Feature evaluation and extraction based on neural network in analog circuit fault diagnosis

Choosing the right characteristic parameter is the key to fault diagnosis in analog circuit. The feature evaluation and extraction methods based on neural network are presented. Parameter evaluation of circuit features is realized by training results from neural network; the superior nonlinear mapping capability is competent for extracting fault features which are normalized and compressed subsequently. The complex classification problem on fault pattern recognition in analog circuit is transferred into feature processing stage by feature extraction based on neural network effectively, which improves the diagnosis efficiency. A fault diagnosis illustration validated this method.

Wavelet neural network based fault diagnosis in nonlinear analog circuits

The theories of diagnosing nonlinear analog circuits by means of the transient response testing are studled. Wavelet analysis is made to extract the transient response signature of nonlinear circuits and compress the signature dada. The best wavelet function is selected based on the between-category total scatter of signature. The fault dictionary of nonlinear circuits is constructed based on improved back-propagation（BP） neural network. Experimental results demonstrate that the method proposed has high diagnostic sensitivity and fast fault identification and deducibility.

Data-driven fault diagnosis method for analog circuits based on robust competitive agglomeration

The data-driven fault diagnosis methods can improve the reliability of analog circuits by using the data generated from it. The data have some characteristics, such as randomness and incompleteness, which lead to the diagnostic results being sensitive to the specific values and random noise. This paper presents a data-driven fault diagnosis method for analog circuits based on the robust competitive agglomeration （RCA）, which can alleviate the incompleteness of the data by clustering with the competing process. And the robustness of the diagnostic results is enhanced by using the approach of robust statistics in RCA. A series of experiments are provided to demonstrate that RCA can classify the incomplete data with a high accuracy. The experimental results show that RCA is robust for the data needed to be classified as well as the parameters needed to be adjusted. The effectiveness of RCA in practical use is demonstrated by two analog circuits.

Combinatorial Optimization Based Analog Circuit Fault Diagnosis with Back Propagation Neural Network

Electronic components' reliability has become the key of the complex system mission execution. Analog circuit is an important part of electronic components. Its fault diagnosis is far more challenging than that of digital circuit. Simulations and applications have shown that the methods based on BP neural network are effective in analog circuit fault diagnosis. Aiming at the tolerance of analog circuit,a combinatorial optimization diagnosis scheme was proposed with back propagation( BP) neural network( BPNN).The main contributions of this scheme included two parts:( 1) the random tolerance samples were added into the nominal training samples to establish new training samples,which were used to train the BP neural network based diagnosis model;( 2) the initial weights of the BP neural network were optimized by genetic algorithm( GA) to avoid local minima,and the BP neural network was tuned with Levenberg-Marquardt algorithm( LMA) in the local solution space to look for the optimum solution or approximate optimal solutions. The experimental results show preliminarily that the scheme substantially improves the whole learning process approximation and generalization ability,and effectively promotes analog circuit fault diagnosis performance based on BPNN.

Method for Analog Circuit Soft-Fault Diagnosis and Parameter Identification Based on Indictor of Phase Deviation and Spectral Radius

The soft fault induced by parameter variation is one of the most challenging problems in the domain of fault diagnosis for analog circuits.A new fault location and parameter prediction approach for soft-faults diagnosis in analog circuits is presented in this paper.The proposed method extracts the original signals from the output terminals of the circuits under test（CUT） by a data acquisition board.Firstly,the phase deviation value between fault-free and faulty conditions is obtained by fitting the sampling sequence with a sine curve.Secondly,the sampling sequence is organized into a square matrix and the spectral radius of this matrix is obtained.Thirdly,the smallest error of the spectral radius and the corresponding component value are obtained through comparing the spectral radius and phase deviation value with the trend curves of them,respectively,which are calculated from the simulation data.Finally,the fault location is completed by using the smallest error,and the corresponding component value is the parameter identification result.Both simulated and experimental results show the effectiveness of the proposed approach.It is particularly suitable for the fault location and parameter identification for analog integrated circuits.

A Method on Analog Circuit Fault Diagnosis with Tolerance

In this paper, it is proved that the direction of the node-voltage difference vector, which is the difference between the node-voltage vector at faulty state and the one at the nominal state, is determined only by the location of the faulty clement in linear analog circuits. Considering that the direction of the node-voltage sensitivity vector is the same as the one of the node-voltage difference vector and also considering that the module of the node-voltage sensitivity vector presents the weight of the parameter of faulty element deviation relative to the voltage difference, fault dictionary is set up based on node-voltage sensitivity vectors. A decision algorithm is proposed concerned with both the location and the parameter difference of the faulty element. Single fault and multi-fault can be diagnosed while the circuit parameters deviate within the tolerance range of 10 %.

Robust Fault Diagnosis of Analog Circuits with Tolerances

A method for robust analog fault diagnosis using hybrid neural networks is proposed. The primary focus of the paper is to provide robust diagnosis using a mechanism to deal with the problem of element tolerances and reduce testing time. The proposed approach is based on the fault dictionary diagnosis method and backward propagation neural network (BPNN) and the adaptive resonance theory (ART) neural network. Simulation results show that the method is robust and fast for fault diagnosis of analog circuits with tolerances.

Fault Diagnosis of Analog Circuit Based on PSO and BP Neural Network

In order to improve the speed and accuracy of analog circuit fault diagnosis,using Back Propagation Neural Network(BPNN),a new method is proposed based on Particle Swarm Optimization(PSO)to adjust weights of BP neural network.The model can not only overcome the limitations of the slow convergence and the local extreme values by basic BP algorithm,but also improve the learning ability and generalization ability with a higher precision.The response signals of analog circuit is preprocessed by Wavelet Packet Transform(WPT)as the fault feature.The simulation result shows that the proposed method has higher diagnostic accuracy and faster convergence speed,which is effective for fault location.

Soft Fault Diagnosis of Analog Circuit Based on Particle Swarm Optimization

A single soft fault diagnosis method for analog circuit with tolerance based on particle swarm optimization （PSO） is proposed. The parameter deviation of circuit elements is defined as the element of particle. Node-voltage incremental equations based on the sensitivity analysis are built as constraints of a linear programming （LP） equation. Through inducing the penalty coefficient, the LP equation is set as the fitness function for the PSO program. After evaluating the best position of particles, the position of the optimal particle states whether the actual parameter is within tolerance range or not. Simulation result shows the effectiveness of the method.

Research method of circuit fault diagnosis based on FCM

Using fuzzy C cluster mean (FCM), fuzzy theory and neural network, a fault diagnosis method was proposed, which was based on fuzzy C-means clustering algorithm of neural network that was applied in non-linear analog circuits and in diagnoses the ARNIC 429 reception circuit of aviation aircraft avionics. The C cluster algorithm can make the amount of the fuzzy rule automatically and can create an initial fuzzy rule database of fault diagnosis. A type of fuzzy neural network and a fault tree were generated. The algorithm avoids the disadvantage that gets into the part of optimum circumstance. A validate application was implemented, which proves that the method is effective. Therefore, the method is superior to the traditional methods in fault diagnosis, and the efficiency is heavily improved.

THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF-LINEAR CIRCUITS

In view of K-fault testability,the topological construction of a practical circuitis far from ideal.In order to improve the testability of a circuit,we may increase the numberof accessible nodes or use the multi-excitation method.Effectiveness of these methods and thefeasibility of choosing accessible nodes are discussed in detail.The conditions for multi-excitationtestability are presented.

ORIENTED ENERGY, NEARNESS AND FAULT DIAGNOSIS

This paper describes why the k-dimension maximal oriented energy subspace of the measurable voltage-change matrix id the optimal feature to locate faults in a population of circuits. The paper elaborately designs a "nearness" concept, which is used to construct a fault candidate set in a small size, and proposes a maximal nearness criterion. On the basis of these, the paper presents a novel algorithm to efficiently improve the accuracy and speed of fault locating.

Soft Fault Diagnosis for Analog Circuits Based on Slope Fault Feature and BP Neural Networks

Fault diagnosis is very important for development and maintenance of safe and reliable electronic circuits and systems. This paper describes an approach of soft fault diagnosis for analog circuits based on slope fault feature and back propagation neural networks (BPNN). The reported approach uses the voltage relation function between two nodes as fault features; and for linear analog circuits, the voltage relation function is a linear function, thus the slope is invariant as fault feature. Therefore, a unified fault feature for both hard fault (open or short fault) and soft fault (parametric fault) is extracted. Unlike other NN-based diagnosis methods which utilize node voltages or frequency response as fault features, the reported BPNN is trained by the extracted feature vectors, the slope features are calculated by just simulating once for each component, and the trained BPNN can achieve all the soft faults diagnosis of the component. Experiments show that our approach is promising.

A Neural Network Appraoch to Fault Diagnosis in Analog Circuits

This paper presents a neural network based fault diagnosis approach for analog circuits, taking the tolerances of circuit elements into account. Specifi-cally, a normalization rule of input information, a pseudo-fault domain border (PFDB) pattern selection method and a new output error function are proposed for training the backpropagation (BP) network to be a fault diagnoser. Experi-mental results demonstrate that the diagnoser performs as well as or better than any classical approaches in terms of accuracy, and provides at Ieast an order-of magnitude improvement in post-fault diagnostic speed.

Hierarchical Neural Networks Method for Fault Diagnosis of Large-Scale Analog Circuits

A novel hierarchical neural networks (HNNs) method for fault diagnosis of large-scale circuits is proposed. The presented techniques using neural networks(NNs) approaches require a large amount of computation for simulating various faulty component possibilities. For large scale circuits, the number of possible faults, and hence the simulations, grow rapidly and become tedious and sometimes even impractical. Some NNs are distributed to the torn sub-blocks according to the proposed torn principles of large scale circuits. And the NNs are trained in batches by different patterns in the light of the presented rules of various patterns when the DC, AC and transient responses of the circuit are available. The method is characterized by decreasing the over-lapped feasible domains of responses of circuits with tolerance and leads to better performance and higher correct classification. The methodology is illustrated by means of diagnosis examples.

Diagnosis of soft faults in analog integrated circuits based on fractional correlation

Aiming at the problem of diagnosing soft faults in analog integrated circuits, an approach based on fractional correlation is proposed. First, the Volterra series of the circuit under test （CUT） decomposed by the fractional wavelet packet are used to calculate the fractional correlation functions. Then, the calculated fractional correlation functions are used to form the fault signatures of the CUT. By comparing the fault signatures, the different soft faulty conditions of the CUT are identified and the faults are located. Simulations of benchmark circuits illustrate the proposed method and validate its effectiveness in diagnosing soft faults in analog integrated circuits.

基于FSSA-ELM的模拟电路故障诊断方法

在大规模电路中,模拟电路的故障率高达80%。针对模拟电路故障诊断方法准确率低、耗时长的问题,提出了一种分数阶麻雀搜索算法结合极限学习机(FSSA-ELM)的模拟电路故障诊断方法。利用核主成分分析与局部线性嵌入(KPCA-LLE)联合方式对电路故障数据进行特征提取,通过分数阶与麻雀搜索算法(SSA)相融合,对极限学习机(ELM)的权重和阈值进行寻优,将提取后的特征数据输入到FSSA-ELM模型中进行训练和测试。T型反馈网络反相比例运算电路诊断实例表明,FSSA-ELM的故障诊断用时相较于SSA-ELM缩短了891 s,单故障诊断准确率可达972%,比SSA-ELM和ELM分别提高了19%和28%;双故障诊断准确率可达95%,分别提高了04%和10%。该故障诊断方法准确率高、耗时短,具有较强的模拟电路故障检测能力。

基于IHHO-BP神经网络的模拟电路故障诊断

针对模拟电路故障类型多、故障状态不稳定以及故障数据冗余,使得模拟电路故障诊断困难的问题,提出利用改进哈里斯鹰算法(improved Harris Hawks optimization, IHHO)优化反向传播(back propagation, BP)神经网络,实现模拟电路故障特征选择与诊断。首先,将非线性自适应因子、柯西变异和随机差分扰动引入哈里斯鹰算法,实现收敛速度和精度的提升;其次,采用IHHO对模拟电路的单一故障和组合故障仿真数据进行特征选择,完成数据预处理;最后,采用IHHO-BP算法,对预处理后的故障数据进行训练和测试,实现模拟电路故障诊断。诊断结果表明,所提方法的诊断精度相较于其他算法提升了5.5%。