器暗电流噪声等随机性的存在,... 纳米级乃至更高精度的测量是原子及近原子尺度制造技术发展的基础和保障.光学测量具有精度高、测量范围广、测量直观等优点,其对单个成像光斑中心的定位可达远超衍射极限的精度.但由于光本身散粒噪声、探测器暗电流噪声等随机性的存在,光学测量存在精度极限.本文基于克拉美罗下界理论发展了可适用于任意强度分布像斑的精度极限计算方法,并以典型艾里斑为例,分析了成像过程中反映信噪比、能量集中度、计算方式的参数对定位精度极限的影响规律并给出提高精度的建议和结论.对实验所得像斑进行了精度极限计算,验证了所得结论对类似艾里斑的像斑的适用性.研究为原子及近原子尺度制造过程中光学测量的应用和优化提供了分析方法和理论指导. 展开更多
关键词 原子制造 光学测量 精度极限
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面向单晶SiC原子级表面制造的等离子体辅助抛光技术 被引量:7
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作者 吉建伟 山村和也 邓辉 《物理学报》 SCIE EI CAS CSCD 北大核心 2021年第6期252-264,共13页
目前Si基半导体由于其自身材料特性的限制,已经越来越难以满足高速发展的现代电力电子技术对半导体器件的性能要求.SiC作为新一代半导体材料具有显著的性能优势,但由于其属于典型的难加工材料,实现SiC晶圆的高质量与高效率加工成为了推... 目前Si基半导体由于其自身材料特性的限制,已经越来越难以满足高速发展的现代电力电子技术对半导体器件的性能要求.SiC作为新一代半导体材料具有显著的性能优势,但由于其属于典型的难加工材料,实现SiC晶圆的高质量与高效率加工成为了推动其产业化应用进程的关键.本综述在回顾近年来SiC超精密加工技术研究进展的基础上,重点介绍了一种基于等离子体氧化改性的SiC高效超精密抛光技术,分析了该技术的材料去除机理、典型装置、改性过程及抛光效果.分析结果表明,该技术具有较高的去除效率,能够获得原子级平坦表面,并且不会产生亚表面损伤.同时针对表面改性辅助抛光技术加工SiC表面过程中出现的台阶现象,探讨了该台阶结构的产生机理及调控策略.最后对等离子体辅助抛光技术的发展与挑战进行了展望. 展开更多
关键词 单晶SiC 原子及近原子尺度制造 等离子体 表面改性
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原子制造的物质科学基础
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作者 戴庆 宋凤麒 +13 位作者 潘曹峰 刘开辉 姚广保 郑浩 谭元植 潘金波 杜灵杰 黄璞 王曾晖 陈辉 张晨栋 费付聪 徐红星 戴亚飞 《科学通报》 EI CAS CSCD 北大核心 2024年第19期2777-2788,共12页
近年来,原子制造技术备受关注,已成为各国积极追求的前沿制造技术领域.一代物质科学,一代制造革新,原子制造技术的发展不仅仰赖于深厚的物质科学底蕴,还需要解决高效的原子精准操控与测量、原子尺度结构的物性设计等多个方面的基础科学... 近年来,原子制造技术备受关注,已成为各国积极追求的前沿制造技术领域.一代物质科学,一代制造革新,原子制造技术的发展不仅仰赖于深厚的物质科学底蕴,还需要解决高效的原子精准操控与测量、原子尺度结构的物性设计等多个方面的基础科学问题.2023年3月,国家自然科学基金委员会交叉科学部在武汉召开了主题为“原子制造的物质科学基础”的战略研讨会.本文基于会议研讨的相关内容,对原子制造技术的发展背景、概念内涵以及面临的挑战进行了凝练,并提出如何利用该技术推动物质科学的快速发展,同时也就国家自然科学基金委员会对该领域的顶层设计和战略规划提出了政策建议. 展开更多
关键词 原子制造 物质科学 原子操控 原子级制造 单原子器件 物质创制
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面向原子级表面制造的等离子体诱导原子选择刻蚀技术 被引量:2
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作者 张翊 吴兵 +1 位作者 张临风 邓辉 《中国科学:技术科学》 EI CSCD 北大核心 2022年第6期882-892,共11页
制造正从以经验技能为基础的制造Ⅰ和以经典理论为基础的制造Ⅱ迈向以量子理论为基础的制造Ⅲ.尽管制造的这三个范式出现在不同历史阶段,但它们将并存,甚至在未来可遇见的时期内,制造Ⅱ还依然起主导作用.其中制造Ⅲ的核心领域将是原子... 制造正从以经验技能为基础的制造Ⅰ和以经典理论为基础的制造Ⅱ迈向以量子理论为基础的制造Ⅲ.尽管制造的这三个范式出现在不同历史阶段,但它们将并存,甚至在未来可遇见的时期内,制造Ⅱ还依然起主导作用.其中制造Ⅲ的核心领域将是原子及近原子尺度制造(ACSM),涵盖制造的精度、结构尺寸及材料去除、迁移、增加的尺度.原子级的表面制造是ACSM发展的一个重要领域.本文将介绍一种基于等离子体诱导原子选择刻蚀原理(plasma-induced atom-selective etching,PASE)的原子级表面制造技术.晶体表面不同成键状态的原子在等离子体刻蚀反应中具有不同的反应优先等级,而这种反应优先级的调控可通过改变等离子体活性粒子成分、浓度、温度等来实现.因而,PASE技术可以选择性去除材料表面的多余原子,并最终实现原子级表面的创成.PASE技术已成功应用于Si,SiC,Al_(2)O_(3)等硬脆单晶材料的抛光,采用CF_(4)-O_(2)等离子体,可直接实现上述材料研磨表面(S_(a)>100 nm)的抛光,并高效率获得埃米级表面(S_(a)<0.5 nm),实现了原子级表面的制造. 展开更多
关键词 原子及近原子尺度制造 原子选择刻蚀 超精密加工 等离子体
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