A high performance CMOS band-gap voltage reference circuit that can be used in interface integrated circuit of microsensor and compatible with 0. 6 μm ( double poly) mix process is proposed in this paper. The circuit...A high performance CMOS band-gap voltage reference circuit that can be used in interface integrated circuit of microsensor and compatible with 0. 6 μm ( double poly) mix process is proposed in this paper. The circuit can be employed in the range of 1. 8 - 8 V and carry out the first-order PTAT ( proportional to absolute temperature) temperature compensation. Through using a two-stage op-amp with a NMOS input pair as a negative feedback op-amp,the PSRR ( power supply rejection ratio) of the entire circuit is increased,and the temperature coefficient of reference voltage is decreased. Results from HSPICE simulation show that the PSRR is - 72. 76 dB in the condition of low-frequency,the temperature coefficient is 2. 4 × 10 -6 in the temperature range from - 10 ℃ to 90 ℃ and the power dissipation is only 14 μW when the supply voltage is 1. 8 V.展开更多
A high-PSRR high-order curvature-compensated CMOS bandgap voltage reference( BGR),which has the performances of high power supply rejection ratio( PSRR) and low temperature coefficient,is designed in SMIC 0. 18 μm CM...A high-PSRR high-order curvature-compensated CMOS bandgap voltage reference( BGR),which has the performances of high power supply rejection ratio( PSRR) and low temperature coefficient,is designed in SMIC 0. 18 μm CMOS process. Compared to the conventional curvature-compensated BGR which adopted a piecewise-linear current,the temperature characterize of the proposed BGR is effectively improved by adopting two kinds of current including a piecewise-linear current and a current proportional 1. 5 party to the absolute temperature T. By adopting a low dropout( LDO) regulator whose output voltage is the operating supply voltage of the proposed BGR core circuit instead of power supply voltage VDD,the proposed BGR with LDO regulator achieves a well PSRR performance than the BGR without LDO regulator. Simulation results show that the proposed BGR with LDO regulator achieves a temperature coefficient of 2. 1 × 10-6/ ℃ with a 1. 8 V power supply voltage and a line regulation of 4. 9 μV / V at 27 ℃. The proposed BGR with LDO regulator at 10 Hz,100 Hz,1 k Hz,10 k Hz and 100 k Hz have the PSRR of- 106. 388,- 106. 388,- 106. 38,- 105. 93 and-88. 67 d B respectively.展开更多
A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp...A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp bipolar transistor. The proposed circuit, designed in a standard 0.18 μm CMOS process, achieves a good temperature coefficient of 2.44 ppm/°C with tempera- ture range from -40 °C to 85 °C, and about 4 mV supply voltage variation in the range from 1.4 V to 2.4 V. With a 1.8 V supply voltage, the power supply rejection ratio is -56 dB at 10 MHz.展开更多
A lowtemperature coefficient( TC) bandgap reference( BGR) with novel process variation calibration technique is proposed in this paper. This proposed calibration technique compensating both TC and output value of BGR ...A lowtemperature coefficient( TC) bandgap reference( BGR) with novel process variation calibration technique is proposed in this paper. This proposed calibration technique compensating both TC and output value of BGR achieves fine adjustment step towards the reference voltage,while keeping optimal TC by utilizing large resistance to help layout match. The high-order curvature compensation realized by poly and p-diffusion resistors is introduced into the design to guarantee the temperature characteristic. Implemented in 180 nm technology,the proposed BGR has been simulated to have a power supply rejection ratio( PSRR) of 91 dB@100 Hz. The calibration technique covers output voltage scope of 0. 49 V-0. 56 Vwith TC of 9. 45 × 10^(-6)/℃-9. 56 × 10^(-6)/℃ over the temperature range of-40 ℃-120 ℃. The designed BGR provides a reference voltage of 500 mV,with measured TC of 10. 1 × 10^(-6)/℃.展开更多
This paper takes full advantages of the I-V transcon- ductance characteristics of metal-oxide semiconductor field effect transistor (MOSFET) operating in the subthreshold region and the enhancement pre-regulator techn...This paper takes full advantages of the I-V transcon- ductance characteristics of metal-oxide semiconductor field effect transistor (MOSFET) operating in the subthreshold region and the enhancement pre-regulator technique with the high gain negative feedback loop. The proposed reference circuit, designed with the SMIC 0.18 μm standard complementary metal-oxide semiconduc- tor (CMOS) logic process technology, exhibits a stable current of about 1.701 μA with much low temperature coefficient (TC) of 2.5×10-4 μA /℃ in the temperature range of -40 to 150 ℃ at 1.5 V supply voltage, and also achieves a best PSRR over a broad fre- quency. The PSRR is about -126 dB at DC frequency and remains -92 dB at the frequency higher 100 MHz. Moreover the proposed reference circuit operates stably at the supply voltage higher 1.2 V and has good process compatibility.展开更多
Featuring low communication requirements and high reliability,the voltage droop control method is widely adopted in the voltage source converter based multi-terminal direct current(VSC-MTDC)system for autonomous DC vo...Featuring low communication requirements and high reliability,the voltage droop control method is widely adopted in the voltage source converter based multi-terminal direct current(VSC-MTDC)system for autonomous DC voltage regulation and power-sharing.However,the traditional voltage droop control method with fixed droop gain is criticized for over-limit DC voltage deviation in case of large power disturbances,which can threaten stable operation of the entire VSCMTDC system.To tackle this problem,this paper proposes an adaptive reference power based voltage droop control method,which changes the reference power to compensate the power deviation for droop-controlled voltage source converters(VSCs).Besides retaining the merits of the traditional voltage droop control method,both DC voltage deviation reduction and power distribution improvement can be achieved by utilizing local information and a specific control factor in the proposed method.Basic principles and key features of the proposed method are described.Detailed analyses on the effects of the control factor on DC voltage deviation and imbalanced power-sharing are discussed,and the selection principle of the control factor is proposed.Finally,the effectiveness of the proposed method is validated by the simulations on a five-terminal VSC based high-voltage direct current(VSC-HVDC)system.展开更多
In this paper, the zero voltage switching (ZVS) region of a dual active bridge (DAB) converter with wide band-gap (WBG) power semiconductor device is analyzed. The ZVS region of a DAB converter varies depending on out...In this paper, the zero voltage switching (ZVS) region of a dual active bridge (DAB) converter with wide band-gap (WBG) power semiconductor device is analyzed. The ZVS region of a DAB converter varies depending on output power and voltage ratio. The DAB converters operate with hard switching at light loads, it is difficult to achieve high efficiency. Fortunately, WBG power semiconductor devices have excellent hard switching characteristics and can increase efficiency compared to silicon (Si) devices. In particular, WBG devices can achieve ZVS at low load currents due to their low parasitic output capacitance (C<sub>o,tr</sub>) characteristics. Therefore, in this paper, the ZVS operating resion is analyzed based on the characteristics of Si, silicon carbide (SiC) and gallium nitride (GaN). Power semiconductor devices. WBG devices with low C<sub>o,tr</sub> operate at ZVS at lower load currents compared to Si devices. To verify this, experiments are conducted and the results are analyzed using a 3 kW DAB converter. For Si devices, ZVS is achieved above 1.4 kW. For WBG devices, ZVS is achieved at 700 W. Due to the ZVS conditions depending on the switching device, the DAB converter using Si devices achieves a power conversion efficiency of 91% at 1.1 kW output. On the other hand, in the case of WBG devices, power conversion efficiency of more than 98% is achieved under 11 kW conditions. In conclusion, it is confirmed that the WBG device operates in ZVS at a lower load compared to the Si device, which is advantageous in increasing light load efficiency.展开更多
在弱交流系统下对于附带有STATCOM的电网换相换流器高压直流输电(Line Commutated Converter based High Voltage Direct Current, LCC-HVDC)系统,存在着LCC逆变站与STATCOM之间耦合导致LCC-HVDC系统的稳定裕度下降问题,这会减弱LCC-HVD...在弱交流系统下对于附带有STATCOM的电网换相换流器高压直流输电(Line Commutated Converter based High Voltage Direct Current, LCC-HVDC)系统,存在着LCC逆变站与STATCOM之间耦合导致LCC-HVDC系统的稳定裕度下降问题,这会减弱LCC-HVDC抑制换相失败的能力。此外,HVDC控制环节之中的电压指令电流控制(voltage dependent current order limiter, VDCOL)环节的输出电流指令大幅剧烈波动还有几率会导致HVDC系统在首次换相失败之后发生后续换相失败。针对上述问题提出了一种“改进参考电压”的思想,对STATCOM和VDCOL的参考电压与输入电压分别进行修正。首先在STATCOM原本的参考电压经过一个“虚拟电抗”之后得到一个新的参考电压,通过这个改进参考电压弱化了STATCOM电压外环控制模块与LCC逆变站的耦合,减小了交流系统等效阻抗的大小,提升了系统对干扰的抵抗能力。然后对VDCOL的输入电压进行改进,新的改进输入电压改善了故障后VDCOL输出电流指令的大幅剧烈波动情况。最后通过三个层次的对照试验,验证了所提方法的有效性。展开更多
为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种...为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种具有固定参考电阻的VCMA-MTJ读电路和一种具有参考电阻调控单元的VCMA-MTJ读电路,研究了软击穿对VCMA-MTJ电阻R_(t)、隧穿磁阻比率M、软击穿时间T_(s)以及VCMA-MTJ读电路读错误率的影响。结果表明:软击穿的出现会导致R_(t)和M均随应力时间t的增加而降低,T_(s)随氧化层厚度t_(ox)的增大而缓慢增加,却随脉冲电压V_(b)的增大而迅速减少,与反平行态相比,平行态的T_(s)更短且M降低50%所需时间更少;具有固定参考电阻的VCMA-MTJ读电路可有效避免读“0”错误率的产生,但读“1”错误率却随t的增加而上升,而具有参考电阻调控单元的VCMA-MTJ读电路可在保持读“0”正确率的同时,对读“1”错误率改善达54%,在一定程度上削弱了软击穿对VCMA-MTJ读电路的影响。展开更多
A nanopower switched-capacitor CMOS sub-bandgap voltage reference has been implemented using a Chartered 035-μm 3.3-V/5-V dual gate mixed-signal CMOS process.The proposed circuit generates a precise sub-bandgap volta...A nanopower switched-capacitor CMOS sub-bandgap voltage reference has been implemented using a Chartered 035-μm 3.3-V/5-V dual gate mixed-signal CMOS process.The proposed circuit generates a precise sub-bandgap voltage of 1 V.The temperature coefficient of the output voltage is 13.4 ppm/℃with the temperature varying from -20 to 80℃.The proposed circuit operates properly with the supply voltage down to 1.3 V,and consumes 150 nA at room temperature.The line regulation is 0.27%/V.The power supply rejection ratio at 100 Hz and 1 MHz is -39 dB and -51 dB,respectively.The chip area is 0.2 mm^2.展开更多
An on-chip reference voltage has been designed in capacitor–resister hybrid SAR ADC for CZT detector with the TSMC 0.35μm 2P4M CMOS process.The voltage reference has a dynamic load since using variable capacitors an...An on-chip reference voltage has been designed in capacitor–resister hybrid SAR ADC for CZT detector with the TSMC 0.35μm 2P4M CMOS process.The voltage reference has a dynamic load since using variable capacitors and resistances,which need a large driving ability to deal with the current related to the time and sampling rate.Most of the previous articles about the reference for ADC present only the bandgap part for a low temperature coefficient and high PSRR.However,it is not enough and overall,it needs to consider the output driving ability.The proposed voltage reference is realized by the band-gap reference,voltage generator and output buffer.Apart from a low temperature coefficient and high PSRR,it has the features of a large driving ability and low power consumption.What is more,for CZT detectors application in space,a radiation-hardened design has been considered.The measurement results show that the output reference voltage of the buffer is 4.096 V.When the temperature varied from 0 to 80℃,the temperature coefficient is 12.2 ppm/℃.The PSRR was 70 d B@100 k Hz.The drive current of the reference can reach up to 10 m A.The area of the voltage reference in the SAR ADC chip is only 449614 m^2.The total power consumption is only 1.092 m W.展开更多
A new mixed curvature compensation technique for CMOS voltage reference is presented, which resorts to two sub-references with complementary temperature characteristics. The first sub-reference is the source–gate vol...A new mixed curvature compensation technique for CMOS voltage reference is presented, which resorts to two sub-references with complementary temperature characteristics. The first sub-reference is the source–gate voltage︱VGS︱_p of a PMOS transistor working in the saturated region. The second sub-reference is the weighted sum of gate–source voltages︱VGS︱_n of NMOS transistors in the subthreshold region and the difference between two base–emitter voltages △V_(BE) of bipolar junction transistors(BJTs). The voltage reference implemented utilizing the proposed curvature compensation technique exhibits a low temperature coefficient and occupies a small silicon area.The proposed technique was verified in 0.18 μm standard CMOS process technology. The performance of the circuit has been measured. The measured results show a temperature coefficient as low as 12.7 ppm/℃ without trimming,over a temperature range from -40 to 120 ℃, and the current consumption is 50 μA at room temperature. The measured power-supply rejection ratio(PSRR) is 31:2 dB @ 100 kHz. The circuit occupies an area of 0.045 mm^2.展开更多
This paper presents a super performance bandgap voltage reference for DC-DC converter with adjustable output. It generates a wide range of voltage reference ranging from sub-1V to 1.2217V and has a low temperature coe...This paper presents a super performance bandgap voltage reference for DC-DC converter with adjustable output. It generates a wide range of voltage reference ranging from sub-1V to 1.2217V and has a low temperature coefficient of 2.3×10 -5/K over the temperature variation using the current feedback and resistive subdivision. In addition, the power supply rejection ration of the proposed bandgap voltage reference is 78dB. When supply voltage varies from 2.5V to 6V, output VREF is 1.221685±0.055mV.展开更多
文摘A high performance CMOS band-gap voltage reference circuit that can be used in interface integrated circuit of microsensor and compatible with 0. 6 μm ( double poly) mix process is proposed in this paper. The circuit can be employed in the range of 1. 8 - 8 V and carry out the first-order PTAT ( proportional to absolute temperature) temperature compensation. Through using a two-stage op-amp with a NMOS input pair as a negative feedback op-amp,the PSRR ( power supply rejection ratio) of the entire circuit is increased,and the temperature coefficient of reference voltage is decreased. Results from HSPICE simulation show that the PSRR is - 72. 76 dB in the condition of low-frequency,the temperature coefficient is 2. 4 × 10 -6 in the temperature range from - 10 ℃ to 90 ℃ and the power dissipation is only 14 μW when the supply voltage is 1. 8 V.
基金Sponsored by the National Natural Science Foundation of China(Grant No.61471075)the 2013 Program for Innovation Team Building at Institutions of Higher Education in Chongqing(The Innovation Team of Smart Medical System and Key Technology)
文摘A high-PSRR high-order curvature-compensated CMOS bandgap voltage reference( BGR),which has the performances of high power supply rejection ratio( PSRR) and low temperature coefficient,is designed in SMIC 0. 18 μm CMOS process. Compared to the conventional curvature-compensated BGR which adopted a piecewise-linear current,the temperature characterize of the proposed BGR is effectively improved by adopting two kinds of current including a piecewise-linear current and a current proportional 1. 5 party to the absolute temperature T. By adopting a low dropout( LDO) regulator whose output voltage is the operating supply voltage of the proposed BGR core circuit instead of power supply voltage VDD,the proposed BGR with LDO regulator achieves a well PSRR performance than the BGR without LDO regulator. Simulation results show that the proposed BGR with LDO regulator achieves a temperature coefficient of 2. 1 × 10-6/ ℃ with a 1. 8 V power supply voltage and a line regulation of 4. 9 μV / V at 27 ℃. The proposed BGR with LDO regulator at 10 Hz,100 Hz,1 k Hz,10 k Hz and 100 k Hz have the PSRR of- 106. 388,- 106. 388,- 106. 38,- 105. 93 and-88. 67 d B respectively.
文摘A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp bipolar transistor. The proposed circuit, designed in a standard 0.18 μm CMOS process, achieves a good temperature coefficient of 2.44 ppm/°C with tempera- ture range from -40 °C to 85 °C, and about 4 mV supply voltage variation in the range from 1.4 V to 2.4 V. With a 1.8 V supply voltage, the power supply rejection ratio is -56 dB at 10 MHz.
基金Supported by the National Natural Science Foundation of China(61604109)the National High-Tech R&D Program of China(2015AA042605)
文摘A lowtemperature coefficient( TC) bandgap reference( BGR) with novel process variation calibration technique is proposed in this paper. This proposed calibration technique compensating both TC and output value of BGR achieves fine adjustment step towards the reference voltage,while keeping optimal TC by utilizing large resistance to help layout match. The high-order curvature compensation realized by poly and p-diffusion resistors is introduced into the design to guarantee the temperature characteristic. Implemented in 180 nm technology,the proposed BGR has been simulated to have a power supply rejection ratio( PSRR) of 91 dB@100 Hz. The calibration technique covers output voltage scope of 0. 49 V-0. 56 Vwith TC of 9. 45 × 10^(-6)/℃-9. 56 × 10^(-6)/℃ over the temperature range of-40 ℃-120 ℃. The designed BGR provides a reference voltage of 500 mV,with measured TC of 10. 1 × 10^(-6)/℃.
基金Supported by the National Natural Science Foundation of China (60376019)
文摘This paper takes full advantages of the I-V transcon- ductance characteristics of metal-oxide semiconductor field effect transistor (MOSFET) operating in the subthreshold region and the enhancement pre-regulator technique with the high gain negative feedback loop. The proposed reference circuit, designed with the SMIC 0.18 μm standard complementary metal-oxide semiconduc- tor (CMOS) logic process technology, exhibits a stable current of about 1.701 μA with much low temperature coefficient (TC) of 2.5×10-4 μA /℃ in the temperature range of -40 to 150 ℃ at 1.5 V supply voltage, and also achieves a best PSRR over a broad fre- quency. The PSRR is about -126 dB at DC frequency and remains -92 dB at the frequency higher 100 MHz. Moreover the proposed reference circuit operates stably at the supply voltage higher 1.2 V and has good process compatibility.
基金supported by the Key Science and Technology Projects of China Southern Power Grid Corporation(No.090000KK52180116)National Natural Science Foundation of China(No.51807135)。
文摘Featuring low communication requirements and high reliability,the voltage droop control method is widely adopted in the voltage source converter based multi-terminal direct current(VSC-MTDC)system for autonomous DC voltage regulation and power-sharing.However,the traditional voltage droop control method with fixed droop gain is criticized for over-limit DC voltage deviation in case of large power disturbances,which can threaten stable operation of the entire VSCMTDC system.To tackle this problem,this paper proposes an adaptive reference power based voltage droop control method,which changes the reference power to compensate the power deviation for droop-controlled voltage source converters(VSCs).Besides retaining the merits of the traditional voltage droop control method,both DC voltage deviation reduction and power distribution improvement can be achieved by utilizing local information and a specific control factor in the proposed method.Basic principles and key features of the proposed method are described.Detailed analyses on the effects of the control factor on DC voltage deviation and imbalanced power-sharing are discussed,and the selection principle of the control factor is proposed.Finally,the effectiveness of the proposed method is validated by the simulations on a five-terminal VSC based high-voltage direct current(VSC-HVDC)system.
文摘In this paper, the zero voltage switching (ZVS) region of a dual active bridge (DAB) converter with wide band-gap (WBG) power semiconductor device is analyzed. The ZVS region of a DAB converter varies depending on output power and voltage ratio. The DAB converters operate with hard switching at light loads, it is difficult to achieve high efficiency. Fortunately, WBG power semiconductor devices have excellent hard switching characteristics and can increase efficiency compared to silicon (Si) devices. In particular, WBG devices can achieve ZVS at low load currents due to their low parasitic output capacitance (C<sub>o,tr</sub>) characteristics. Therefore, in this paper, the ZVS operating resion is analyzed based on the characteristics of Si, silicon carbide (SiC) and gallium nitride (GaN). Power semiconductor devices. WBG devices with low C<sub>o,tr</sub> operate at ZVS at lower load currents compared to Si devices. To verify this, experiments are conducted and the results are analyzed using a 3 kW DAB converter. For Si devices, ZVS is achieved above 1.4 kW. For WBG devices, ZVS is achieved at 700 W. Due to the ZVS conditions depending on the switching device, the DAB converter using Si devices achieves a power conversion efficiency of 91% at 1.1 kW output. On the other hand, in the case of WBG devices, power conversion efficiency of more than 98% is achieved under 11 kW conditions. In conclusion, it is confirmed that the WBG device operates in ZVS at a lower load compared to the Si device, which is advantageous in increasing light load efficiency.
文摘在弱交流系统下对于附带有STATCOM的电网换相换流器高压直流输电(Line Commutated Converter based High Voltage Direct Current, LCC-HVDC)系统,存在着LCC逆变站与STATCOM之间耦合导致LCC-HVDC系统的稳定裕度下降问题,这会减弱LCC-HVDC抑制换相失败的能力。此外,HVDC控制环节之中的电压指令电流控制(voltage dependent current order limiter, VDCOL)环节的输出电流指令大幅剧烈波动还有几率会导致HVDC系统在首次换相失败之后发生后续换相失败。针对上述问题提出了一种“改进参考电压”的思想,对STATCOM和VDCOL的参考电压与输入电压分别进行修正。首先在STATCOM原本的参考电压经过一个“虚拟电抗”之后得到一个新的参考电压,通过这个改进参考电压弱化了STATCOM电压外环控制模块与LCC逆变站的耦合,减小了交流系统等效阻抗的大小,提升了系统对干扰的抵抗能力。然后对VDCOL的输入电压进行改进,新的改进输入电压改善了故障后VDCOL输出电流指令的大幅剧烈波动情况。最后通过三个层次的对照试验,验证了所提方法的有效性。
文摘为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种具有固定参考电阻的VCMA-MTJ读电路和一种具有参考电阻调控单元的VCMA-MTJ读电路,研究了软击穿对VCMA-MTJ电阻R_(t)、隧穿磁阻比率M、软击穿时间T_(s)以及VCMA-MTJ读电路读错误率的影响。结果表明:软击穿的出现会导致R_(t)和M均随应力时间t的增加而降低,T_(s)随氧化层厚度t_(ox)的增大而缓慢增加,却随脉冲电压V_(b)的增大而迅速减少,与反平行态相比,平行态的T_(s)更短且M降低50%所需时间更少;具有固定参考电阻的VCMA-MTJ读电路可有效避免读“0”错误率的产生,但读“1”错误率却随t的增加而上升,而具有参考电阻调控单元的VCMA-MTJ读电路可在保持读“0”正确率的同时,对读“1”错误率改善达54%,在一定程度上削弱了软击穿对VCMA-MTJ读电路的影响。
基金Project supported by the National High Technology Research and Development Program of China(No2009AA011607)
文摘A nanopower switched-capacitor CMOS sub-bandgap voltage reference has been implemented using a Chartered 035-μm 3.3-V/5-V dual gate mixed-signal CMOS process.The proposed circuit generates a precise sub-bandgap voltage of 1 V.The temperature coefficient of the output voltage is 13.4 ppm/℃with the temperature varying from -20 to 80℃.The proposed circuit operates properly with the supply voltage down to 1.3 V,and consumes 150 nA at room temperature.The line regulation is 0.27%/V.The power supply rejection ratio at 100 Hz and 1 MHz is -39 dB and -51 dB,respectively.The chip area is 0.2 mm^2.
基金supported by the National Key Scientific Instrument and Equipment Development Project(No.2011YQ040082)the National Natural Science Foundation of China(No.61376034)the Shaanxi Province Science and Technology Innovation Project(No.2015KTZDGY03-03)
文摘An on-chip reference voltage has been designed in capacitor–resister hybrid SAR ADC for CZT detector with the TSMC 0.35μm 2P4M CMOS process.The voltage reference has a dynamic load since using variable capacitors and resistances,which need a large driving ability to deal with the current related to the time and sampling rate.Most of the previous articles about the reference for ADC present only the bandgap part for a low temperature coefficient and high PSRR.However,it is not enough and overall,it needs to consider the output driving ability.The proposed voltage reference is realized by the band-gap reference,voltage generator and output buffer.Apart from a low temperature coefficient and high PSRR,it has the features of a large driving ability and low power consumption.What is more,for CZT detectors application in space,a radiation-hardened design has been considered.The measurement results show that the output reference voltage of the buffer is 4.096 V.When the temperature varied from 0 to 80℃,the temperature coefficient is 12.2 ppm/℃.The PSRR was 70 d B@100 k Hz.The drive current of the reference can reach up to 10 m A.The area of the voltage reference in the SAR ADC chip is only 449614 m^2.The total power consumption is only 1.092 m W.
基金Project supported by the National Natural Science Foundation of China(No.61376032)
文摘A new mixed curvature compensation technique for CMOS voltage reference is presented, which resorts to two sub-references with complementary temperature characteristics. The first sub-reference is the source–gate voltage︱VGS︱_p of a PMOS transistor working in the saturated region. The second sub-reference is the weighted sum of gate–source voltages︱VGS︱_n of NMOS transistors in the subthreshold region and the difference between two base–emitter voltages △V_(BE) of bipolar junction transistors(BJTs). The voltage reference implemented utilizing the proposed curvature compensation technique exhibits a low temperature coefficient and occupies a small silicon area.The proposed technique was verified in 0.18 μm standard CMOS process technology. The performance of the circuit has been measured. The measured results show a temperature coefficient as low as 12.7 ppm/℃ without trimming,over a temperature range from -40 to 120 ℃, and the current consumption is 50 μA at room temperature. The measured power-supply rejection ratio(PSRR) is 31:2 dB @ 100 kHz. The circuit occupies an area of 0.045 mm^2.
文摘This paper presents a super performance bandgap voltage reference for DC-DC converter with adjustable output. It generates a wide range of voltage reference ranging from sub-1V to 1.2217V and has a low temperature coefficient of 2.3×10 -5/K over the temperature variation using the current feedback and resistive subdivision. In addition, the power supply rejection ration of the proposed bandgap voltage reference is 78dB. When supply voltage varies from 2.5V to 6V, output VREF is 1.221685±0.055mV.