For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert s...For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert switch is presented to verify the reliability of the invert switch. The test system uses complex programmable logic device （CPLD） to control data acquisition of A/D converter and data storage of external flash memory, and then transmits the acquired data to a computer for data analysis and processing. The test system can provide the required sampling frequency of the signal in high temperature, normal temperature and low temperature environments, and the reliability of the invert switch can be verified according to the signal parameters. The results show that the test system has high precision and the tested invert switch has low power consumption and high reliability.展开更多
With the continual increase in switching speed and rating of power semiconductors, the switching voltage spike becomes a serious problem. This paper describes a new technique of driving pulse edge modulation for insul...With the continual increase in switching speed and rating of power semiconductors, the switching voltage spike becomes a serious problem. This paper describes a new technique of driving pulse edge modulation for insulated gate bipolar transistors(IGBTs). By modulating the density and width of the pulse trains, without regulating the hardware circuit, the slope of the gate driving voltage is controlled to change the switching speed. This technique is used in the driving circuit based on complex programmable logic devices(CPLDs), and the switching voltage spike of IGBTs can be restrained through software, which is easier and more flexible to adjust. Experimental results demonstrate the effectiveness and practicability of the proposed method.展开更多
文摘For electronic piezo gauge used for testing gun chamber pressure, its internal miniature pulse-powered photoelectric invert switch cannot often be powered up normally. To solve this problem, a test system for invert switch is presented to verify the reliability of the invert switch. The test system uses complex programmable logic device （CPLD） to control data acquisition of A/D converter and data storage of external flash memory, and then transmits the acquired data to a computer for data analysis and processing. The test system can provide the required sampling frequency of the signal in high temperature, normal temperature and low temperature environments, and the reliability of the invert switch can be verified according to the signal parameters. The results show that the test system has high precision and the tested invert switch has low power consumption and high reliability.
基金Project supported by the National Natural Science Foundation of China(No.51177147)the Zhejiang Key Science and Technology Innovation Group Program,China(No.2010R50021)
文摘With the continual increase in switching speed and rating of power semiconductors, the switching voltage spike becomes a serious problem. This paper describes a new technique of driving pulse edge modulation for insulated gate bipolar transistors(IGBTs). By modulating the density and width of the pulse trains, without regulating the hardware circuit, the slope of the gate driving voltage is controlled to change the switching speed. This technique is used in the driving circuit based on complex programmable logic devices(CPLDs), and the switching voltage spike of IGBTs can be restrained through software, which is easier and more flexible to adjust. Experimental results demonstrate the effectiveness and practicability of the proposed method.
