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Experimental study of surface crystallization on integrated circuit chips
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作者 张新 刘梦新 +3 位作者 高勇 王彩琳 王峙卫 张弦 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第11期2746-2750,共5页
A surface crystallization phenomenon on bonding pads and wires of integrated circuit chip is reported in this paper. Through a lot of experiments, an unknown failure effect caused by mixed crystalline matter is reveal... A surface crystallization phenomenon on bonding pads and wires of integrated circuit chip is reported in this paper. Through a lot of experiments, an unknown failure effect caused by mixed crystalline matter is revealed, whereas non-plasma fluorine contamination cannot cause the failure of bonding pads. By experiments combined with infrared spectroscopy analysis, the surface crystallization effect is studied. The conclusion of the study can provide the guidance for IC fabrication, modelling and analysis. 展开更多
关键词 infrared spectrum technology bonding pad CRYSTALLIZATION FAILURE
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