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Repeated Strike Process During Disconnector Operation in Ultra-High Voltage Gas-Insulated Switchgear 被引量:1
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作者 关永刚 蔡元纪 +4 位作者 陈维江 刘卫东 李志兵 岳功昌 张俊民 《Plasma Science and Technology》 SCIE EI CAS CSCD 2016年第3期247-253,共7页
Very fast transient over-voltage (VFTO), induced by disconnector operations in gas- insulated switchgears, has become the limiting dielectric stress at ultra-high voltage levels. Much work has been done to investiga... Very fast transient over-voltage (VFTO), induced by disconnector operations in gas- insulated switchgears, has become the limiting dielectric stress at ultra-high voltage levels. Much work has been done to investigate single-strike waveforms of VFTO. However, little study has been carried out investigating the repeated strike process, which would influence VFTO significantly. In this paper, we carried out 450 effective experiments in an ultra-high voltage test circuit, and conducted calculations through the Monte Carlo simulation method, to investigate the repeated strike process. Firstly, the mechanism of the repeated strike process is proposed, based on the ex- perimentai results. Afterwards, statistical breakdown characteristics of disconnectors are obtained and analyzed. Finally, simulations of the repeated strike process are conducted, which indicate that the dielectric strength recovery speed and polarity effect factor have a joint effect on VFTO. This study enhances the understanding of the nature of VFTO, and may help to optimize the disconnector designed to minimize VFTO. 展开更多
关键词 disconnector (DS) repeated strike process DISCHARGE statistical breakdowncharacteristics ultra-high voltage (UHV) very fast transient over-voltage (VFTO)
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