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Stochastic collocation for device-level variability analysis in integrated photonics 被引量:3
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作者 Yufei Xing Domenico Spina +2 位作者 Ang Li Tom Dhaene Wim Bogaerts 《Photonics Research》 SCIE EI 2016年第2期93-100,共8页
We demonstrate the use of stochastic collocation to assess the performance of photonic devices under the effect of uncertainty. This approach combines high accuracy and efficiency in analyzing device variability with ... We demonstrate the use of stochastic collocation to assess the performance of photonic devices under the effect of uncertainty. This approach combines high accuracy and efficiency in analyzing device variability with the ease of implementation of sampling-based methods. Its flexibility makes it suitable to be applied to a large range of photonic devices. We compare the stochastic collocation method with a Monte Carlo technique on a numerical analysis of the variability in silicon directional couplers. 展开更多
关键词 Stochastic collocation for device-level variability analysis in integrated photonics
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