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Performance analysis of STT-RAM with cross shaped free layer using Heusler alloys
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作者 Tangudu Bharat Kumar Bahniman Ghosh +1 位作者 Bhaskar Awadhiya Ankit Kumar Verma 《Journal of Semiconductors》 EI CAS CSCD 2016年第1期47-50,共4页
We have investigated the performance of a spin transfer torque random access memory (STT-RAM) cell with a cross shaped Heusler compound based free layer using micromagnetic simulations. We have designed a free layer... We have investigated the performance of a spin transfer torque random access memory (STT-RAM) cell with a cross shaped Heusler compound based free layer using micromagnetic simulations. We have designed a free layer using a Cobalt based Heusler compound. Simulation results clearly show that the switching time from one state to the other state has been reduced, also it has been found that the critical switching current density (to switch the magnetization of the free layer of the STT RAM cell) is reduced. 展开更多
关键词 spin transfer torque random access memory (STT-MRAM) micromagnetic simulation Heusler com-pound switching time critical switching current density
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