期刊文献+
共找到3篇文章
< 1 >
每页显示 20 50 100
探究SAP在支撑芯片制造Zero Bank工艺中的应用
1
作者 程万 《集成电路应用》 2017年第7期30-34,共5页
为了大幅度提升芯片制造工厂Fab的产能,芯片制造的Zero Bank工艺可以优化生产流程,提高线上工作效率,缩断产品周期。这一先进的新模式已全面应用于行业生产,其突破性进步和显著的效益不言而喻。但是如何把它整合到现有的系统管理中,对... 为了大幅度提升芯片制造工厂Fab的产能,芯片制造的Zero Bank工艺可以优化生产流程,提高线上工作效率,缩断产品周期。这一先进的新模式已全面应用于行业生产,其突破性进步和显著的效益不言而喻。但是如何把它整合到现有的系统管理中,对芯片生产支持来说始终始是个挑战。在整合该模式的项目中,SAP系统成功实施。该项目的实用性和领先性为同行业的进步提供了借鉴。 展开更多
关键词 芯片制造 工艺优化 零库存 zero bank move数转换 change type 自动批处理 SAP
下载PDF
A novel predict-prevention quality control method of multi-stage manufacturing process towards zero defect manufacturing 被引量:1
2
作者 Li-Ping Zhao Bo-Hao Li Yi-Yong Yao 《Advances in Manufacturing》 SCIE EI CAS CSCD 2023年第2期280-294,共15页
Zero defection manufacturing (ZDM) is the pursuit of the manufacturing industry. However, there is a lack of the implementation method of ZDM in the multi-stage manufacturing process (MMP). Implementing ZDM and contro... Zero defection manufacturing (ZDM) is the pursuit of the manufacturing industry. However, there is a lack of the implementation method of ZDM in the multi-stage manufacturing process (MMP). Implementing ZDM and controlling product quality in MMP remains an urgent problem in intelligent manufacturing. A novel predict-prevention quality control method in MMP towards ZDM is proposed, including quality characteristics monitoring, key quality characteristics prediction, and assembly quality optimization. The stability of the quality characteristics is detected by analyzing the distribution of quality characteristics. By considering the correlations between different quality characteristics, a deep supervised long-short term memory (SLSTM) prediction network is built for time series prediction of quality characteristics. A long-short term memory-genetic algorithm (LSTM-GA) network is proposed to optimize the assembly quality. By utilizing the proposed quality control method in MMP, unqualified products can be avoided, and ZDM of MMP is implemented. Extensive empirical evaluations on the MMP of compressors validate the applicability and practicability of the proposed method. 展开更多
关键词 zero defection manufacturing(ZDM) Multi-stage manufacturing process(MMP) Moving window Deep supervised long-short term memory(SLSTM)network Assembly quality optimization
原文传递
一种优化芯片测试时间的方法 被引量:4
3
作者 许梦龙 鲁小妹 赵来钖 《集成电路应用》 2020年第2期39-41,共3页
为了减少芯片测试时间,降低芯片测试成本,介绍一种基于智能卡芯片的测试时间优化的方法。通过分析大生产的测试数据,对测试流程、测试程序以及测试向量进行优化,在保证质量的前提下,对测试项进行优化,提高测试效率,测试时间减少19.623%... 为了减少芯片测试时间,降低芯片测试成本,介绍一种基于智能卡芯片的测试时间优化的方法。通过分析大生产的测试数据,对测试流程、测试程序以及测试向量进行优化,在保证质量的前提下,对测试项进行优化,提高测试效率,测试时间减少19.623%,从而有效降低成本,提高生产能力。 展开更多
关键词 集成电路制造 测试成本 流程优化 芯片测试 自动化测试设备
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部