A stochastic model of conducting crack propagation is presented to provide a conceptual framework dedicated to the study of the formation of fractal structure of dielectric ageing patterns as a result of a competition...A stochastic model of conducting crack propagation is presented to provide a conceptual framework dedicated to the study of the formation of fractal structure of dielectric ageing patterns as a result of a competition between random fluctuation growth and applied electric strength enhanced deterministic growth. The necessary and sufficient conditions resulting in fractal behaviour in dielectric ageing are found.展开更多
文摘A stochastic model of conducting crack propagation is presented to provide a conceptual framework dedicated to the study of the formation of fractal structure of dielectric ageing patterns as a result of a competition between random fluctuation growth and applied electric strength enhanced deterministic growth. The necessary and sufficient conditions resulting in fractal behaviour in dielectric ageing are found.