The etiology of Meniere disease (MD) is unknown. Among the several factors which can provoke the disease is a pathological immune response. Objective: To investigate whether MD is due to a pathological immune reaction...The etiology of Meniere disease (MD) is unknown. Among the several factors which can provoke the disease is a pathological immune response. Objective: To investigate whether MD is due to a pathological immune reaction. Materials and methods: Immunological assay (IA) was evaluated in a consecutive study on 159 patients with MD (mean age 47.8. years) and the results compared with those from 26 patients operated on because of vestibular schwannoma (VS, mean age 54.1 years), who served as a control group. In cases of MD, transtympanic electrocochleography (ECoG) and hearing threshold were measured. Results: The average hearing level (HL) in the affected ears of patients with MD was 30 dB. Evidence of abnormal plasma protein pattern was found in 127 MD patients (80%). Elevations were found in β1-globulin (54.5%), β2-globulin (26.5%), a2-globulin (34.3%), g-globulin (17.3%), complement (CH100, 36.4%) and antinuclear antibodies (ANA, 43.4%). The onset of the disease did not correlate with the level of the plasma protein neither with the level of IgG titers. Conclusion: Elevated certain plasma proteins in patients with Meniere’s disease could be a sign that Meniere’s disease is a consequence of pathological immune reaction.展开更多
The sensitivity of complex integrated circuits to single-event effects is investigated. Sensitivity depends not only on the cross section of physical modules but also on the behavior of data patterns running on the sy...The sensitivity of complex integrated circuits to single-event effects is investigated. Sensitivity depends not only on the cross section of physical modules but also on the behavior of data patterns running on the system.A method dividing the main functional modules is proposed. The intrinsic cross section and the duty cycles of different sensitive modules are obtained during the execution of data patterns. A method for extracting the duty cycle is presented and a set of test patterns with different duty cycles are implemented experimentally. By combining the intrinsic cross section and the duty cycle of different sensitive modules, a universal method to predict SEE sensitivities of different test patterns is proposed, which is verified by experiments based on the target circuit of a microprocessor. Experimental results show that the deviation between prediction and experiment is less than 20%.展开更多
文摘The etiology of Meniere disease (MD) is unknown. Among the several factors which can provoke the disease is a pathological immune response. Objective: To investigate whether MD is due to a pathological immune reaction. Materials and methods: Immunological assay (IA) was evaluated in a consecutive study on 159 patients with MD (mean age 47.8. years) and the results compared with those from 26 patients operated on because of vestibular schwannoma (VS, mean age 54.1 years), who served as a control group. In cases of MD, transtympanic electrocochleography (ECoG) and hearing threshold were measured. Results: The average hearing level (HL) in the affected ears of patients with MD was 30 dB. Evidence of abnormal plasma protein pattern was found in 127 MD patients (80%). Elevations were found in β1-globulin (54.5%), β2-globulin (26.5%), a2-globulin (34.3%), g-globulin (17.3%), complement (CH100, 36.4%) and antinuclear antibodies (ANA, 43.4%). The onset of the disease did not correlate with the level of the plasma protein neither with the level of IgG titers. Conclusion: Elevated certain plasma proteins in patients with Meniere’s disease could be a sign that Meniere’s disease is a consequence of pathological immune reaction.
文摘The sensitivity of complex integrated circuits to single-event effects is investigated. Sensitivity depends not only on the cross section of physical modules but also on the behavior of data patterns running on the system.A method dividing the main functional modules is proposed. The intrinsic cross section and the duty cycles of different sensitive modules are obtained during the execution of data patterns. A method for extracting the duty cycle is presented and a set of test patterns with different duty cycles are implemented experimentally. By combining the intrinsic cross section and the duty cycle of different sensitive modules, a universal method to predict SEE sensitivities of different test patterns is proposed, which is verified by experiments based on the target circuit of a microprocessor. Experimental results show that the deviation between prediction and experiment is less than 20%.
