Three-dimensional coherent diffraction imaging of Mie-scattering spheres by laser single-orientation measurement

Three-dimensional imaging with single orientation is a potential and novel technique. We successfully demonstrate that three-dimensional（3D） structure can be determined by a single orientation diffraction measurement for a phase object of double-layer Mie-scattering silica spheres on a Si3N4 membrane. Coherent diffraction pattern at high numerical aperture was acquired with an optical laser, and the oversampled pattern was projected from a planar detector onto the Ewald sphere.The double-layered spheres are reconstructed from the spherical diffraction pattern and a 2D curvature-corrected pattern,which improve convergence speed and stability of reconstruction.

First commissioning results of the coherent scattering and imaging endstation at the Shanghai soft X-ray free-electron laser facility

The Shanghai soft X-ray free-electron laser(SXFEL)user facility project started in 2016 and is expected to be open to users by 2022.It aims to deliver ultra-intense coherent femtosecond X-ray pulses to five endstations covering a range of 100–620 eV for ultrafast X-ray science.Two undulator lines are designed and constructed,based on different lasing modes:self-amplified spontaneous emission and echo-enabled harmonic generation.The coherent scattering and imaging(CSI)endstation is the first of five endstations to be commissioned online.It focuses on high-resolution single-shot imaging and the study of ultrafast dynamic processes using coherent forward scattering techniques.Both the single-shot holograms and coherent diffraction patterns were recorded and reconstructed for nanoscale imaging,indicating the excellent coherence and high peak power of the SXFEL and the possibility of‘‘diffraction before destruction’’experiments at the CSI endstation.In this study,we report the first commissioning results of the CSI endstation.

A general phase retrieval algorithm based on a ptychographical iterative engine for coherent diffractive imaging

Coherent diffractive imaging （CDI） is a lensless imaging technique and can achieve a resolution beyond the Rayleigh or Abbe limit. The ptychographical iterative engine （PIE） is a CDI phase retrieval algorithm that uses multiple diffraction patterns obtained through the scan of a localized illumination on the specimen, which has been demonstrated successfully at optical and X-ray wavelengths. In this paper, a general PIE algorithm （gPIE） is presented and demonstrated with an He-Ne laser light diffraction dataset. This algorithm not only permits the removal of the accurate model of the illumination function in PIE, but also provides improved convergence speed and retrieval quality.

Influence of the illumination coherency and illumination aperture on the ptychographic iterative microscopy

While ptychography is an algorithm based on coherent illumination,satisfactory reconstructions can still be generated in most experiments,even though the radiation sources that are used are not ideally coherent.The underlying physics of this phenomenon is that the diffraction patterns of partially coherent illumination can be treated as those of purely coherent illumination by altering the intensities of the diffracted beams relative to their real values.On the other hand,due to the inconsistency in the altering interference among all the diffraction beams,noise/distortion is always involved in the reconstructed images.Furthermore,for a weak object,the noise/distortion in the reconstruction can be mostly reduced by using a highly curved beam for illumination in the data recording and forcing the dark field diffraction to be zero in the reconstruction.

Noniterative spatially partially coherent diffractive imaging using pinhole array mask

We propose and experimentally demonstrate a noniterative diffractive imaging method for reconstructing the complex-valued transmission function of an object illuminated by spatially partially coherent light from the far-field diffraction pattern.Our method is based on a pinhole array mask,which is specially designed such that the correlation function in the mask plane can be obtained directly by inverse Fourier transforming the diffraction pattern.Compared to the traditional iterative diffractive imaging methods using spatially partially coherent illumination,our method is noniterative and robust to the degradation of the spatial coherence of the illumination.In addition to diffractive imaging,the proposed method can also be applied to spatial coherence property characterization,e.g.,free-space optical communication and optical coherence singularity measurement.

Lensless diffractive imaging with ultra-broadbandtable-top sources: from infrared to extreme-ultravioletwavelengths

Lensless imaging is an approach to microscopy in which a high-resolution image of an object is reconstructed from one or more measured diffraction patterns,providing a solution in situations where the use of imaging optics is not possible.However,current lensless imaging methods are typically limited by the need for a light source with a narrow,stable and accurately known spectrum.We have developed a general approach to lensless imaging without spectral bandwidth limitations or sample requirements.We use two time-delayed coherent light pulses and show that scanning the pulse-to-pulse time delay allows the reconstruction of diffraction-limited images for all the spectral components in the pulse.In addition,we introduce an iterative phase retrieval algorithm that uses these spectrally resolved Fresnel diffraction patterns to obtain high-resolution images of complex extended objects.We demonstrate this two-pulse imaging method with octave-spanning visible light sources,in both transmission and reflection geometries,and with broadband extreme-ultraviolet radiation from a high-harmonic generation source.Our approach enables effective use of low-flux ultra-broadband sources,such as table-top high-harmonic generation systems,for high-resolution imaging.

Solution of the effects of twinning in femtosecond X-ray protein nanocrystallography

With the development of the XFEL （X-ray free electron laser）, high quality diffraction patterns from nanocrystals have been achieved. The nanocrystals with different sizes and random orientations are injected to the XFEL beams and the diffraction patterns can be obtained by the so-called ＂diffraction-and-destruction＂ mode. The recovery of orientations is one of the most critical steps in reconstructing the 3D structure of nanocrystals. There is already an approach to solve the orientation problem by using the automated indexing software in crystallography. However, this method cannot distinguish the twin orientations in the cases of the symmetries of Bravais lattices higher than the point groups. Here we propose a new method to solve this problem. The shape transforms of nanocrystals can be determined from all of the intensities around the diffraction spots, and then Fourier transformation of a single crystal cell is obtained. The actual orientations of the patterns can be solved by comparing the values of the Fourier transformations of the crystal cell on the intersections of all patterns. This so-called ＂multiple-common-line＂ method can distinguish the twin orientations in the XFEL diffraction patterns successfully.