The laser equipment is one of the key equipment in the production line of the solar energy. In this article, the author de-scribes the application of the laser equipment in the production line of the amorphous silicon...The laser equipment is one of the key equipment in the production line of the solar energy. In this article, the author de-scribes the application of the laser equipment in the production line of the amorphous silicon film solar cells, and points out that the stable and exactitude is the key direction of the future development of the laser scribing equipment.展开更多
A new method to measure the conductivity of conducting thin films in a contactle s s fashion was demonstrated. A microwave compact equipment working at 94 GHz was used to measure the amplitude of the reflection coeffi...A new method to measure the conductivity of conducting thin films in a contactle s s fashion was demonstrated. A microwave compact equipment working at 94 GHz was used to measure the amplitude of the reflection coefficient of the microwave sig na l. Indium Tin Oxide films having conductivity of 8.20×10 4~8.02×10 5 S/m on the glass substrates were used as the samples. An evaluation equation was bui lt to determine the conductivity from the measured amplitude of the reflection c oefficient. The evaluated conductivity of conducting thin films agrees well with their actual value.展开更多
文摘The laser equipment is one of the key equipment in the production line of the solar energy. In this article, the author de-scribes the application of the laser equipment in the production line of the amorphous silicon film solar cells, and points out that the stable and exactitude is the key direction of the future development of the laser scribing equipment.
文摘A new method to measure the conductivity of conducting thin films in a contactle s s fashion was demonstrated. A microwave compact equipment working at 94 GHz was used to measure the amplitude of the reflection coefficient of the microwave sig na l. Indium Tin Oxide films having conductivity of 8.20×10 4~8.02×10 5 S/m on the glass substrates were used as the samples. An evaluation equation was bui lt to determine the conductivity from the measured amplitude of the reflection c oefficient. The evaluated conductivity of conducting thin films agrees well with their actual value.