In this paper, we study optimal recovery （reconstruction） of functions on the sphere in the average case setting. We obtain the asymptotic orders of average sampling numbers of a Sobolev space on the sphere with a G...In this paper, we study optimal recovery （reconstruction） of functions on the sphere in the average case setting. We obtain the asymptotic orders of average sampling numbers of a Sobolev space on the sphere with a Gaussian measure in the Lq （S^d-1） metric for 1 ≤ q ≤ ∞, and show that some worst-case asymptotically optimal algorithms are also asymptotically optimal in the average case setting in the Lq （S^d-1） metric for 1 ≤ q ≤ ∞.展开更多
A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multi...A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.展开更多
基金supported by the National Natural Science Foundation of China(No.11426179)the National Natural Science Foundation of China(Nos.10871132,11271263)+4 种基金the Key Scientific Research Fund of Xihua University(No.z1312624)the Foundation of Sichuan Educational Committee(No.14ZA0112)the Preeminent Youth Fund for School of Science in Xihua Universitythe Beijing Natural Science Foundation(No.1132001)BCMIIS
文摘In this paper, we study optimal recovery （reconstruction） of functions on the sphere in the average case setting. We obtain the asymptotic orders of average sampling numbers of a Sobolev space on the sphere with a Gaussian measure in the Lq （S^d-1） metric for 1 ≤ q ≤ ∞, and show that some worst-case asymptotically optimal algorithms are also asymptotically optimal in the average case setting in the Lq （S^d-1） metric for 1 ≤ q ≤ ∞.
基金This research was supported by The Science,Research and Innovation Promotion Funding(TSRI)(Grant No.FRB650070/0168)This research block grants was managed under Rajamangala University of Technology Thanyaburi(FRB65E0634M.3).
文摘A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.
