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Discussion on Failure Sensitive Parameters of an EED Life Performance in Storage
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作者 严楠 蒋敏荣 《Journal of Beijing Institute of Technology》 EI CAS 2005年第1期59-62,共4页
An issue to distinguish sensitive parameters of storage life prior to the failure of a bridgewire electro-(explosive) device (EED) is studied. The degradations of bridgewire resistance, 50% firing current, ignition de... An issue to distinguish sensitive parameters of storage life prior to the failure of a bridgewire electro-(explosive) device (EED) is studied. The degradations of bridgewire resistance, 50% firing current, ignition delay time, bridgewire molten time and powder color with the storage time were measured under a simulating accelerated life test of high-temperature and high-humidity. The most sensitive parameter suitable to evaluate the EED storage life is discussed. It is concluded that the standard deviation of resistance change is the most sensitive degradation variable, and the next is bridgewire molten time, 50% firing current and ignition delay time. The mean of resistance is an insensitive degradation parameter. 展开更多
关键词 failure analysis electro-explosive device (EED) accelerated life test
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