The accelerating burn in and screening method of processing 1 310 nm InGaAsP of laser diodes （LDs） is introduced. It is confirmed that the theory of burn in and screening is based on the second derivative minimum of...The accelerating burn in and screening method of processing 1 310 nm InGaAsP of laser diodes （LDs） is introduced. It is confirmed that the theory of burn in and screening is based on the second derivative minimum of burn-in curve, and the new testing method has been given, that is automatic current control （ACC） burn-in and automatic power control （APC） testing. This avoidably bring the errors of testing in only ACC or APC method, which need to monitor and control or test LDs power change by photo-detector （PD） at high temperature, and LDs or PDs must be into the same environment （PD will be burn-in at the same time）. Through the experiment, the accelerating burn-in and screening condition of the devices has been confirmed： ACC, 200 mA, 100 ℃, 8 h. This raise work efficiency 12 times than Bellcore standard and save testing fee.展开更多
In this article, we assume that the product in the burn-in procedure only experiences continuous smooth degradation process, while in the field operation period the product experiences both continuous smooth degradati...In this article, we assume that the product in the burn-in procedure only experiences continuous smooth degradation process, while in the field operation period the product experiences both continuous smooth degradation process and shock process. The shock process can cause the product not only traumatic failure,but also additional abrupt degradation damage. After the system reliability model and maintenance model have been proposed, the optimal burn-in setting and age replacement duration are obtained under the considering of minimizing the long run average cost rate. A numerical example with the real data is analyzed to illustrate the application of the model.展开更多
文摘The accelerating burn in and screening method of processing 1 310 nm InGaAsP of laser diodes （LDs） is introduced. It is confirmed that the theory of burn in and screening is based on the second derivative minimum of burn-in curve, and the new testing method has been given, that is automatic current control （ACC） burn-in and automatic power control （APC） testing. This avoidably bring the errors of testing in only ACC or APC method, which need to monitor and control or test LDs power change by photo-detector （PD） at high temperature, and LDs or PDs must be into the same environment （PD will be burn-in at the same time）. Through the experiment, the accelerating burn-in and screening condition of the devices has been confirmed： ACC, 200 mA, 100 ℃, 8 h. This raise work efficiency 12 times than Bellcore standard and save testing fee.
基金the National Natural Science Foundation of China(No.11171119)the Science and Technology Projects of Jiangxi Province Department of Education in 2012(No.GJJ12206)
文摘In this article, we assume that the product in the burn-in procedure only experiences continuous smooth degradation process, while in the field operation period the product experiences both continuous smooth degradation process and shock process. The shock process can cause the product not only traumatic failure,but also additional abrupt degradation damage. After the system reliability model and maintenance model have been proposed, the optimal burn-in setting and age replacement duration are obtained under the considering of minimizing the long run average cost rate. A numerical example with the real data is analyzed to illustrate the application of the model.
