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Response compaction for system-on-a-chip based on advanced convolutional codes 被引量:1
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作者 HAN Yinhe LI Huawei +1 位作者 LI Xiaowei ANSHUMAN Chandra 《Science in China(Series F)》 2006年第2期262-272,共11页
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output compactor based on a (n, n-1, m, 3) convolutional code is presented. When the proposed theorems ar... This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output compactor based on a (n, n-1, m, 3) convolutional code is presented. When the proposed theorems are satisfied, the compactor can avoid two and any odd erroneous bits cancellations, and handle one unknown bit (X bit). When the X bits in response are clustered, multiple-weight check matrix design algorithm can be used to reduce the effect of massive X bits. Some extended experimental results show that the proposed encoder has an acceptable-level X tolerant capacity and low error cancellations probability. 展开更多
关键词 SOC test response compaction convolutional code ALIASING X bits masking.
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