Infrared and visible light image fusion technology is a hot spot in the research of multi-sensor fusion technology in recent years. Existing infrared and visible light fusion technologies need to register before fusio...Infrared and visible light image fusion technology is a hot spot in the research of multi-sensor fusion technology in recent years. Existing infrared and visible light fusion technologies need to register before fusion because of using two cameras. However, the application effect of the registration technology has yet to be improved. Hence, a novel integrative multi-spectral sensor device is proposed for infrared and visible light fusion, and by using the beam splitter prism, the coaxial light incident from the same lens is projected to the infrared charge coupled device （CCD） and visible light CCD, respectively. In this paper, the imaging mechanism of the proposed sensor device is studied with the process of the signals acquisition and fusion. The simulation experiment, which involves the entire process of the optic system, signal acquisition, and signal fusion, is constructed based on imaging effect model. Additionally, the quality evaluation index is adopted to analyze the simulation result. The experimental results demonstrate that the proposed sensor device is effective and feasible.展开更多
A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interfe...A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function Ф, which is induced by three parts： the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter Teff and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference （OPD） is linearly dependent on the refractive index of the beam splitter to determine both L and Teff. The spectral phase shift on reflection of thin film structure can be obtained by subtracting these two parts from Ф. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy.展开更多
基金This study is supported by the Natural Science Foundation of China （Grant No. 51274150） and Shanxi Province Natural Science Foundation of China （Grant No. 201601 D011059）.
文摘Infrared and visible light image fusion technology is a hot spot in the research of multi-sensor fusion technology in recent years. Existing infrared and visible light fusion technologies need to register before fusion because of using two cameras. However, the application effect of the registration technology has yet to be improved. Hence, a novel integrative multi-spectral sensor device is proposed for infrared and visible light fusion, and by using the beam splitter prism, the coaxial light incident from the same lens is projected to the infrared charge coupled device （CCD） and visible light CCD, respectively. In this paper, the imaging mechanism of the proposed sensor device is studied with the process of the signals acquisition and fusion. The simulation experiment, which involves the entire process of the optic system, signal acquisition, and signal fusion, is constructed based on imaging effect model. Additionally, the quality evaluation index is adopted to analyze the simulation result. The experimental results demonstrate that the proposed sensor device is effective and feasible.
基金supported by the National Natural Science Foundation of China under Grant Nos.60708013 and 60608014
文摘A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function Ф, which is induced by three parts： the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter Teff and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference （OPD） is linearly dependent on the refractive index of the beam splitter to determine both L and Teff. The spectral phase shift on reflection of thin film structure can be obtained by subtracting these two parts from Ф. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy.
